D:
X-Ray STM
- K. Tsuji,
T. Emoto, Y. Matsuoka, Y. Miyatake,
T. Nagamura, and X. Ding, Micro-XRF instrument
developed in combination with atomic force microscope, Advances in X-ray Analysis, 48 (2005) 221-228.
- K.
Tsuji, Emoto, Y Matsuoka, Y. Miyatake,
T, Nagamura, X,Ding, Micro
X-ray fluorescence instrument developed in combination with atomic force
microscope, Powder Dittraction 20
(2005) 137-140.
- Y. Hasegawa, K. Tsuji, K. Nakayama, K. Wagatsuma,
T. Sakurai, X-ray source combined ultrahigh-vacuum scanning tunneling
microscopy for elemental analysis, J. Vac. Sci. Tech. B., 18
(2000) 2676-2680.
- K. Tsuji, K. Wagatsuma, K. Sugiyama,
K. Hiraga, Y. Waseda,
EXAFS- and XANES-like spectra obtained by x-ray excited scanning tunneling
microscope tip current measurement, Surf. Interface Anal., 27
(1999) 132-135.
- K. Tsuji, Y. Hasegawa, K. Wagatsuma
and T. Sakurai, Detection of x-ray induced current using a scanning
tunneling microscope and its spatial mapping for elemental analysis, Jpn. J. Appl. Phys., 37 (1998)
L1271-L1273.
- K. Tsuji, T. Nagamura, and K. Wagatsuma, Scanning tunneling microscope tip current
excited by modulated x-rays, Jpn. J.
Appl. Phys., 37 (1998) 2028-2032.
- K. Tsuji, K. Wagatsuma and K. Hirokawa, Characteristics of total reflection x-ray
excited current detected with the tip of scanning tunneling microscope, Spectrochim. Acta
B, 52 (1997) 855-860.
- K. Tsuji and K. Wagatsuma, Optimum
gaseous pressure for the measurement of the x-ray excited scanning
tunneling microscope tip current, Jpn.
J. Appl. Phys., 36 (1997) 1264-1267.
- Ň KęAäČ ažAwüĆËşĹĚrslĎ@ĆTjdŹĚŞčAwüŞÍĚiŕA 28 (1997) 289-300.
- K. Tsuji and K. Hirokawa,
Characteristics of an x-ray-excited current detected with an STM tip, Rev.
Sci. Instrum., 67 (1996) 3573-3577.
- Ň KęALě gVArsluđp˘˝wüăNdŹĚŞčA\ĘČwA17 (1996) 161-166.
- K. Tsuji and K. Hirokawa,
Glancing-incidence and takeoff x-ray fluorescence and scanning tunneling
microscopy of thin films under x-ray irradiation, Surf. Interface Anal.,
24 (1996) 286-289.
- K. Tsuji and K. Hirokawa, X-ray
excited current detected with scanning tunneling microscope equipment, Jpn. J. Appl. Phys., 34 (1995)
L1506-L1508.