2020ǯÅ٤γèÆ°
¡Êfrom April 2020 to March 2021¡Ë
¹ñºÝ²ñµÄ¤Ç¤Î¾·ÂÔ¡¦°ÍÍê¹Ö±é
Invited
talks at international conferences
[1] K. Tsuji,
¡ÈIntroduction to X-ray Fluorescence¡É, 1st International
Summer School on TXRF, 29 June 2020 - 3 July 2020, University of Bari, Bari,
Italy.
[2] K. Tsuji,
¡ÈInstrumentation for TXRF¡É, 1st International Summer
School on TXRF, 29 June 2020 - 3 July 2020, University of Bari, Bari, Italy.
[3] K. Tsuji, Workshop
Instructor on ¡ÈMicro XRF¡É, 69th Annual Conference on Applications of X-ray
Analysis Denver X-ray Conference, 3-7 August 2020, Bethesda North Marriott
Hotel and Conference Center, Rockville, Maryland, U.S.A.
¹ñºÝ²ñµÄ¤Ç¤Î°ìÈֱ̹é
Presentations
at international conferences
¹ñÆâ¤Ç¤Î¾·ÂÔ¡¦°ÍÍê¹Ö±é
Invited talks at domestic
conferences
¹ñÆâ¤Ç¤Î³Ø²ñȯɽ¤Ê¤É
Presentations
at conferences in Japan
2019ǯÅ٤γèÆ°
¡Êfrom April 2019 to March 2020¡Ë
¹ñºÝ²ñµÄ¤Ç¤Î¾·ÂÔ¡¦°ÍÍê¹Ö±é
Invited
talks at international conferences
[1]
K.
Tsuji, Workshop Instructor on ¡ÈMicro and Energy Dispersive XRF¡É, 68th Annual
Conference on Applications
of X-ray Analysis Denver X-ray Conference, 5-9 August 2019, Westin Lombard
Yorktown Center, Lombard, Illinois, U.S.A.
[2]
K.
Tsuji, Workshop Instructor on ¡ÈTrace Analysis¡É, 68th Annual Conference on
Applications of X-ray Analysis Denver X-ray Conference, 5-9 August 2019, Westin
Lombard Yorktown Center, Lombard, Illinois, U.S.A.
[3]
K.
Tsuji, M. Nakanishi, R. Ozeki, T. Matsuyama, Scanning and Full Field X-Ray
Fluorescence Imaging with Laboratory X-ray Source, PSA-19, 8th International
Symposium on Practical Surface Analysis, 3-8 November 2019, Hotel Emisia Sapporo, Hokkaido, Japan.
[4]
K.
Tsuji, ¡ÈDevelopment of laboratory-made X-ray
fluorescence imaging instruments and applications¡É, SPring-8 Forensic Science
Symposium, 24-25 March 2020, SPring-8, Hyogo, Japan. (³«ºÅÃæ»ß)
¹ñºÝ²ñµÄ¤Ç¤Î°ìÈֱ̹é
Presentations
at international conferences
[1]
K.
Tsuji, S. Murakami, and T. Matsuyama, Total reflection X-ray fluorescence analysis
using carbon coated glass substrate, 18th International Conference on Total
Reflection X-ray Fluorescence Analysis and Related Methods (TXRF2019), 25-28
June 2019, University of Girona, Spain (oral)
[2]
K.
Tsuji, A. Yamauchi, and T. Matsuyama, Full field energy dispersive X-ray
fluorescence imaging under glancing incidence condition, 18th International
Conference on Total Reflection X-ray Fluorescence Analysis and Related Methods
(TXRF2019), 25-28 June 2019, University of Girona, Spain (poster)
[3]
H.
Takahara, W. Matsuda, Y. Kusakabe, A. Ohbuchi, S. Ikeda, N. Kawahara, T. Furusato,
K. Tsuji, Trace elemental analysis of high matrix samples with total reflection
X-ray fluorescence spectrometry, 18th International Conference on Total
Reflection X-ray Fluorescence Analysis and Related Methods (TXRF2019), 25-28
June 2019, University of Girona, Spain (oral)
[4]
T.
Matsuyama, Y. Izumoto, Y. Sakai, K. Tsuji and H.
Yoshii, Rapid and effective sample preparation for TXRF analysis of drinking
water containing uranium at reference level of risk, 18th International
Conference on Total Reflection X-ray Fluorescence Analysis and Related Methods
(TXRF2019), 25-28 June 2019, University of Girona, Spain (oral)
[5]
H.
Yoshii, Y. Izumoto, T. Matsuyama and Y Sakai,
Screening of uranium surface contamination on demolition debris by TXRF
analysis, 18th International Conference on Total Reflection X-ray Fluorescence
Analysis and Related Methods (TXRF2019), 25-28 June 2019, University of Girona,
Spain (poster)
[6]
Y.
Izumoto, T. Matsuyama, K. Takamura,
Y. Sakai, Y. Oguri and H. Yoshii, TXRF analysis of
uranium in the presence of competing elements, 18th International Conference on
Total Reflection X-ray Fluorescence Analysis and Related Methods (TXRF2019),
25-28 June 2019, University of Girona, Spain (oral)
[7]
H.
Takahashi, Y. Izumoto, T. Matsuyama and H. Yoshii,
Tri-n-butyl phosphate grafted graphene oxide for uranium detection by total
reflection X-ray fluorescence spectrometry, 18th International Conference on
Total Reflection X-ray Fluorescence Analysis and Related Methods (TXRF2019),
25-28 June 2019, University of Girona, Spain (poster)
[8]
T.
Matsuyama, H. Yoshi, K. Tsuji, TXRF Analysis using Carbon Coated Glass
Substrate in Comparison with Conventional Sample Preparation, 68th Annual
Conference on Applications of X-ray Analysis Denver X-ray Conference, 5-9
August 2019, Westin Lombard Yorktown Center, Lombard, Illinois, U.S.A. (oral)
[9]
K.
Tsuji, A. Yamauchi, T. Matsuyama, Full Field Energy Dispersive X-ray
fluorescence Imaging and Compressed Sensing Analysis for Super-Resolution
Analysis, 68th Annual Conference on Applications of X-ray Analysis Denver X-ray
Conference, 5-9 August 2019, Westin Lombard Yorktown Center, Lombard, Illinois,
U.S.A. (poster)
[10]
T.
Matsuyama, S. Sonoda, H. Nakano, K. Tsuji, Confocal
Line XRF Analysis in Comparison with Confocal Point Micro XRF Analysis, 68th
Annual Conference on Applications of X-ray Analysis Denver X-ray Conference,
5-9 August 2019, Westin Lombard Yorktown Center, Lombard, Illinois, U.S.A.
(poster)¡¡
¹ñÆâ¤Ç¤Î¾·ÂÔ¡¦°ÍÍê¹Ö±é
Invited talks at domestic
conferences
[1]
ÄÔ ¹¬°ì¡Ö¸÷¤òʬ¤±¤ë-²Ä»ë¸÷¤«¤éXÀþ¤Îʬ¸÷Ë¡¤ÎÍøÍÑ-¡×2019ǯ6·î11Æü¡¢2019ǯÅÙÂçºå»ÔΩÂç³Ø¸ø³«¹ÖºÂ¡ÊÂçºå»ÔΩÂç³Øʸ²½¸òή¥»¥ó¥¿¡¼¡¢Âçºå¡Ë
[2] ÄÔ ¹¬°ì¡Ö¹â´¶ÅÙ²½¤È¿¼¡¸µ²½¤òÌܻؤ·¤¿¿·µ¬XÀþ¸µÁÇʬÀÏË¡¤Î³«È¯¤È±þÍѸ¦µæ¡×¡Ú³Ø²ñ¾Þ¹Ö±é¡Û2019ǯ9·î11-13Æü¡¢ÆüËÜʬÀϲ½³Ø²ñÂè68ǯ²ñ¡ÊÀéÍÕÂç³ØÀ¾ÀéÍÕ¥¥ã¥ó¥Ñ¥¹¡¢ÀéÍÕ¡Ë
¹ñÆâ¤Ç¤Î³Ø²ñȯɽ¤Ê¤É
Presentations
at conferences in Japan
[1] »°ÅÄ ¾ºÊ¿¡¢½©²¬ ¹¬»Ê¡¢ÅÚ°æ
¶µ»Ë¡¢ÄÔ ¹¬°ì¡Ö¶¦¾ÇÅÀ·¿·Ö¸÷£ØÀþ¥¤¥á¡¼¥¸¥ó¥°Ë¡¤Ë¤è¤ë°¡±ô¤á¤Ã¤¹ÝÈÄ»îÎÁ¤ÎÉå¿©µóÆ°´Ñ»¡¡×2019ǯ5·î18-19Æü¡¢ÆüËÜʬÀϲ½³Ø²ñ Âè79²óʬÀϲ½³ØƤÏÀ²ñ¡ÊË̶彣¹ñºÝ²ñµÄ¾ì¡õAIM¡¢Ê¡²¬¡Ë¡Ê¸ýƬ¡Ë
[2] ¾¾»³ »Ì»Ë¡¢°ËƦËÜ ¹¬·Ã¡¢¹â¼
¹¸Âç¡¢ÄÔ ¹¬°ì¡¢¼ò°æ ¹¯¹°¡¢µÈ°æ
͵¡Ö°ûÎÁ¿å´ð½à¥ì¥Ù¥ë¥¦¥é¥ó¤ÎÁ´È¿¼Í·Ö¸÷XÀþʬÀÏ¡×2019ǯ5·î18-19Æü¡¢ÆüËÜʬÀϲ½³Ø²ñ
Âè79²óʬÀϲ½³ØƤÏÀ²ñ¡ÊË̶彣¹ñºÝ²ñµÄ¾ì¡õAIM¡¢Ê¡²¬¡Ë¡Ê¸ýƬ¡Ë
[3] Èø´Ø οÂÀ¡¢»³Æâ °ª¡¢ÄÔ
¹¬°ì¡Ö¥¨¥Í¥ë¥®¡¼Ê¬»¶·¿µÚ¤ÓÇÈĹʬ»¶·¿Ê¬¸÷¤Ë¤è¤ë·Ö¸÷XÀþ¥¤¥á¡¼¥¸¥ó¥°ÁõÃ֤λîºî¡×2019ǯ5·î18-19Æü¡¢ÆüËÜʬÀϲ½³Ø²ñ
Âè79²óʬÀϲ½³ØƤÏÀ²ñ¡ÊË̶彣¹ñºÝ²ñµÄ¾ì¡õAIM¡¢Ê¡²¬¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[4] ±àÅÄ ¾ÂÀ¡¢ÃæÌî ¤Ò¤È¤ß¡¢ÄÔ
¹¬°ì¡Ö¶¦¾ÇÇÛÃ֤ˤè¤ë·Ö¸÷XÀþÆâÉô²òÀÏË¡¤Î´ðÁø¦µæ¡×2019ǯ5·î18-19Æü¡¢ÆüËÜʬÀϲ½³Ø²ñ Âè79²óʬÀϲ½³ØƤÏÀ²ñ¡ÊË̶彣¹ñºÝ²ñµÄ¾ì¡õAIM¡¢Ê¡²¬¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[5] ±àÅÄ ¾ÂÀ¡¢ÄÔ ¹¬°ì¡Ö¶¦¾ÇÇÛÃ֤ˤè¤ë·Ö¸÷XÀþÆâÉô²òÀÏË¡¤Î´ðÁø¦µæ¡×2019ǯ6·î6Æü¡¢´ØÀ¾Ê¬Àϸ¦µæ²ñÎáϸµÇ¯ÅÙÂè1²óÎã²ñ¡Ê²»±©Åŵ¡¹©¶È³ô¼°²ñ¼ÒËܼÒÍë¥Æ¥¯¥Î¥í¥¸¥»¥ó¥¿¡¼¡¢Ê¼¸Ë¡Ë(¸ýƬ)¡¡
[6] ÁáÀî Âç²í¡¢´ØÅÄ Îɹᡢ¾¾»³
»Ì»Ë¡¢ÄÔ ¹¬°ì¡ÖÂî¾å·¿·Ö¸÷XÀþʬÀÏÁõÃÖ¤òÍѤ¤¤¿ÌÓȱ»ñÎÁʬÀÏ¡×2019ǯ8·î1-2Æü¡¢Âè13²ó¶áµ¦»ÙÉô²Æµ¨¥»¥ß¥Ê¡¼¡Á¤Ö¤ó¤»¤ÈëÄ¡¡¡´¬¥Î½¦»²¡Á¡Ê¥¢¥¤¡¦¥¢¥¤¥é¥ó¥É¡¢Âçºå¡Ë¡Ê¥Ý¥¹¥¿¡¼)
[7] ÃçÀ¾ ÅíÂÀϺ¡¢¾¾»³ »Ì»Ë¡¢ÄÔ
¹¬°ì¡Ö¿åÍϱÕÃæ¶â°Éå¿©¤Î¤½¤Î¾ì´Ñ»¡¤òÌܻؤ·¤¿·Ö¸÷XÀþ¸µÁÇ¥¤¥á¡¼¥¸¥ó¥°¤Î¹â®²½¡×2019ǯ9·î11-13Æü¡¢ÆüËÜʬÀϲ½³Ø²ñÂè68ǯ²ñ¡ÊÀéÍÕÂç³ØÀ¾ÀéÍÕ¥¥ã¥ó¥Ñ¥¹¡¢ÀéÍÕ¡Ë(¸ýƬ)
[8] »³Íü âÃÀ¸¡¢ÄÔ ¹¬°ì¡ÖÁ´»ëÌî·¿XRD¥¤¥á¡¼¥¸¥ó¥°ÁõÃ֤ˤè¤ëƼ¤Î»À²½²áÄø¤Î¤½¤Î¾ì´Ñ»¡¡×2019ǯ9·î11-13Æü¡¢ÆüËÜʬÀϲ½³Ø²ñÂè68ǯ²ñ¡ÊÀéÍÕÂç³ØÀ¾ÀéÍÕ¥¥ã¥ó¥Ñ¥¹¡¢ÀéÍÕ¡Ë(¸ýƬ)
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»Ì»Ë¡¢ÄÔ ¹¬°ì¡ÖÁ´È¿¼Í·Ö¸÷XÀþʬÀϤˤª¤±¤ë¹â¥Þ¥È¥ê¥Ã¥¯¥¹»îÎÁ¤ÎÁ°½èÍýÊýË¡¤Î¸¡Æ¤¡×2019ǯ9·î11-13Æü¡¢ÆüËÜʬÀϲ½³Ø²ñÂè68ǯ²ñ¡ÊÀéÍÕÂç³ØÀ¾ÀéÍÕ¥¥ã¥ó¥Ñ¥¹¡¢ÀéÍÕ¡Ë(¸ýƬ)
[10] ¸ÅΤ Âó̦¡¢ÁáÀî Âç²í¡¢¾¾»³
»Ì»Ë¡¢ÄÔ ¹¬°ì¡ÖÂî¾å·¿Á´È¿¼Í·Ö¸÷XÀþʬÀÏÁõÃÖ¤òÍѤ¤¤¿ÌÓȱ»îÎÁ¬Äê¡×2019ǯ9·î11-13Æü¡¢ÆüËÜʬÀϲ½³Ø²ñÂè68ǯ²ñ¡ÊÀéÍÕÂç³ØÀ¾ÀéÍÕ¥¥ã¥ó¥Ñ¥¹¡¢ÀéÍÕ¡Ë(¥Ý¥¹¥¿¡¼)
[11] ¾¾»³ »Ì»Ë¡¢»³¸ý ¹Àµ±¡¢ÄÔ
¹¬°ì¡ÖÊὸ¥Õ¥£¥ë¥¿¡¼´Ê°×ÍϲòË¡¤ÎÄó°Æ¤ÈÂ絤¥¨¥¢¥í¥¾¥ëγ»Ò¤ÎÁ´È¿¼Í·Ö¸÷XÀþ¸µÁÇʬÀÏ¡×2019ǯ9·î11-13Æü¡¢ÆüËÜʬÀϲ½³Ø²ñÂè68ǯ²ñ¡ÊÀéÍÕÂç³ØÀ¾ÀéÍÕ¥¥ã¥ó¥Ñ¥¹¡¢ÀéÍÕ¡Ë(¥Ý¥¹¥¿¡¼)
[12] ÃçÀ¾ ÅíÂÀϺ¡¢ÃæÌî ¤Ò¤È¤ß¡¢Æ£¸¶
͵»Ò¡¢Æ£°æ µÁµ×¡¢¾¾»³ »Ì»Ë¡¢ÄÔ
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»Ì»Ë¡¢ÄÔ ¹¬°ì¡Ö¥Æ¡¼¥Ñ¡¼·¿¥Ý¥ê¥¥ã¥Ô¥é¥ê¡¼ÁǻҤòÍѤ¤¤¿Á´»ëÌî·¿·Ö¸÷XÀþ¥¤¥á¡¼¥¸¥ó¥°ÁõÃ֤λîºî¤ÈÀǽɾ²Á¡×2019ǯ9·î11-13Æü¡¢ÆüËÜʬÀϲ½³Ø²ñÂè68ǯ²ñ¡ÊÀéÍÕÂç³ØÀ¾ÀéÍÕ¥¥ã¥ó¥Ñ¥¹¡¢ÀéÍÕ¡Ë(¥Ý¥¹¥¿¡¼)
[15] Èø´ØοÂÀ¡¤¾¾»³»Ì»Ë¡¤ÄÔ ¹¬°ì¡Ö¼ÐÆþ¼Í¾ò·ï²¼¤Ç¤ÎÁ´»ëÌ¥Í¥ë¥®¡¼Ê¬»¶·¿·Ö¸÷XÀþ¥¤¥á¡¼¥¸¥ó¥°ÁõÃ֤γ«È¯¡×2019ǯ10·î30-31Æü¡¢Âè55²óXÀþʬÀÏƤÏÀ²ñ¡Ê¥³¥é¥Ã¥»¤Õ¤¯¤·¤Þ¡¢Ê¡Åç¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[16] ±àÅľÂÀ¡¢ÃæÌî¤Ò¤È¤ß¡¢¾¾»³»Ì»Ë¡¢ÄÔ ¹¬°ì¡Ö¶¦¾ÇÀþ·¿·Ö¸÷XÀþʬÀϤòÍѤ¤¤¿Áع½Â¤¤òͤ¹¤ë»îÎÁ¤Î¿¼¤µÊý¸þʬÀÏ¡×2019ǯ10·î30-31Æü¡¢Âè55²óXÀþʬÀÏƤÏÀ²ñ¡Ê¥³¥é¥Ã¥»¤Õ¤¯¤·¤Þ¡¢Ê¡Åç¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[17] ²¬ÎÓ Çù¡¢ÃçÀ¾ÅíÂÀϺ¡¢¾¾»³»Ì»Ë¡¢ÄÔ ¹¬°ì¡Ö¶¦¾ÇÅÀ»°¼¡¸µ·Ö¸÷XÀþ¹â®¥¤¥á¡¼¥¸¥ó¥°¤Ë¤è¤ë¶â°Éå¿©²áÄø¤Î´Ñ»¡¡×2019ǯ10·î30-31Æü¡¢Âè55²óXÀþʬÀÏƤÏÀ²ñ¡Ê¥³¥é¥Ã¥»¤Õ¤¯¤·¤Þ¡¢Ê¡Åç¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[18] »³¸ý¹Àµ±¡¢¾¾»³»Ì»Ë¡¢ÄÔ ¹¬°ì¡ÖÁ´È¿¼Í·Ö¸÷XÀþʬÀÏÁõÃÖ¤òÍѤ¤¤¿Â絤¥¨¥¢¥í¥¾¥ëγ»Ò¤Î´Ê°×ʬÀÏË¡¤ÎÄó°Æ¡×2019ǯ10·î30-31Æü¡¢Âè55²óXÀþʬÀÏƤÏÀ²ñ¡Ê¥³¥é¥Ã¥»¤Õ¤¯¤·¤Þ¡¢Ê¡Åç¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[19] ÃæÌî¤Ò¤È¤ß¡¢Âçß·À¡¿Í¡¢¶ð뿵ÂÀϺ¡¢¾¾»³»Ì»Ë¡¢ÄÔ ¹¬°ì¡ÖÈù¾®°Ûʪ¤Î·Ö¸÷XÀþʬÀϤˤª¤±¤ë¶¦¾ÇÅÀÇÛÃ֤ˤè¤ë¸¡½Ð²¼¸Â¸þ¾å¡×2019ǯ10·î30-31Æü¡¢Âè55²óXÀþʬÀÏƤÏÀ²ñ¡Ê¥³¥é¥Ã¥»¤Õ¤¯¤·¤Þ¡¢Ê¡Åç¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[20] ÁáÀîÂç²í¡¢´ØÅÄÎɹᡢ¾¾»³»Ì»Ë¡¢ÄÔ ¹¬°ì¡ÖÂî¾å·¿·Ö¸÷XÀþʬÀÏÁõÃÖ¤ª¤è¤ÓÁ´È¿¼Í·Ö¸÷XÀþʬÀÏÁõÃÖ¤òÍѤ¤¤¿ÌÓȱ»îÎÁ¬Äê¡×2019ǯ10·î30-31Æü¡¢Âè55²óXÀþʬÀÏƤÏÀ²ñ¡Ê¥³¥é¥Ã¥»¤Õ¤¯¤·¤Þ¡¢Ê¡Åç¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[21] ¹â¸¶¹¸Î¤¡¢¾¾ÅÄ ¾Ä¡¢Æü²¼ÉôÇ«¡¢ÂçÞ¼Æػʡ¢ÃÓÅÄ ÃÒ¡¢²Ï¸¶Ä¾¼ù¡¢¸ÅΤÂó̦¡¢¾¾»³»Ì»Ë¡¢ÄÔ ¹¬°ì¡ÖÂî¾å·¿Á´È¿¼Í·Ö¸÷XÀþʬÀÏÁõÃÖ¤òÍѤ¤¤¿¹â¥Þ¥È¥ê¥Ã¥¯¥¹ÍϱÕÃæ¤ÎÈùÎ̸µÁÇʬÀÏ¡×2019ǯ10·î30-31Æü¡¢Âè55²óXÀþʬÀÏƤÏÀ²ñ¡Ê¥³¥é¥Ã¥»¤Õ¤¯¤·¤Þ¡¢Ê¡Åç¡Ë¡Ê¸ýƬ¡Ë
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[23]
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[24] ¾¾»³»Ì»Ë¡¢ÃçÀ¾ÅíÂÀϺ¡¢ÄÔ ¹¬°ì¡Ö·Ö¸÷XÀþ¹â®¥¤¥á¡¼¥¸¥ó¥°¤Ë¤è¤ë±ö²½¥Ê¥È¥ê¥¦¥à¿åÍϱÕÃæ°¡±ô¥á¥Ã¥¹ÝÈĤÎÉå¿©²áÄø´Ñ»¡¡×2020ǯ3·î17-19Æü¡¢ÆüËÜÅ´¹Ý¶¨²ñÂè179²ó½Õµ¨¹Ö±éÂç²ñ¡ÊÅìµþ¹©¶ÈÂç³ØÂ粬»³¥¥ã¥ó¥Ñ¥¹¡¢Åìµþ¡Ë¡Ê¸ýƬ¡Ë
[25]
»³¸ý¹Àµ±¡¢ÄÔ ¹¬°ì¡ÖÁ´È¿¼Í·Ö¸÷XÀþʬÀϤΤ¿¤á¤ÎÂ絤ÃæÉâͷγ»ÒÊὸ¥Õ¥£¥ë¥¿¡¼¤Î´Ê°×ÍϲòË¡¡×2020ǯ3·î17-19Æü¡¢ÆüËÜÅ´¹Ý¶¨²ñÂè179²ó½Õµ¨¹Ö±éÂç²ñ¡ÊÅìµþ¹©¶ÈÂç³ØÂ粬»³¥¥ã¥ó¥Ñ¥¹¡¢Åìµþ¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
2018ǯÅ٤γèÆ°
¡Êfrom April 2018 to March 2019¡Ë
¹ñºÝ²ñµÄ¤Ç¤Î¾·ÂÔ¡¦°ÍÍê¹Ö±é
Invited talks
at international conferences
[2] K. Tsuji, Workshop
Instructor on ¡ÈTrace Analysis¡É, 67th Annual Conference on Applications of X-ray
Analysis Denver X-ray Conference, 6-10 August 2018, Westin Westminster Hotel,
Westminster, Colorado, U.S.A.
[3] K. Tsuji, Recent
advances and standardization in x-ray fluorescence (XRF) analysis: Confocal
3D-XRF and total reflection XRF, IUPAC Analytical ChemistryWorkshop
Advances in Analytical Chemistry II, 27 April 2018, Nara Women's University,
Nara, Japan.
¹ñºÝ²ñµÄ¤Ç¤Î°ìÈֱ̹é
Presentations
at international conferences
[1] K. Tsuji, T. Furusato, N. Yomogita, New Sample
Preparation for TXRF Analysis Using Resist Pattern Layer, 67th Annual
Conference on Applications of X-ray Analysis Denver X-ray Conference, 6-10
August 2018, Westin Westminster Hotel, Westminster, Colorado, U.S.A. (oral)
[2] M. Yamanashi, K. Tsuji,
Observation of Crystal Structure Changes with Full Field X-ray Diffraction
Imaging Instrument, 67th Annual Conference on Applications of X-ray Analysis
Denver X-ray Conference, 6-10 August 2018, Westin Westminster Hotel,
Westminster, Colorado, U.S.A. (poster)
[3] Kouichi Tsuji, Takumi Furusato and Naoya Yomogita, New Sample Carrier Modified with Low-Z Material
Layer for TXRF Analysis, European Conference on X-Ray Spectrometry (EXRS2018),
24-29 June 2018, Exhibition and Convention Centre, Ljubljana, Slovenia (oral)
[4] Takumi Furusato, Naoya Yomogita and Kouichi Tsuji,
Elemental Analysis of Human Hair by Confocal Micro-XRF Analysis, European
Conference on X-Ray Spectrometry (EXRS2018), 24-29 June 2018, Exhibition and
Convention Centre, Ljubljana, Slovenia (oral)
[5] Takumi Furusato, Fumiyuki Inoue and Kouichi Tsuji, Quantitative Elemental Analysis of Human
Hairs by Using Desktop X-Ray Fluorescence Analyzer, European Conference on
X-Ray Spectrometry (EXRS2018), 24-29 June 2018, Exhibition and Convention
Centre, Ljubljana, Slovenia (poster)
[6] Momotaro Nakanishi, Ryohei Hosomi and Kouichi Tsuji, In Situ Observation of the Corrosion Process
of Steel Sheets under Bending Stress by Confocal Micro XRF Technique, European
Conference on X-Ray Spectrometry (EXRS2018), 24-29 June 2018, Exhibition and
Convention Centre, Ljubljana, Slovenia (poster)
[7] Momotaro Nakanishi, Yuko Fujiwara, Yoshihisa Fujii and Kouichi Tsuji, Elemental Distribution Analysis of Copper-based Preservative-treated Woods by Micro XRF Method, European Conference on X-Ray Spectrometry (EXRS2018), 24-29 June 2018, Exhibition and Convention Centre, Ljubljana, Slovenia (poster)
¹ñÆâ¤Ç¤Î¾·ÂÔ¡¦°ÍÍê¹Ö±é
Invited talks at domestic
conferences
[1] ÄÔ
¹¬°ì¡Ö·Ö¸÷XÀþ¤Ë¤è¤ëĶÈùÎÌʬÀÏË¡¤Î¸¶Íý¤È±þÍÑ¡×2018ǯ7·î3-5 Æü¡¢XÀþʬÀϹֽ¬²ñ¡¡·Ö¸÷XÀþʬÀϤμºÝ
¡ÊÂè10²ó¡Ë¡½
µ¡Ç½ÀºàÎÁ¡¢Ãϵå´Ä¶»îÎÁ¡¢¿©ÉÊ¡¢Ê¸²½ºâ¤Î´Ê°×¿×®ʬÀÏË¡¡ÊÅìµþÍý²ÊÂç³Ø¡¢Åìµþ¡Ë
[2] ÄÔ
¹¬°ì¡ÖÂî¾å·¿·Ö¸÷£ØÀþʬÀÏÁõÃ֤ξҲð¤ÈŬÍÑÎã¡×2018ǯ7·î13Æü¡¢2018ǯÅ١֤֤󤻤¹Ö½¬²ñ¡×¡Ê¼ÂÁ©ÊÔ¡ËÂè65²óµ¡´ï¤Ë¤è¤ëʬÀϲ½³Ø¹Ö½¬²ñ¡Á´ðÁ䫤é³Ø¤ÖSEMµÚ¤ÓXRF¤Ë¤è¤ëºàÎÁ¤ÎÈù¾®ÎΰèʬÀÏ¡Á¡ÊÆüËÜÅŻҳô¼°²ñ¼Ò¡¢Âçºå¡Ë
[3] ÄÔ
¹¬°ì¡ÖɽÌ̶á˵¤Î·Ö¸÷XÀþ¸µÁÇ¥¤¥á¡¼¥¸¥ó¥°¡×2018ǯ10·î15-16Æü¡¢2018ǯÅÙ¼ÂÍÑɽÌÌʬÀϹֱé²ñ¡Ê¥×¥é¥µ¥ô¥§¥ë¥Ç¡Ê¤Õ¤¸¤Î¤¯¤ËÀéËܾ¾¥Õ¥©¡¼¥é¥à¡Ë¡¢ÀŲ¬¡Ë
[4] ÄÔ
¹¬°ì¡Ö·Ö¸÷£ØÀþ¥¤¥á¡¼¥¸¥ó¥°¤Ë¸þ¤±¤¿ÁõÃÖ³«È¯¤ÈŬÍÑÎã¡×2019ǯ2·î21-22Æü¡¢¥Þ¥¤¥¯¥í¥Ó¡¼¥à¥¢¥Ê¥ê¥·¥¹Âè141°Ñ°÷²ñ Âè175²ó¸¦µæ²ñ¡Ê³ô¼°²ñ¼ÒËÙ¾ìÀ½ºî½êÅìµþ¥»¡¼¥ë¥¹¥ª¥Õ¥£¥¹¡¢Åìµþ¡Ë
¹ñÆâ¤Ç¤Î³Ø²ñȯɽ¤Ê¤É
Presentations
at conferences in Japan
[1] ÄÔ
¹¬°ì¡¢Ë©ÅÄ Ä¾Ìé¡¢¾®Æþ±© Í´¼£¡Ö¥ì¥¸¥¹¥ÈÅÉÉÛËì´ðÈĤòÍѤ¤¤ëÁ´È¿¼Í·Ö¸÷£ØÀþʬÀÏË¡¤Î´ðÁø¡Æ¤¡×2018ǯ5·î26-27Æü¡¢Âè78²óʬÀϲ½³ØƤÏÀ²ñ¡Ê»³¸ýÂç³Ø¾ïÈ×¥¥ã¥ó¥Ñ¥¹¡¢»³¸ý¡Ë¡Ê¸ýƬ¡Ë
[2] ÃçÀ¾ ÅíÂÀϺ¡¢ÄÔ ¹¬°ì¡¢Æ£¸¶
͵»Ò¡¢Æ£°æ µÁµ×¡ÖÈù¾®Éô·Ö¸÷XÀþʬÀÏÁõÃ֤ˤè¤ëÌÚºàÃæ¤ÎƼ·ÏËÉÉåºÞ¤ÎʬÉÛ²òÀÏ¡×2018ǯ5·î26-27Æü¡¢Âè78²óʬÀϲ½³ØƤÏÀ²ñ¡Ê»³¸ýÂç³Ø¾ïÈ×¥¥ã¥ó¥Ñ¥¹¡¢»³¸ý¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[3] ¸ÅΤ Âó̦¡¢°æ¾å »ËÇ·¡¢ÄÔ
¹¬°ì¡ÖÂî¾å·¿·Ö¸÷XÀþʬÀÏÁõÃ֤ˤè¤ë¥Ð¥Ã¥¯¥°¥é¥¦¥ó¥É¶¯ÅÙ¤òÍøÍѤ·¤¿ÌÓȱÃæ¤Î¸µÁÇÄêÎÌË¡¤Î¸¡Æ¤¡×2018ǯ5·î26-27Æü¡¢Âè78²óʬÀϲ½³ØƤÏÀ²ñ¡Ê»³¸ýÂç³Ø¾ïÈ×¥¥ã¥ó¥Ñ¥¹¡¢»³¸ý¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[4] ¼ë
Àű󡢹ⶶ ¤Ï¤ë¤Ê¡¢ÄÔ ¹¬°ì¡ÖÂî¾å·¿·Ö¸÷£ØÀþʬÀÏÁõÃÖ¤òÍѤ¤¤¿ÃãÍդδʰ׸µÁÇʬÀÏË¡¤Î¸¡Æ¤¡×2018ǯ5·î26-27Æü¡¢Âè78²óʬÀϲ½³ØƤÏÀ²ñ¡Ê»³¸ýÂç³Ø¾ïÈ×¥¥ã¥ó¥Ñ¥¹¡¢»³¸ý¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[5] »°ÅÄ ¾ºÊ¿¡¢Â¼¾å ½¤Ê¿¡¢²Ï¸¶
ľ¼ù¡¢ÄÔ ¹¬°ì¡Ö¶¦¾ÇÅÀÈù¾®Éô·Ö¸÷£ØÀþʬÀϤˤª¤±¤ëñ¿§£ØÀþ¸»¤ÎÍøÍѤȹ⮲½¤Ø¤Î»î¤ß¡×2018ǯ6·î29Æü¡¢´ØÀ¾Ê¬Àϸ¦µæ²ñÊ¿À®30ǯÅÙÂè1²óÎã²ñ¡ÊζëÂç³ØÀ¥Åijؼˡ¢¼¢²ì¡Ë¡Ê¸ýƬ¡Ë
[6] ÄÔ
¹¬°ì¡Ö¶¦¾ÇÅÀ·¿Èù¾®Éô·Ö¸÷XÀþʬÀÏË¡¤Ë¤è¤ë¿¼¤µ¸µÁÇ¥¤¥á¡¼¥¸¥ó¥°¡×2018ǯ7·î3-5 Æü¡¢XÀþʬÀϹֽ¬²ñ¡¡·Ö¸÷XÀþʬÀϤμºÝ
¡ÊÂè10²ó¡Ë¡½
µ¡Ç½ÀºàÎÁ¡¢Ãϵå´Ä¶»îÎÁ¡¢¿©ÉÊ¡¢Ê¸²½ºâ¤Î´Ê°×¿×®ʬÀÏË¡¡¢ÆüËÜʬÀϲ½³Ø²ñXÀþʬÀϸ¦µæº©Ã̲ñ¡ÊÅìµþÍý²ÊÂç³Ø¡¢Åìµþ¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[7]
Èø´Ø
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¹¬°ì¡Ö¤¤¤¯¤Ä¤«¤Î·Ö¸÷XÀþ¸µÁÇ¥¤¥á¡¼¥¸¥ó¥°Ë¡¤ÎÈæ³Ó¤Èɾ²Á¡×¡¡2018ǯ8·î30-31Æü¡¢ÃæÉô»ÙÉô¡¦¶áµ¦»ÙÉô
¹çƱ²Æ´ü¥»¥ß¥Ê¡¼¡ÊÂè37²óʬÀϲ½³ØÃæÉô²Æ´ü¥»¥ß¥Ê¡¼/Âè12²ó¶áµ¦»ÙÉôÊ¿À®²Æµ¨¥»¥ß¥Ê¡¼¡Ë¡ÊÊ¡°æÂç³Øʸµþ¥¥ã¥ó¥Ñ¥¹¡¦¤¹¤«¤Ã¤È¥é¥ó¥É¶åƬε¡¢Ê¡°æ¡Ë(¥Ý¥¹¥¿¡¼)
[8]
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¹çƱ²Æ´ü¥»¥ß¥Ê¡¼¡ÊÂè37²óʬÀϲ½³ØÃæÉô²Æ´ü¥»¥ß¥Ê¡¼/Âè12²ó¶áµ¦»ÙÉôÊ¿À®²Æµ¨¥»¥ß¥Ê¡¼¡Ë¡ÊÊ¡°æÂç³Øʸµþ¥¥ã¥ó¥Ñ¥¹¡¦¤¹¤«¤Ã¤È¥é¥ó¥É¶åƬε¡¢Ê¡°æ¡Ë(¥Ý¥¹¥¿¡¼)
[9]
¼¾å
½¤Ê¿¡¢¸ÅΤ Âó̦¡¢ÄÔ
¹¬°ì¡Ö°æ·å¹½Â¤¥ì¥¸¥¹¥ÈÅÉÉÛËì¤òÍøÍѤ·¤¿Á´È¿¼Í·Ö¸÷XÀþʬÀϤˤª¤±¤ë¿·µ¬»îÎÁ½àÈ÷Ë¡¤ÎÄó°Æ¡×2018ǯ8·î30-31Æü¡¢ÃæÉô»ÙÉô¡¦¶áµ¦»ÙÉô
¹çƱ²Æ´ü¥»¥ß¥Ê¡¼¡ÊÂè37²óʬÀϲ½³ØÃæÉô²Æ´ü¥»¥ß¥Ê¡¼/Âè12²ó¶áµ¦»ÙÉôÊ¿À®²Æµ¨¥»¥ß¥Ê¡¼¡Ë¡ÊÊ¡°æÂç³Øʸµþ¥¥ã¥ó¥Ñ¥¹¡¦¤¹¤«¤Ã¤È¥é¥ó¥É¶åƬε¡¢Ê¡°æ¡Ë(¥Ý¥¹¥¿¡¼)
[10]
ÄÔ
¹¬°ì¡¢»³Æâ °ª¡¢»°ÅÄ
¾ºÊ¿¡¢´äºê Àµ´²¡¢ÎÓ
ϧ¡Ö·Ö¸÷XÀþ¸µÁÇ¥¤¥á¡¼¥¸¥ó¥°¤Ë¤ª¤±¤ë¾ðÊó½èÍýµ»½Ñ¤ÎŬÍÑ¡×2018ǯ9·î12-14Æü¡¢ÆüËÜʬÀϲ½³Ø²ñÂè67ǯ²ñ
(ÅìËÌÂç³ØÀîÆâËÌ¥¥ã¥ó¥Ñ¥¹¡¢µÜ¾ë¡Ë¡Ê¸ýƬ¡Ë
[11]
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¹¬°ì¡ÖÁ´»ëÌî·¿·Ö¸÷XÀþ¥¤¥á¡¼¥¸¥ó¥°ÁõÃ֤ˤª¤±¤ëľÀþ·¿¥Ý¥ê¥¥ã¥Ô¥é¥ê¡¼¤ÎºÇŬ²½¤ÈÀǽɾ²Á¡×2018ǯ9·î12-14Æü¡¢ÆüËÜʬÀϲ½³Ø²ñÂè67ǯ²ñ
(ÅìËÌÂç³ØÀîÆâËÌ¥¥ã¥ó¥Ñ¥¹¡¢µÜ¾ë¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[12]
»°ÅÄ
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¹¬°ì¡Ö¶¦¾ÇÅÀÈù¾®Éô·Ö¸÷XÀþʬÀÏÁõÃ֤ؤÎñ¿§XÀþ¸»¤ÎƳÆþ¤È¹â®²½¤Ø¤Î»î¤ß¡×2018ǯ9·î12-14Æü¡¢ÆüËÜʬÀϲ½³Ø²ñÂè67ǯ²ñ
(ÅìËÌÂç³ØÀîÆâËÌ¥¥ã¥ó¥Ñ¥¹¡¢µÜ¾ë¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[13]
»³Æâ
°ª¡¢´äºê Àµ´²¡¢ÎÓ
ϧ¡¢ÄÔ ¹¬°ì¡ÖÁ´»ëÌî·¿·Ö¸÷XÀþ¥¤¥á¡¼¥¸¥ó¥°¤È°µ½Ì¥»¥ó¥·¥ó¥°¤Ë¤è¤ëĶ²òÁü²òÀϤδðÁø¡Æ¤¡×2018ǯ10·î25-26Æü¡¢Âè54²óXÀþʬÀÏƤÏÀ²ñ¡ÊÅìµþÍý²ÊÂç³Ø¿À³Úºä¥¥ã¥ó¥Ñ¥¹¡¢Åìµþ¡Ë¡Ê¸ýƬ¡Ë
[14]
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¾ÂÀ¡¢ÃçÀ¾ ÅíÂÀϺ¡¢ÃæÌî
¤Ò¤È¤ß¡¢ÄÔ ¹¬°ì¡ÖÈù¾®Éô·Ö¸÷XÀþʬÀÏË¡¤Ë¤è¤ëƼ·ÏËÉÉåºÞ½èÍýÌÚºà¤Î¿¼¤µÊý¸þ¸µÁÇʬÉÛ²òÀÏ¡×2018ǯ10·î25-26Æü¡¢Âè54²óXÀþʬÀÏƤÏÀ²ñ¡ÊÅìµþÍý²ÊÂç³Ø¿À³Úºä¥¥ã¥ó¥Ñ¥¹¡¢Åìµþ¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[15]
»°ÅÄ
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¶µ»Ë¡¢ÄÔ ¹¬°ì¡Ö¶¦¾ÇÅÀ·¿Èù¾®Éô·Ö¸÷XÀþʬÀÏË¡¤Ë¤è¤ëÍÏÍ»°¡±ô¤á¤Ã¤¹ÝÈĤÎÉå¿©µóÆ°´Ñ»¡¡×2018ǯ10·î25-26Æü¡¢Âè54²óXÀþʬÀÏƤÏÀ²ñ¡ÊÅìµþÍý²ÊÂç³Ø¿À³Úºä¥¥ã¥ó¥Ñ¥¹¡¢Åìµþ¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[16]
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οÂÀ¡¢»³Æâ °ª¡¢ÄÔ
¹¬°ì¡ÖÇÈĹʬ»¶·¿µÚ¤Ó¥¨¥Í¥ë¥®¡¼Ê¬»¶·¿·Ö¸÷XÀþ¸µÁÇ¥¤¥á¡¼¥¸¥ó¥°Ë¡¤Îʬ¸÷ÆÃÀ¤Îɾ²Á¡×2018ǯ10·î25-26Æü¡¢Âè54²óXÀþʬÀÏƤÏÀ²ñ¡ÊÅìµþÍý²ÊÂç³Ø¿À³Úºä¥¥ã¥ó¥Ñ¥¹¡¢Åìµþ¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[17]
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½¤Ê¿¡¢¸ÅΤ Âó̦¡¢ÄÔ
¹¬°ì¡ÖúÁÇ·ÏÇöËì¤òÍѤ¤¤¿Á´È¿¼Í·Ö¸÷XÀþʬÀϤΤ¿¤á¤Î»îÎÁÄ´À½Ë¡¤Î¸¡Æ¤¡×2018ǯ10·î25-26Æü¡¢Âè54²óXÀþʬÀÏƤÏÀ²ñ¡ÊÅìµþÍý²ÊÂç³Ø¿À³Úºä¥¥ã¥ó¥Ñ¥¹¡¢Åìµþ¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[18]
ÃæÌî
¤Ò¤È¤ß¡¢ÃçÀ¾ ͳÈþ»Ò¡¢»°ÅÄ
¾ºÊ¿¡¢ÃçÀ¾ ÅíÂÀϺ¡¢¶ðë
¿µÂÀϺ¡¢ÄÔ ¹¬°ì¡Ö¶¦¾ÇÅÀ·Ö¸÷XÀþʬÀÏË¡¤Ë¤è¤ë¿©ÉÊÃæ±öʬ¤ÎʬÀÏ¡×2018ǯ10·î25-26Æü¡¢Âè54²óXÀþʬÀÏƤÏÀ²ñ¡ÊÅìµþÍý²ÊÂç³Ø¿À³Úºä¥¥ã¥ó¥Ñ¥¹¡¢Åìµþ¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[19]
»³Æâ
°ª¡¢»°ÅÄ ¾ºÊ¿¡¢´äºê
Àµ´²¡¢ÎÓ Ï§¡¢ÄÔ
¹¬°ì¡ÖÁ´»ëÌî·¿·Ö¸÷£ØÀþ¥¤¥á¡¼¥¸¥ó¥°¤È°µ½Ì¥»¥ó¥·¥ó¥°¤Ë¤è¤ëĶ²òÁü²òÀϤλî¤ß¡×2018ǯ11·î2Æü¡¢¶áµ¦»ÙÉôÁÏÀß65¼þǯµÇ°¹Ö±é²ñ¡Á°ÛʬÌî¤Ë¹¤¬¤ê¼¡À¤Âå¤Ë¤Ä¤Ê¤¬¤ëʬÀϲ½³Ø¡Á¡ÊÂçºå»ÔΩÂç³Ø³Ø½Ñ¾ðÊóÁí¹ç¥»¥ó¥¿¡¼¡¢Âçºå¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[20]
»³Æâ
°ª¡¢´äºê Àµ´²¡¢ÎÓ
ϧ¡¢ÄÔ ¹¬°ì¡ÖÁ´»ëÌî·Ö¸÷XÀþ¥¤¥á¡¼¥¸¥ó¥°ÁõÃÖ¤ÎʬÀÏÆÃÀɾ²Á¤ÈĶ²òÁü²òÀϤδðÁø¡Æ¤¡×2019ǯ1·î29Æü¡¢´ØÀ¾Ê¬Àϸ¦µæ²ñÊ¿À®30ǯÅÙÂè2²óÎã²ñ¡Ê³ô¼°²ñ¼Ò¥ê¥¬¥¯
Âçºå»Ù¼Ò¡¦Âçºå¹©¾ì¡¢Âçºå¡Ë¡Ê¸ýƬ¡Ë
2017ǯÅ٤γèÆ°
¡Êfrom April 2017 to March 2018¡Ë
¹ñºÝ²ñµÄ¤Ç¤Î¾·ÂÔ¡¦°ÍÍê¹Ö±é
Invited talks at international
conferences
[1]
K.
Tsuji, Workshop Instructor on ¡ÈTrace Analysis¡É, 66th Annual Conference on
Applications of X-ray Analysis Denver X-ray Conference, 31 July - 4 August
2017, Big Sky Resort, Big Sky, Montana, USA.
Presentations at international
conferences
[1]
K.
Tsuji, S Aida, M. Yamanashi, T. Sakumura, K.
Matsushita, T. Shoji, N. Kawahara, Wavelength-Dispersive XRF Imaging Using Soller Slits and 2D Detector, 66th Annual Conference on
Applications of X-ray Analysis Denver X-ray Conference, 31 July - 4 August
2017, Big Sky Resort, Big Sky, Montana, USA (oral).
[2]
K.
Tsuji, N Yomogita, Y. Konyuba,
Sample Preparation for TXRF Analysis Using Resist Pattern Technique, 66th
Annual Conference on Applications of X-ray Analysis Denver X-ray Conference, 31
July - 4 August 2017, Big Sky Resort, Big Sky, Montana, USA (poster).
[3]
N.
Kawahara, R. Hosomi, S. Mita,
K. Tsuji, Calculation Procedure of Confocal Micro-XRF Intensity for
Inhomogeneous Samples, 66th Annual Conference on Applications of X-ray Analysis
Denver X-ray Conference, 31 July - 4 August 2017, Big Sky Resort, Big Sky,
Montana, USA (poster).
[4]
K.
Tsuji, N. Yomogita, Y. Konyuba,
Sample Preparation Using Resist Pattern Technique For TXRF Analysis, The 17th
International Conference on Total Reflection X-Ray Fluorescence Analysis and
Related Methods (TXRF2017), 19-22 September 2017, Brescia, Italy (oral).
[5]
A.
Yamauchi, M. Yamanashi, Francesco Paolo Romano, K. Tsuji, Preliminary results
of full field XRF imaging under glancing incident condition, The 17th
International Conference on Total Reflection X-Ray Fluorescence Analysis and
Related Methods (TXRF2017), 19-22 September 2017, Brescia, Italy (poster).
[6]
N.
Yomogita, S. Mita, K.
Tsuji, Study on Sample Preparation for TXRF Analysis of Various Teas, The 17th
International Conference on Total Reflection X-Ray Fluorescence Analysis and
Related Methods (TXRF2017), 19-22 September 2017, Brescia, Italy (poster).
[7] Koji Akioka, Takashi Doi, Ryota Yagi, Tsuyoshi Matsuno, Kouichi Tsuji, Cross sectional elemental mapping of under
film corrosion of galvanized steel sheets by a confocal XRF analysis, The 11th International Conference on
Zinc and Zinc Alloy Coated Steel Sheet (Galvatech
2017), 12-16 November 2017, Ito International Research Center, The University
of Tokyo, Tokyo, Japan (oral).
Invited
talks at domestic conferences
[1]
ÄÔ ¹¬°ì¡Ö¼Ò²ñ¤ËÌòΩ¤Äʬ¸÷ʬÀϲ½³Ø¡×2017ǯ7·î6Æü¡¢ËÌÀÝ»°ÅĹâÅù³Ø¹»¡Ö°ìÆüÂç³ØÂθ³¹ÖºÂ¡×¡Êʼ¸Ë¸©Î©ËÌÀÝ»°ÅĹâÅù³Ø¹»¡¢Ê¼¸Ë¡Ë
[2]
ÄÔ ¹¬°ì¡Ö¶¦¾ÇÅÀ·¿·Ö¸÷£ØÀþʬÀÏË¡¤Ë¤è¤ë¿åÍϱÕÃæ¸ÇÂÎɽÌ̶á˵¤Î¸µÁÇʬÉۤβĻ벽¡×2017ǯ9·î2Æü¡¢µþÅÔ²½³Ø¼Ô¥¯¥é¥Ö¡ÊµþÅÔÂç³Ø³Úͧ²ñ´Û¡¢µþÅÔ¡Ë
[3]
ÄÔ ¹¬°ì¡Ö·Ö¸÷£ØÀþʬÀϤˤè¤ëÈùÎÌʬÀϤª¤è¤Ó¸µÁÇ¥¤¥á¡¼¥¸¥ó¥°¡×2017ǯ11·î25-26Æü¡¢Âè5²ó¥á¥¿¥í¥ß¥¯¥¹¸¦µæ¥Õ¥©¡¼¥é¥à¡ÊµþÅÔÌô²ÊÂç³Ø¡¢µþÅÔ¡Ë
[4]
ÄÔ ¹¬°ì¡Ö·Ö¸÷£ØÀþ¥¤¥á¡¼¥¸¥ó¥°Ë¡¤Ë¤è¤ëÉå¿©µóÆ°¤Î²Ä»ë²½¡×2018ǯ2·î2Æü¡¢Âçºå»ÔΩÂç³ØÂç³Ø±¡¹©³Ø¸¦µæ²Ê
Âè73²ó¥ª¡¼¥×¥ó¡¦¥é¥Ü¥é¥È¥ê¡¼¡ÊÂçºå»º¶ÈÁϤ´Û¡¢Âçºå¡Ë
¹ñÆâ¤Ç¤Î³Ø²ñȯɽ¤Ê¤É
Presentations at conferences in
Japan
[1] »³Æâ °ª¡¢ÂíËÜ Íºµ£¡¢»³Íü âÃÀ¸¡¢ÄÔ ¹¬°ì¡Ö¥Õ¥©¥È¥ó¥«¥¦¥ó¥Æ¥£¥ó¥°²òÀϤˤè¤ëÁ´»ëÌî·Ö¸÷£ØÀþ¥¤¥á¡¼¥¸¥ó¥°¤Î¸¦µæ¡×2017ǯ5·î23-25Æü¡¢Ê¿À®29ǯÅÙÆüËÜʬ¸÷³Ø²ñǯ¼¡¹Ö±é²ñ¡ÊÁá°ðÅÄÂç³ØÀ¾Áá°ðÅÄ¥¥ã¥ó¥Ñ¥¹¡¢Åìµþ¡Ë(¸ýƬ)
[2] »°ÅÄ ¾ºÊ¿¡¢¾¾Ìî ¹ä»Î¡¢ÄÔ ¹¬°ì¡Ö¶¦¾ÇÅÀ·¿3¼¡¸µ·Ö¸÷£ØÀþʬÀÏË¡¤Ë¤è¤ëÅÉËìÅ´¹Ý»îÎÁ¤ÎÉå¿©µóÆ°´Ñ»¡¡×2017ǯ5·î23-25Æü¡¢Ê¿À®29ǯÅÙÆüËÜʬ¸÷³Ø²ñǯ¼¡¹Ö±é²ñ¡ÊÁá°ðÅÄÂç³ØÀ¾Áá°ðÅÄ¥¥ã¥ó¥Ñ¥¹¡¢Åìµþ¡Ë(¸ýƬ)
[3] ÄÔ ¹¬°ì¡¢Ë©ÅÄ Ä¾Ìé¡¢¾®Æþ±© Í´¼£¡ÖÁ´È¿¼Í·Ö¸÷£ØÀþʬÀÏË¡¤Ë¤ª¤±¤ë¥ì¥¸¥¹¥ÈÅÉÉÛËì¤òÍѤ¤¤¿»îÎÁ½àÈ÷Ë¡¡×2017ǯ5·î27-28Æü¡¢Âè77²óʬÀϲ½³ØƤÏÀ²ñ¡ÊζëÂç³Ø¿¼Áð³Ø¼Ë¡¢µþÅÔ¡Ë(¸ýƬ)
[4] »³Íü âÃÀ¸¡¢ÄÔ ¹¬°ì¡ÖXÀþ¥¤¥á¡¼¥¸¥ó¥°Ë¡¤Ë¤ª¤±¤ëÄêÎÌʬÀϤؤΥ¢¥×¥í¡¼¥Á¡×2017ǯ5·î27-28Æü¡¢Âè77²óʬÀϲ½³ØƤÏÀ²ñ¡ÊζëÂç³Ø¿¼Áð³Ø¼Ë¡¢µþÅÔ¡Ë(¸ýƬ)
[5] ²ñÅÄ æÆÂÀ¡¢ÄÔ ¹¬°ì¡ÖÇÈĹʬ»¶·¿·Ö¸÷XÀþ¥¤¥á¡¼¥¸¥ó¥°¤Ë¤è¤ë¸µÁÇ¥â¥Ë¥¿¥ê¥ó¥°¤Î´ðÁø¡Æ¤¡×2017ǯ5·î27-28Æü¡¢Âè77²óʬÀϲ½³ØƤÏÀ²ñ¡ÊζëÂç³Ø¿¼Áð³Ø¼Ë¡¢µþÅÔ¡Ë(¥Ý¥¹¥¿¡¼)
[6] ºÙ¸« οʿ¡¢ÄÔ ¹¬°ì¡Ö¹ÝÈĤÎÈùÀ¸ÊªÉå¿©²áÄø¤Î¶¦¾ÇÅÀ·¿Èù¾®Éô·Ö¸÷XÀþʬÀÏË¡¤Ë¤è¤ë¤½¤Î¾ì´Ñ»¡¡×2017ǯ5·î27-28Æü¡¢Âè77²óʬÀϲ½³ØƤÏÀ²ñ¡ÊζëÂç³Ø¿¼Áð³Ø¼Ë¡¢µþÅÔ¡Ë(¥Ý¥¹¥¿¡¼)
[7] ºÙ¸« οʿ¡¢¼ë Àűó¡¢ÄÔ ¹¬°ì¡¢¹â¶¶ ¤Ï¤ë¤Ê¡ÖÂî¾å·¿·Ö¸÷£ØÀþʬÀÏÁõÃÖ¤òÍѤ¤¤¿2¼¡Î嵯¸ú²Ì¤Î¸¡¾Ú¡×2017ǯ5·î27-28Æü¡¢Âè77²óʬÀϲ½³ØƤÏÀ²ñ¡ÊζëÂç³Ø¿¼Áð³Ø¼Ë¡¢µþÅÔ¡Ë(¥Ý¥¹¥¿¡¼)
[8] ºÙ¸« οʿ¡¢ÄÔ ¹¬°ì¡Ö¶¦¾ÇÅÀ·¿Èù¾®Éô·Ö¸÷XÀþʬÀÏË¡¤Ë¤è¤ë±þÎϲ¼¤Ë¤ª¤±¤ë¿åÍϱÕÃæ¹ÝÈĤÎÉå¿©µóÆ°¤½¤Î¾ì´Ñ»¡¡×2017ǯ7·î18Æü¡¢´ØÀ¾Ê¬Àϸ¦µæ²ñÊ¿À®29ǯÅÙÂè1²óÎã²ñ¡ÊÂçºåÂç³ØÂç³Ø±¡¹©³Ø¸¦µæ²Ê¥Þ¥Æ¥ê¥¢¥ëÀ¸»º²Ê³ØÀ칶ºàÎÁʪÀµÇ°´Û¡¢Âçºå¡Ë(¸ýƬ¡Ë
[9] »°ÅÄ ¾ºÊ¿¡¢ÄÔ ¹¬°ì¡ÖÍÏÍ»°¡±ô¤á¤Ã¤¹ÝÈĤζ¦¾ÇÅÀ·Ö¸÷XÀþ¥¤¥á¡¼¥¸¥ó¥°¤È¼çÀ®Ê¬Ê¬ÀϤÎŬÍÑ¡×2017ǯ8·î7-8Æü¡¢ÆüËÜʬÀϲ½³Ø²ñ¶áµ¦»ÙÉô Ê¿À®²Æµ¨¥»¥ß¥Ê¡¼¡ÊÅ챺¥µ¥ó¥Ñ¡¼¥¯¡¢Ê¼¸Ë¡Ë(¥Ý¥¹¥¿¡¼)
[10] »³Æâ °ª¡¢ÄÔ ¹¬°ì¡Ö¥Õ¥©¥È¥ó¥«¥¦¥ó¥Æ¥£¥ó¥°²òÀϤˤè¤ëÁ´»ëÌî·Ö¸÷XÀþ¥¤¥á¡¼¥¸¥ó¥°¡×2017ǯ8·î7-8Æü¡¢ÆüËÜʬÀϲ½³Ø²ñ¶áµ¦»ÙÉô Ê¿À®²Æµ¨¥»¥ß¥Ê¡¼¡ÊÅ챺¥µ¥ó¥Ñ¡¼¥¯¡¢Ê¼¸Ë¡Ë(¥Ý¥¹¥¿¡¼)
[11] ²ñÅÄ æÆÂÀ¡¢ÄÔ ¹¬°ì¡ÖÇÈĹʬ»¶·¿·Ö¸÷XÀþ¥¤¥á¡¼¥¸¥ó¥°¤Ë¤è¤ë¤¤¤¯¤Ä¤«¤Î²½³ØÈ¿±þ¤Î¸µÁÇ¥â¥Ë¥¿¥ê¥ó¥°¡×2017ǯ9·î9-12Æü¡¢ÆüËÜʬÀϲ½³Ø²ñÂè66ǯ²ñ¡ÊÅìµþÍý²ÊÂç³Ø³ë¾þ¥¥ã¥ó¥Ñ¥¹¡¢Åìµþ¡Ë(¸ýƬ)
[12] ºÙ¸« οʿ¡¢ÄÔ ¹¬°ì¡Ö¶¦¾ÇÅÀ·¿Èù¾®Éô·Ö¸÷XÀþʬÀÏË¡¤Ë¤è¤ë¿åÍϱÕÃæ¶Ê¤²±þÎϲ¼¹ÝÈĤÎÉå¿©²áÄø¤½¤Î¾ì´Ñ»¡¡×2017ǯ9·î9-12Æü¡¢ÆüËÜʬÀϲ½³Ø²ñÂè66ǯ²ñ¡ÊÅìµþÍý²ÊÂç³Ø³ë¾þ¥¥ã¥ó¥Ñ¥¹¡¢Åìµþ¡Ë(¸ýƬ)
[13] Ë©ÅÄ Ä¾Ìé¡¢¾®Æþ±© Í´¼£¡¢ÄÔ ¹¬°ì¡Ö°æ·å¹½Â¤¥ì¥¸¥¹¥È´ðÈĤòÍѤ¤¤¿Á´È¿¼Í·Ö¸÷£ØÀþʬÀϤˤª¤±¤ë¬ÄêºÆ¸½À¤Î¸þ¾å¡×2017ǯ9·î9-12Æü¡¢ÆüËÜʬÀϲ½³Ø²ñÂè66ǯ²ñ¡ÊÅìµþÍý²ÊÂç³Ø³ë¾þ¥¥ã¥ó¥Ñ¥¹¡¢Åìµþ¡Ë(¥Ý¥¹¥¿¡¼)
[14] ÄÔ
¹¬°ì¡Ö¼Â¸³¼¼¤Ë¤ª¤±¤ë·Ö¸÷£ØÀþ¸µÁÇ¥¤¥á¡¼¥¸¥ó¥°¡×2017ǯ10·î20Æü¡¢2017ǯÅÙÂè2²óÄó°Æ¸øÊç·¿¥»¥ß¥Ê¡¼¡Ö·Ö¸÷£ØÀþ¥¤¥á¡¼¥¸¥ó¥°¤Î¿·Å¸³«¡×¡ÊÂçºå»ÔΩÂç³Ø¿ùËÜ¥¥ã¥ó¥Ñ¥¹¡¢Âçºå¡Ë(¸ýƬ)
[15] Francesco Paolo Romano, Kouichi Tsuji, Claudia Caliri, Lighea Pappalardo, Francesca
Rizzo, Hellen Cristine Santos, Full Field XRF and scanning XRF – Novel aproaches for a real time elemental imaging of 2D and 3D
samples –, 2017ǯ10·î26-27Æü¡¢Âè53²óXÀþʬÀÏƤÏÀ²ñ¡ÊÆÁÅçÂç³Ø¾ï»°Å祥ã¥ó¥Ñ¥¹¡¢ÆÁÅç¡Ë(¸ýƬ)
[16] Ë©ÅÄ Ä¾Ìé¡¢¾®Æþ±© Í´¼£¡¢ÄÔ ¹¬°ì¡Ö°æ·å¹½Â¤¤òͤ¹¤ë¥ì¥¸¥¹¥ÈÅÉÉÛËì¤òÍøÍѤ·¤¿Á´È¿¼Í·Ö¸÷XÀþʬÀÏÀºÅ٤θþ¾å¤Ë´Ø¤¹¤ë¸¡Æ¤¡×2017ǯ10·î26-27Æü¡¢Âè53²óXÀþʬÀÏƤÏÀ²ñ¡ÊÆÁÅçÂç³Ø¾ï»°Å祥ã¥ó¥Ñ¥¹¡¢ÆÁÅç¡Ë(¸ýƬ)¡¡
[17] ¸ÅΤ Âó̦¡¢¼ë Àű󡢹ⶶ ¤Ï¤ë¤Ê¡¢ÄÔ ¹¬°ì¡ÖÂî¾å·¿·Ö¸÷XÀþʬÀÏÁõÃ֤ˤª¤±¤ë2¼¡¥¿¡¼¥²¥Ã¥ÈŬÍѲÄǽÀ¤ÈÃãÍÕ¤ÎÁÈÀ®Ê¬ÀÏ¡×2017ǯ10·î26-27Æü¡¢Âè53²óXÀþʬÀÏƤÏÀ²ñ¡ÊÆÁÅçÂç³Ø¾ï»°Å祥ã¥ó¥Ñ¥¹¡¢ÆÁÅç¡Ë(¥Ý¥¹¥¿¡¼)
[18] »³Íü âÃÀ¸¡¢»³Æâ °ª¡¢ÄÔ ¹¬°ì¡¢F. P. Romano¡ÖÁ´»ëÌî·¿·Ö¸÷XÀþÄêÎÌ¥¤¥á¡¼¥¸¥ó¥°Ë¡¤Î´ðÁÃŪ¸¡Æ¤¡×2017ǯ10·î26-27Æü¡¢Âè53²óXÀþʬÀÏƤÏÀ²ñ¡ÊÆÁÅçÂç³Ø¾ï»°Å祥ã¥ó¥Ñ¥¹¡¢ÆÁÅç¡Ë(¥Ý¥¹¥¿¡¼)
[19] »³Æâ °ª¡¢»³Íü âÃÀ¸¡¢F. P.
Romano¡¢ÄÔ ¹¬°ì¡Ö¼ÐÆþ¼ÍÇÛÃ֤ǤÎÁ´»ëÌ¥Í¥ë¥®¡¼Ê¬»¶·¿·Ö¸÷XÀþ¥¤¥á¡¼¥¸¥ó¥°¡×2017ǯ10·î26-27Æü¡¢Âè53²óXÀþʬÀÏƤÏÀ²ñ¡ÊÆÁÅçÂç³Ø¾ï»°Å祥ã¥ó¥Ñ¥¹¡¢ÆÁÅç¡Ë(¥Ý¥¹¥¿¡¼)
[20] ÃçÀ¾ ÅíÂÀϺ¡¢ÄÔ ¹¬°ì¡¢Æ£°æ
µÁµ×¡ÖÈù¾®Éô·Ö¸÷XÀþʬÀÏÁõÃ֤ˤè¤ëÌÚºàÃæ¤ÎƼ·ÏËÉÉåºÞ¤ÎʬÉÛ²òÀÏ¡×2017ǯ10·î26-27Æü¡¢Âè53²óXÀþʬÀÏƤÏÀ²ñ¡ÊÆÁÅçÂç³Ø¾ï»°Å祥ã¥ó¥Ñ¥¹¡¢ÆÁÅç¡Ë(¥Ý¥¹¥¿¡¼)
[21] »°ÅÄ ¾ºÊ¿¡¢²Ï¸¶ ľ¼ù¡¢ÄÔ
¹¬°ì¡Öñ¿§XÀþ¤òÎ嵯¸»¤È¤¹¤ë¶¦¾ÇÅÀ·¿Èù¾®Éô·Ö¸÷XÀþʬÀÏÁõÃ֤γ«È¯¡×2017ǯ10·î26-27Æü¡¢Âè53²óXÀþʬÀÏƤÏÀ²ñ¡ÊÆÁÅçÂç³Ø¾ï»°Å祥ã¥ó¥Ñ¥¹¡¢ÆÁÅç¡Ë(¥Ý¥¹¥¿¡¼)
[22] ¸ÅΤ ¹ªÌ¦¡¢Ë©ÅÄ Ä¾Ìé¡¢ÄÔ
¹¬°ì¡ÖÌÓȱÃæ¤ÎCa¤äS¤Î·Ö¸÷£ØÀþ¸µÁÇʬÀÏ¡×2018ǯ1·î24Æü¡¢´ØÀ¾Ê¬Àϸ¦µæ²ñÊ¿À®29ǯÅÙÂè2²óÎã²ñ¡Êʼ¸Ë¸©Î©¹©¶Èµ»½Ñ¥»¥ó¥¿¡¼¡¢Ê¼¸Ë¡Ë(¸ýƬ)
[23] ÄÔ
¹¬°ì¡¢ºÙ¸« οʿ¡Ö£³¼¡¸µ·Ö¸÷XÀþ¸µÁÇʬÉÛ²òÀϤˤè¤ë¿åÍϱÕÃæÅ´¹Ý»îÎÁ¤Î±þÎÏÉÕ²ÃÉå¿©¿Ê¹Ô²áÄø¤Î²Ä»ë²½¡×2018ǯ3·î19-21Æü¡¢ÆüËÜÅ´¹Ý¶¨²ñÂè175²ó½Õµ¨¹Ö±éÂç²ñ¡ÊÀéÍÕ¹©¶ÈÂç³Ø¿·½¬»ÖÌã¥ó¥Ñ¥¹¡¢ÀéÍաˡʸýƬ¡Ë
2016ǯÅ٤γèÆ°
¡Êfrom April 2016 to March 2017¡Ë
¹ñºÝ²ñµÄ¤Ç¤Î¾·ÂÔ¡¦°ÍÍê¹Ö±é
Invited
talks at international conferences
[1]
K.
Tsuji, Workshop Instructor on ¡È Trace Analysis¡É, 65th Annual Conference on
Applications of X-ray Analysis Denver X-ray Conference, 1 -5 August 2016,
Rosemont, IL, USA.
[2]
Kouichi Tsuji, Shota Aida, Yuki
Takimoto, XRF imaging based on polycapillary
optics, The 7th International Conference Channeling 2016 - Charged &
Neutral Particles Channeling Phenomena, 25-30 September 2016, Sirmione - Desenzano del Garda,
Italy.
[3]
Kouichi Tsuji, Co-Chair of
Session 2-8: X-ray Spectroscopy, AnalytiX-2017, 22-24 March 2017, Hilton
Fukuoka Sea Hawk, Fukuoka, Japan.
¹ñºÝ²ñµÄ¤Ç¤Î°ìÈֱ̹é
Presentations
at international conferences
[1] Kouichi Tsuji, Yuki Takimoto, Tsuyoshi Matsuno, Naoki
Kawahara and Jigi Chin, Confocal micro-XRF imaging
and WD- XRF imaging for monitoring of chemical reactions in solutions, European
Conference on X-Ray Spectrometry (EXRS2016), 19-24 June 2016, Gothenburg,
Sweden
(oral).
[2] Shota Aida, Takeshi
Hasegawa and Kouichi Tsuji, Preliminary research on
PCA for micro XRF imaging, European Conference on X-Ray Spectrometry (EXRS2016),
19-24 June 2016, Gothenburg, Sweden (poster).
[3] Ryohei Hosomi
and Kouichi Tsuji, Sample preparation for TXRF
analysis of metal particles in used machine oil, European
Conference on X-Ray Spectrometry (EXRS2016), 19-24 June 2016, Gothenburg,
Sweden
(poster).
[4] Shota Aida, Masaki
Yamanashi, Yuki Takimoto, Yuta Kitado,
Francesco Paolo Romano, Koen Janssens and Kouichi
Tsuji, WD- and ED-XRF imaging techniques for industrial and painting samples, European
Conference on X-Ray Spectrometry (EXRS2016), 19-24 June 2016, Gothenburg,
Sweden (poster).
[5] Ryohei Hosomi,
Yuri Tabuchi and Kouichi
Tsuji, Sample preparation for TXRF analysis of teas, European
Conference on X-Ray Spectrometry (EXRS2016), 19-24 June 2016, Gothenburg,
Sweden
(oral).
[6] Laura Borgese, Fabjola Bilo, Annalisa Zacco, Diane Eichert, Werner Jark, Kouichi Tsuji, Elza Bontempi and Laura Eleonora Depero,
Chemical analysis of airborne particulate matter collected on filters prepared
by SMART STORE? by means of X-Ray Fluorescence based techniques, European
Conference on X-Ray Spectrometry (EXRS2016), 19-24 June 2016, Gothenburg,
Sweden
(oral).
[7] N. Kawahara, T. Matsuno, K. Tsuji, Calculation of Fluorescent X-ray
Intensity for Confocal Micro-XRF Analysis of Inhomogeneous Samples, 65th Annual
Conference on Applications of X-ray Analysis Denver X-ray Conference, 1 -5
August 2016, Rosemont, IL, USA (poster).
[8] K. Tsuji, Y. Takimoto, M. Yamanashi, S. Kato, T. Yamada, T. Shoji, N.
Kawahara, Comparison of Wavelength-Dispersive and Energy-Dispersive XRF Imaging
Methods, 65th Annual Conference on Applications of X-ray Analysis Denver X-ray
Conference, 1 -5 August 2016, Rosemont, IL, USA (oral).
[9]
Kouichi Tsuji, Shota Aida, Yuki
Takimoto, EDXRF and WDXRF imaging techniques in the
laboratory, AnalytiX-2017, 22-24 March 2017, Hilton Fukuoka
Sea Hawk, Fukuoka, Japan (oral).
¹ñÆâ¤Ç¤Î¾·ÂÔ¡¦°ÍÍê¹Ö±é
Invited talks at domestic
conferences
[1]
ÄÔ ¹¬°ì¡Ö¼Ò²ñ¤ËÌòΩ¤Äʬ¸÷ʬÀϲ½³Ø¡×2016ǯ7·î7Æü¡¢ËÌÀÝ»°ÅĹâÅù³Ø¹»¡Ö°ìÆüÂç³ØÂθ³¹ÖºÂ¡×¡Êʼ¸Ë¸©Î©ËÌÀÝ»°ÅĹâÅù³Ø¹»¡¢Ê¼¸Ë¡Ë
[2]
ÄÔ ¹¬°ì¡ÖÁ´È¿¼Í·Ö¸÷XÀþʬÀÏ¡×2016ǯ7·î11-13Æü¡¢Âè20²óXÀþʬÀϹֽ¬²ñ ·Ö¸÷XÀþʬÀϤμºݡÊÂè9²ó¡Ë¡½
µ¡Ç½ÀºàÎÁ¡¢Ãϵå´Ä¶»îÎÁ¡¢¿©ÉÊ¡¢Ê¸²½ºâ¤Î´Ê°×¿×®ʬÀÏË¡¡ÊÅìµþÍý²ÊÂç³ØµÇ°¹ÖƲ¡¢Åìµþ¡Ë
[3]
ÄÔ ¹¬°ì¡Ö£ØÀþÈ¿¼ÍΨ¬ÄêË¡¡ÊXRR¡Ë¤ª¤è¤ÓÁ´È¿¼Í·Ö¸÷XÀþʬ¸÷Ë¡¡ÊTXRF¡Ë¤Î¹ñºÝɸ½à²½¡× 2016ǯ9·î8Æü¡¢JASIS¥³¥ó¥Õ¥¡¥ì¥ó¥¹
JSCAɽÌ̲½³ØʬÀϵ»½Ñ¹ñºÝɸ½à²½¥»¥ß¥Ê¡¼¡ÖɽÌÌʬÀÏ¡¦¥Þ¥¤¥¯¥í¥Ó¡¼¥à¥¢¥Ê¥ê¥·¥¹¤Ë¤ª¤±¤ë¹ñºÝɸ½à²½¤ÎÆ°¸þ¡×¡ÊËëÄ¥¥á¥Ã¥»¹ñºÝ²ñµÄ¾ì103²ñµÄ¼¼¡¢ÀéÍÕ¡Ë
[4]
ÄÔ ¹¬°ì¡ÖÆÃÊÌ¥·¥ó¥Ý¥¸¥¦¥à¹Ö±é¡§·Ö¸÷XÀþ¥¤¥á¡¼¥¸¥ó¥°¤Ë¤è¤ë¸Ç±Õ³¦Ì̶á˵¤Ë¤ª¤±¤ë¸µÁÇʬÉۤβĻ벽¡×2016ǯ9·î14-16Æü¡¢ÆüËÜʬÀϲ½³Ø²ñÂè65ǯ²ñ
(Ë̳¤Æ»Âç³Ø¹©³ØÉô¡¢Ë̳¤Æ»)
[5]
ÄÔ ¹¬°ì¡Ö·Ö¸÷XÀþ¥¤¥á¡¼¥¸¥ó¥°¤Ë¤è¤ë¸Ç±Õ³¦Ì̶á˵¤Ë¤ª¤±¤ë¸µÁÇʬÉÛ²òÀÏ¡×2016ǯ11·î16Æü¡¢Âçºå¥Ë¥å¡¼¥¯¥ê¥¢¥µ¥¤¥¨¥ó¥¹¶¨²ñÊ¿À®28ǯÅÙÂè2²ó¸«³Ø²ñ¡Ê¸¦µæ¾Ò²ð¡Ë¡ÊÂçºå»ÔΩÂç³Ø¿ùËÜ¥¥ã¥ó¥Ñ¥¹¡¢Âçºå¡Ë
¹ñÆâ¤Ç¤Î³Ø²ñȯɽ¤Ê¤É
Presentations at conferences in
Japan
[1]
ÄÔ ¹¬°ì¡¢¾¾Ìî ¹ä»Î¡¢ÂíËÜ Íºµ£¡¢»³Íü âÃÀ¸¡Ö·Ö¸÷XÀþʬÀϤˤè¤ëÈùÎÌʬÀϤȸµÁÇ¥¤¥á¡¼¥¸¥ó¥°¤ª¤è¤ÓË¡²Ê³Ø»îÎÁ¤Ø¤ÎŬÍѲÄǽÀ¡×2016ǯ5·î28-29Æü¡¢Âè76²óʬÀϲ½³ØƤÏÀ²ñ¡Ê´ôÉìÌô²ÊÂç³Ø¡¢´ôÉìÂç³Ø¡¢´ôÉì¡Ë(¸ýƬ)
[2]
¾¾Ìî ¹ä»Î¡¢½©²¬ ¹¬»Ê¡¢ÅÚ°æ ¶µ»Ë¡¢Ä¹Ã«Àî ·ò¡¢ÄÔ ¹¬°ì¡Ö±ö¿å¤Ë¿»ÄÒ¤·¤¿¹ÝÈÄ»îÎÁ¤ÎÉå¿©µóÆ°¤Î¤½¤Î¾ì·Ö¸÷XÀþ¥¤¥á¡¼¥¸¥ó¥°¤ª¤è¤Ó¼çÀ®Ê¬Ê¬ÀϤÎŬÍÑ¡×2016ǯ5·î28-29Æü¡¢Âè76²óʬÀϲ½³ØƤÏÀ²ñ¡Ê´ôÉìÌô²ÊÂç³Ø¡¢´ôÉìÂç³Ø¡¢´ôÉì¡Ë(¸ýƬ)
[3]
ÂíËÜ Íºµ£¡¢»³Íü âÃÀ¸¡¢ÄÔ ¹¬°ì¡ÖÁ´»ëÌî·¿·Ö¸÷XÀþ¥¤¥á¡¼¥¸¥ó¥°¤Ë¤è¤ëÂçÌÌÀÑ»îÎÁ¤ËÂФ¹¤ë¸µÁÇʬÉÛ¾ðÊó¤Î¼èÆÀ¡×2016ǯ5·î28-29Æü¡¢Âè76²óʬÀϲ½³ØƤÏÀ²ñ¡Ê´ôÉìÌô²ÊÂç³Ø¡¢´ôÉìÂç³Ø¡¢´ôÉì¡Ë(¸ýƬ)
[4]
ÄÔ ¹¬°ì¡Ö¶¦¾ÇÅÀÈù¾®Éô·Ö¸÷XÀþʬÀÏË¡¤Ë¤è¤ë¿¼¤µÁªÂòŪ¸µÁÇ¥¤¥á¡¼¥¸¥ó¥°¡×2016ǯ7·î11-13Æü¡¢Âè20²óXÀþʬÀϹֽ¬²ñ ·Ö¸÷XÀþʬÀϤμºݡÊÂè9²ó¡Ë¡½ µ¡Ç½ÀºàÎÁ¡¢Ãϵå´Ä¶»îÎÁ¡¢¿©ÉÊ¡¢Ê¸²½ºâ¤Î´Ê°×¿×®ʬÀÏË¡¡ÊÅìµþÍý²ÊÂç³ØµÇ°¹ÖƲ¡¢Åìµþ¡Ë(¥Ý¥¹¥¿¡¼)
[5]
²ñÅÄ æÆÂÀ¡¢ÄÔ ¹¬°ì¡Ö·Ö¸÷XÀþ¸µÁÇ¥¤¥á¡¼¥¸¥ó¥°¤Ø¤Î¼çÀ®Ê¬Ê¬ÀϤÎŬÍÑ¡×2016ǯ7·î28-29Æü¡¢ÆüËÜʬÀϲ½³Ø²ñ¶áµ¦»ÙÉô Âè10²óÊ¿À®²Æµ¨¥»¥ß¥Ê¡¼¡ÊÀ֤Ȥó¤ÜÁñ¡¢Ê¼¸Ë¡Ë(¥Ý¥¹¥¿¡¼)
[6]
ºÙ¸« οʿ¡¢ÄÔ ¹¬°ì¡ÖÇÑÌýÃæ¶â°¸µÁǤÎÁ´È¿¼Í·Ö¸÷XÀþʬÀÏ¡× 2016ǯ7·î28-29Æü¡¢ÆüËÜʬÀϲ½³Ø²ñ¶áµ¦»ÙÉôÂè10²óÊ¿À®²Æµ¨¥»¥ß¥Ê¡¼¡ÊÀ֤Ȥó¤ÜÁñ¡¢Ê¼¸Ë¡Ë(¥Ý¥¹¥¿¡¼)
[7]
Ë©ÅÄ Ä¾Ìé¡¢ÄÔ ¹¬°ì¡Ö¶¦¾ÇÅÀ·¿Èù¾®Éô·Ö¸÷XÀþʬÀÏË¡¤Ë¤è¤ëÌÓȱÃæ¤Î¸µÁDzòÀÏ¡×2016ǯ7·î28-29Æü¡¢ÆüËÜʬÀϲ½³Ø²ñ¶áµ¦»ÙÉôÂè10²óÊ¿À®²Æµ¨¥»¥ß¥Ê¡¼¡ÊÀ֤Ȥó¤ÜÁñ¡¢Ê¼¸Ë¡Ë(¥Ý¥¹¥¿¡¼)
[8]
Ë©ÅÄ Ä¾Ìé¡¢ÄÔ ¹¬°ì¡Ö¹ÈÃã¤ÎÁ´È¿¼Í·Ö¸÷XÀþʬÀϤΤ¿¤á¤Î»îÎÁ½àÈ÷Ë¡¤Î¸¡Æ¤¡×2016ǯ9·î14-16Æü¡¢ÆüËÜʬÀϲ½³Ø²ñÂè65ǯ²ñ¡ÊË̳¤Æ»Âç³Ø¡¢Ë̳¤Æ»¡Ë(¸ýƬ)
[9]
Ë©ÅÄ Ä¾Ìé¡¢ÄÔ ¹¬°ì¡Ö¶¦¾ÇÅÀ·¿Èù¾®Éô·Ö¸÷XÀþʬÀÏË¡¤òÍѤ¤¤¿ÌÓȱÃæ¤Î¸µÁÇʬÉÛ²òÀÏ¡×2016ǯ9·î14-16Æü¡¢ÆüËÜʬÀϲ½³Ø²ñÂè65ǯ²ñ¡ÊË̳¤Æ»Âç³Ø¡¢Ë̳¤Æ»¡Ë(¥Ý¥¹¥¿¡¼)
[10]
²Ï¸¶ ľ¼ù¡¢¾¾Ìî ¹ä»Î¡¢ºÙ¸« οʿ¡¢ÄÔ ¹¬°ì¡ÖÉԶѼÁ»îÎÁ¤Î¶¦¾ÇÅÀÈù¾®ÉôXRFʬÀϤˤª¤±¤ëÄêÎÌŪ¥Ç¡¼¥¿²òÀÏ¡×2016ǯ10·î26-28Æü¡¢Âè52²óXÀþʬÀÏƤÏÀ²ñ¡ÊÃÞÇÈÂç³ØÅìµþ¥¥ã¥ó¥Ñ¥¹¡¢Åìµþ¡Ë(¥Ý¥¹¥¿¡¼)
[11]
ÂíËÜ Íºµ£¡¢Francesco
Paolo Romano¡¢ÄÔ ¹¬°ì¡ÖÁ´»ëÌî·¿EDXRF¥¤¥á¡¼¥¸¥ó¥°ÁõÃ֤γ«È¯¤ÈÆÃÀɾ²Á¡×2016ǯ10·î26-28Æü¡¢Âè52²óXÀþʬÀÏƤÏÀ²ñ¡ÊÃÞÇÈÂç³ØÅìµþ¥¥ã¥ó¥Ñ¥¹¡¢Åìµþ¡Ë(¥Ý¥¹¥¿¡¼)
[12]
²ñÅÄ æÆÂÀ¡¢ÄÔ ¹¬°ì¡ÖWD-XRF¥¤¥á¡¼¥¸¥ó¥°¤Ë¤è¤ë²½³ØÈ¿±þ²áÄø¤Î¸µÁÇ¥â¥Ë¥¿¥ê¥ó¥°¡×2016ǯ10·î26-28Æü¡¢Âè52²óXÀþʬÀÏƤÏÀ²ñ¡ÊÃÞÇÈÂç³ØÅìµþ¥¥ã¥ó¥Ñ¥¹¡¢Åìµþ¡Ë(¸ýƬ)
[13]
ºÙ¸« οʿ¡¢ÄÔ ¹¬°ì¡Ö¶¦¾ÇÅÀ·¿Èù¾®Éô·Ö¸÷XÀþʬÀÏË¡¤Ë¤è¤ë¹ÝÈĤÎÈùÀ¸ÊªÉå¿©¤½¤Î¾ì´Ñ»¡¡×2016ǯ10·î26-28Æü¡¢Âè52²óXÀþʬÀÏƤÏÀ²ñ¡ÊÃÞÇÈÂç³ØÅìµþ¥¥ã¥ó¥Ñ¥¹¡¢Åìµþ¡Ë(¥Ý¥¹¥¿¡¼)
[14]
Åĸ¶ ϲ¡¢ÄÔ ¹¬°ì¡Ö¥³¡¼¥¯¥¹ÆâÉô¤Î¶¦¾ÇÅÀ·¿Èù¾®Éô·Ö¸÷£ØÀþʬÀϤˤè¤ë¸µÁÇʬÉÛ²òÀÏ¡×2017ǯ1·î24Æü¡¢´ØÀ¾Ê¬Àϸ¦µæ²ñÊ¿À®28ǯÅÙÂè2²óÎã²ñ¡ÊÃÏÊýÆÈΩ¹ÔÀ¯Ë¡¿Í ÂçºåÉÜΩ»º¶Èµ»½ÑÁí¹ç¸¦µæ½ê¡¢Âçºå¡Ë¡Ê¸ýƬ¡Ë
[15]
ÄÔ ¹¬°ì¡Ö¼Â¸³¼¼¤Ë¤ª¤±¤ë·Ö¸÷XÀþ¸µÁÇ¥¤¥á¡¼¥¸¥ó¥°¡×2017ǯ1·î30-31Æü¡¢ÆÈΩ¹ÔÀ¯Ë¡¿ÍÆüËܳؽѿ¶¶½²ñ¡¡À½¹ÝÂ裱£¹°Ñ°÷²ñ¡ÊÅìµþ¹©¶ÈÂç³ØÂ粬»³¥¥ã¥ó¥Ñ¥¹¡¢Åìµþ¡Ë(¸ýƬ)
[16]
»°ÅÄ ¾ºÊ¿¡¢²Ï¸¶ ľ¼ù¡¢ÄÔ ¹¬°ì¡Öñ¿§Î嵯¤Î¶¦¾ÇÅÀ·Ö¸÷XÀþʬÀÏÁõÃ֤γ«È¯¤È¤½¤ÎÀǽɾ²Á¡×2017ǯ3·î15-17Æü¡¢ÆüËÜÅ´¹Ý¶¨²ñÂè173²ó½Õµ¨¹Ö±éÂç²ñ¡Ê¼óÅÔÂç³ØÅìµþ ÆîÂçÂô¥¥ã¥ó¥Ñ¥¹¡¢Åìµþ¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[17]
»³Æâ °ª¡¢ÄÔ ¹¬°ì¡ÖXPS¤Ë¤ª¤±¤ëXÀþ½Æ¤«¤é¤ÎϢ³XÀþ¤Ë¤è¤ë±Æ¶Á¡×2017ǯ3·î15-17Æü¡¢ÆüËÜÅ´¹Ý¶¨²ñÂè173²ó½Õµ¨¹Ö±éÂç²ñ¡Ê¼óÅÔÂç³ØÅìµþ ÆîÂçÂô¥¥ã¥ó¥Ñ¥¹¡¢Åìµþ¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
2015ǯÅ٤γèÆ°
¡Êfrom April 2015 to March 2016¡Ë
¹ñºÝ²ñµÄ¤Ç¤Î¾·ÂÔ¡¦°ÍÍê¹Ö±é
Invited
talks at international conferences
[1]
K.
Tsuji, Workshop organizer and Instructor on ¡È TXRF Standardization¡É, 64th
Annual Conference on Applications of X-ray Analysis, Denver X-ray Conference
& 16th TXRF, 3 -7 August 2015, Westminster, Colorado, USA.
[2]
K.
Tsuji, J. Chin, M. Yamanashi, Y. Kitado, Confocal
Micro-XRF Analysis for Monitoring Chemical Reactions, 64th Annual Conference on
Applications of X-ray Analysis, Denver X-ray Conference, 3 -7 August 2015,
Westminster, Colorado, USA.
[3]
K.
Tsuji, TXRF standardization, Chinese conference of X-ray Spectrometry: Workshop
at National Research Center of Geoanalysis, 15-16
September 2015, Beijing, China.
[4]
K.
Tsuji, XRF imaging -scanning & projection techniques-, Chinese conference
of X-ray Spectrometry: Workshop at National Research Center of Geoanalysis, 15-16 September 2015, Beijing, China.
[5]
K.
Tsuji, ED and WD XRF imaging, Chinese conference of X-ray Spectrometry, 17-18
September 2015, Weihai, China.
¹ñºÝ²ñµÄ¤Ç¤Î°ìÈֱ̹é
Presentations at international
conferences
[1]
Kouichi Tsuji, Kazuhiko Nakano,
Masaki Yamanashi, Ryota Yagi, Shuichi Kato, Naoki
Kawahara, Takashi Yamada , and Takashi Shoji, Micro-XRF imaging and WD-XRF
imaging, Technart2015, 27-30 April 2015, Catania, Italy (oral).
[2]
Y.
Tabuchi and K. Tsuji, TXRF Intensity of Dried Residue
and Its Position on Glass Substrate, 16th TXRF, 3 -7 August 2015,
Westminster, Colorado, USA (oral).
[3]
T.
Matsuno, Y. Tabuchi, and K.
Tsuji, TXRF Analysis of Metal Particles in Used Machine Oils and Feasibility
Research for Application of Principal Component Analysis, 16th TXRF,
3 -7 August 2015, Westminster, Colorado, USA (oral).
[4]
Y.
Takimoto, M. Yamanashi, S. Kato, T. Shoji, and K.
Tsuji, WD-XRF Imaging with Polycapillary Optics under
Glancing Incidence Geometry, 16th TXRF, 3 -7 August 2015, Westminster,
Colorado, USA (poster).
[5]
T.
Matsuno, Y. Kitado, M.
Yamanashi, T. Hasegawa, and K. Tsuji, Improvement of Spatial Resolution of Confocal
Micro-XRF Images Using Principal Component Analysis, 64th Annual Conference on
Applications of X-ray Analysis, Denver X-ray Conference, 3 -7 August 2015,
Westminster, Colorado, USA (poster).
[6]
K.
Tsuji, T. Matsuno, Y. Takimoto,
and N. Kawahara, Secondary Excitation Observed in Lateral Scan Using Confocal
Micro-XRF, 64th Annual Conference on Applications of X-ray Analysis, Denver
X-ray Conference, 3 -7 August 2015, Westminster, Colorado, USA (poster).
[7]
Yuki
Takimoto, Masaki Yamanashi, Shuichi Kato, Takashi
Shoji, Kouichi Tsuji, Fast elemental imaging by
WD-XRF spectrometer, RSC Tokyo International Conference 2015, International
Conference Session, JASIS Conference, 3-4 September 2015, Makuhari
Messe International Conference Hall, Chiba, Japan (poster).
[8]
Shota
Aida, Tsuyoshi Matsuno, Takeshi Hasegawa, Kouichi Tsuji, Application of PCA for X-ray Fluorescence
Mapping, RSC Tokyo International Conference 2015, International Conference
Session, JASIS Conference, 3-4 September 2015, Makuhari
Messe International Conference Hall, Chiba, Japan (poster).
[9]
Ryohei Hosomi,
Yuri Tabuchi, Kouichi
Tsuji, Total Reflection X-ray Fluorescence Analysis of Metal Particles in Used
Machine Oil, RSC Tokyo International Conference 2015, International Conference
Session, JASIS Conference, 3-4 September 2015, Makuhari
Messe International Conference Hall, Chiba, Japan (poster).
[10]
J.
Chin and K. Tsuji, Confocal micro XRF analysis for monitoring corrosion of
steel sheet in the solution, Chinese conference of X-ray Spectrometry, 17-18
September 2015, Weihai, China (oral).
¹ñÆâ¤Ç¤Î¾·ÂÔ¡¦°ÍÍê¹Ö±é
Invited talks at domestic
conferences
[1] ÄÔ
¹¬°ì¡Öʬ¸÷ʬÀϲ½³Ø¤Î´ðÁäȤ½¤Î±þÍÑ¡×2015ǯ7·î9Æü¡¢ËÌÀÝ»°ÅĹâÅù³Ø¹»¡Ö°ìÆüÂç³ØÂθ³¹ÖºÂ¡×¡Êʼ¸Ë¸©Î©ËÌÀÝ»°ÅĹâÅù³Ø¹»¡¢Ê¼¸Ë¡Ë
[2] ÄÔ ¹¬°ì¡Ö£ØÀþÈ¿¼ÍΨ¬ÄêË¡¡ÊXRR¡Ë¤ª¤è¤ÓÁ´È¿¼Í·Ö¸÷XÀþʬ¸÷Ë¡¡ÊTXRF¡Ë¤Î¹ñºÝɸ½à²½¡× 2015ǯ9·î2Æü¡¢JASIS¥³¥ó¥Õ¥¡¥ì¥ó¥¹ JSCAɽÌ̲½³ØʬÀϵ»½Ñ¹ñºÝɸ½à²½¥»¥ß¥Ê¡¼¡ÖɽÌÌʬÀÏ¡¦¥Þ¥¤¥¯¥í¥Ó¡¼¥à¥¢¥Ê¥ê¥·¥¹¤Ë¤ª¤±¤ë¹ñºÝɸ½à²½¤ÎÆ°¸þ¡×¡ÊËëÄ¥¥á¥Ã¥»¹ñºÝ²ñµÄ¾ì103²ñµÄ¼¼¡¢ÀéÍÕ¡Ë
¹ñÆâ¤Ç¤Î³Ø²ñȯɽ¤Ê¤É
Presentations at conferences in
Japan
[1]
ÅÄÞ¼ ͳ轡¢ÄÔ
¹¬°ì¡ÖÁ´È¿¼Í·Ö¸÷XÀþʬÀϤˤª¤±¤ë»îÎÁºîÀ½°ÌÃ֤ȸ¡½Ð´¶Å٤ΰ͸À¤Ë´Ø¤¹¤ë¸¦µæ¡×2015ǯ5·î23-24Æü¡¢Âè75²óʬÀϲ½³ØƤÏÀ²ñ¡Ê»³ÍüÂç³Ø¹ÃÉÜ¥¥ã¥ó¥Ñ¥¹¡¢»³Íü¡Ë¡Ê¸ýƬ¡Ë
[2]
ÄÄ ¼«µÁ¡¢½©²¬
¹¬»Ê¡¢¹Ó°æ Àµ¹À¡¢ÅÚ°æ ¶µ»Ë¡¢ÄÔ
¹¬°ì¡Ö¶¦¾ÇÅÀ·¿»°¼¡¸µ·Ö¸÷XÀþʬÀÏË¡¤Ë¤è¤ë¿åÍϱÕÃæÅÉËì¹ÝÈĤÎÉå¿©µóÆ°¤½¤Î¾ì´Ñ»¡¡×2015ǯ5·î23-24Æü¡¢Âè75²óʬÀϲ½³ØƤÏÀ²ñ¡Ê»³ÍüÂç³Ø¹ÃÉÜ¥¥ã¥ó¥Ñ¥¹¡¢»³Íü¡Ë¡Ê¸ýƬ¡Ë
[3]
ÄÄ ¼«µÁ¡¢È¬ÌÚ
ÎÉÂÀ¡¢½©²¬ ¹¬»Ê¡¢¹Ó°æ Àµ¹À¡¢ÅÚ°æ
¶µ»Ë¡¢ÄÔ ¹¬°ì¡Ö¹ÝÈÄÅÉËì²¼Éå¿©»îÎÁ¤Î¶¦¾ÇÅÀ·¿»°¼¡¸µ·Ö¸÷£ØÀþ¸µÁÇ¥¤¥á¡¼¥¸¥ó¥°¡×2015ǯ5·î23-24Æü¡¢Âè75²óʬÀϲ½³ØƤÏÀ²ñ¡Ê»³ÍüÂç³Ø¹ÃÉÜ¥¥ã¥ó¥Ñ¥¹¡¢»³Íü¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[4]
ÅÄÞ¼ ͳ轡¢ÄÔ
¹¬°ì¡Ö¿å»îÎÁ¤ÎÁ´È¿¼Í·Ö¸÷XÀþʬÀϤ˴ؤ¹¤ë¹ñºÝ¥é¥¦¥ó¥É¥í¥Ó¥ó¥Æ¥¹¥È¡×2015ǯ5·î23-24Æü¡¢Âè75²óʬÀϲ½³ØƤÏÀ²ñ¡Ê»³ÍüÂç³Ø¹ÃÉÜ¥¥ã¥ó¥Ñ¥¹¡¢»³Íü¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[5] ËÌ¸Í ÍºÂç¡¢ÄÔ ¹¬°ì¡Ö¶ÌÃîÅÉ»îÎÁ¤Ê¤É¹©·ÝÉʤζ¦¾ÇÅÀ·¿·Ö¸÷£ØÀþʬÀÏ¡×2015ǯ9·î9-11Æü¡¢ÆüËÜʬÀϲ½³Ø²ñÂè64ǯ²ñ¡Ê¶å½£Âç³Ø°ËÅÔ¥¥ã¥ó¥Ñ¥¹¡¢Ê¡²¬¡Ë¡Ê¸ýƬ¡Ë
[6] ÂíËÜ Íºµ£¡¢À¾ËÜ Íµ¾¼¡¢²ÃÆ£ ½¨°ì¡¢¾±»Ê ¹§¡¢Paolo Romano¡¢ÄÔ ¹¬°ì¡Ö¤¤¤¯¤Ä¤«¤Î·Ö¸÷£ØÀþ¸µÁÇ¥¤¥á¡¼¥¸¥ó¥°Ë¡¤ÎÈæ³Ó¡×2015ǯ10·î29-30Æü¡¢Âè51²óXÀþʬÀÏƤÏÀ²ñ¡Êɱϩ¡¦À¾¤Ï¤ê¤ÞÃϾ컺¶È¥»¥ó¥¿¡¼¡¢Ê¼¸Ë¡Ë¡Ê¸ýƬ¡Ë
[7] ¾¾Ìî ¹ä»Î¡¢²ñÅÄ æÆÂÀ¡¢ËÌ¸Í ÍºÂ硢ĹëÀî ·ò¡¢ÄÔ ¹¬°ì¡ÖÁöºº·¿·Ö¸÷£ØÀþ¸µÁÇ¥¤¥á¡¼¥¸¥ó¥°¤Ë¤ª¤±¤ë¼çÀ®Ê¬Ê¬ÀÏË¡¤ÎŬÍѲÄǽÀ¡×2015ǯ10·î29-30Æü¡¢Âè51²óXÀþʬÀÏƤÏÀ²ñ¡Êɱϩ¡¦À¾¤Ï¤ê¤ÞÃϾ컺¶È¥»¥ó¥¿¡¼¡¢Ê¼¸Ë¡Ë¡Ê¸ýƬ¡Ë
[8] ºÙ¸« οʿ¡¢ÅÄÞ¼ ͳ轡¢ÄÔ ¹¬°ì¡ÖÇÑÌýÃæ¶â°¸µÁǤÎÁ´È¿¼Í·Ö¸÷£ØÀþʬÀÏ¡×2015ǯ10·î29-30Æü¡¢Âè51²óXÀþʬÀÏƤÏÀ²ñ¡Êɱϩ¡¦À¾¤Ï¤ê¤ÞÃϾ컺¶È¥»¥ó¥¿¡¼¡¢Ê¼¸Ë¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[9] Ë©ÅÄ Ä¾Ìé¡¢¾¾Ìî ¹ä»Î¡¢ËÌ¸Í ÍºÂç¡¢ÄÔ ¹¬°ì¡ÖÌÓȱ¤ª¤è¤Ó¹©·ÝÉʤζ¦¾ÇÅÀ£³¼¡¸µ·Ö¸÷£ØÀþʬÀÏ¡×2015ǯ10·î29-30Æü¡¢Âè51²óXÀþʬÀÏƤÏÀ²ñ¡Êɱϩ¡¦À¾¤Ï¤ê¤ÞÃϾ컺¶È¥»¥ó¥¿¡¼¡¢Ê¼¸Ë¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[10] ²Ï¸¶ ľ¼ù¡¢¾¾Ìî ¹ä»Î¡¢ÄÔ ¹¬°ì¡Ö¶¦¾ÇÅÀ·¿Èù¾®Éô·Ö¸÷£ØÀþʬÀϤˤª¤±¤ë£ØÀþÍýÏÀ¶¯ÅÙ·×»»¡×2015ǯ10·î29-30Æü¡¢Âè51²óXÀþʬÀÏƤÏÀ²ñ¡Êɱϩ¡¦À¾¤Ï¤ê¤ÞÃϾ컺¶È¥»¥ó¥¿¡¼¡¢Ê¼¸Ë¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[11] ÄÔ ¹¬°ì¡Ö·Ö¸÷XÀþ¥¤¥á¡¼¥¸¥ó¥°¤Ë´Ø¤¹¤ë¸¦µæ¡×2015ǯ11·î14Æü¡¢Âè4²ó¹½Â¤µ¡Ç½¤È·×¬ʬÀÏ¡Ö¤µ¤¤¬¤±¤½¤Î¸å¡×¸¦µæ²ñ¡ÊÉÙ»³¸©Ì±²ñ´Û¡¢ÉÙ»³¡Ë¡Ê¸ýƬ¡Ë
[12] ÄÄ ¼«µÁ¡¢ÄÔ ¹¬°ì¡Ö¿åÍϱÕÃæ¶â°Éå¿©¤Î3DXRF Ë¡¤Ë¤è¤ë¤½¤Î¾ì´Ñ»¡¡×2016ǯ1·î15Æü¡¡´ØÀ¾Ê¬Àϸ¦µæ²ñÊ¿À®28ǯÅÙÂèÆó²óÎã²ñ¡ÊÂçºåÉÜΩÂç³ØÊü¼ÍÀþ¸¦µæ¥»¥ó¥¿¡¼¡¢Âçºå¡Ë¡Ê¸ýƬ¡Ë¡¡
[13] ²ñÅÄ æÆÂÀ¡¢ÄÔ ¹¬°ì¡ÖÈù¾®Éô·Ö¸÷XÀþʬÀÏË¡¤Ë¤ª¤±¤ë¼çÀ®Ê¬Ê¬ÀϤÎŬÍÑ¡×2016ǯ3·î23-25Æü¡¢ÆüËÜÅ´¹Ý¶¨²ñÂè171²ó½Õµ¨¹Ö±éÂç²ñ¡ÊÅìµþÍý²ÊÂç³Ø³ë¾þ¥¥ã¥ó¥Ñ¥¹¡¢Åìµþ¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[14] ºÙ¸« οʿ¡¢ÄÔ ¹¬°ì¡ÖÇÑÌýÃæ¶â°¸µÁǤÎÁ´È¿¼Í·Ö¸÷XÀþʬÀÏ¡×2016ǯ3·î23-25Æü¡¢ÆüËÜÅ´¹Ý¶¨²ñÂè171²ó½Õµ¨¹Ö±éÂç²ñ¡ÊÅìµþÍý²ÊÂç³Ø³ë¾þ¥¥ã¥ó¥Ñ¥¹¡¢Åìµþ¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[15] Ë©ÅÄ Ä¾Ìé¡¢ËÌ¸Í ÍºÂç¡¢ÄÔ ¹¬°ì¡ÖÁع½Â¤¤òͤ¹¤ëºàÎÁ¤Î¶¦¾ÇÅÀ3¼¡¸µ·Ö¸÷ XÀþʬÀÏ¡×2016ǯ3·î23-25Æü¡¢ÆüËÜÅ´¹Ý¶¨²ñÂè171²ó½Õµ¨¹Ö±éÂç²ñ¡ÊÅìµþÍý²ÊÂç³Ø³ë¾þ¥¥ã¥ó¥Ñ¥¹¡¢Åìµþ¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
2014ǯÅ٤γèÆ°
¡Êfrom April 2014 to March 2015¡Ë
¹ñºÝ²ñµÄ¤Ç¤Î¾·ÂÔ¡¦°ÍÍê¹Ö±é
Invited
talks at international conferences
[1]
K.
Tsuji, Workshop-organizer and instructor on ¡ÈXRF imaging¡É, 63rd
Annual Conference on Applications of X-ray Analysis Denver X-ray Conference, 28
July - 1 August 2014, Big Sky, Montana, USA.
[2]
K.
Tsuji, Workshop-instructor on ¡ÈTrace Analysis¡É , 63rd Annual Conference
on Applications of X-ray Analysis Denver X-ray Conference, 28 July - 1 August
2014, Big Sky, Montana, USA.
[3]
K.
Tsuji, Scanning and Projection type XRF Imaging, SARX2014 Latin American
Seminar of Analysis by X-Ray Techniques, 3-7 November 2014, Carlos Paz,
Cordoba, Argentina.
¹ñºÝ²ñµÄ¤Ç¤Î°ìÈֱ̹é
Presentations at international
conferences
[1]
Kouichi Tsuji, Jigi Chin, Shintaro Hirano, Observation
of chemical reactions in solution by confocal micro XRF technique, European
Conference on X-Ray Spectrometry (EXRS2014), 15-20 June 2014, Bologna, Italy
(oral).
[2]
Ryota
Yagi, Shintaro Hirano, Mareike
Falk, Jurgen Janek, Ursula Fittschen,
Kouichi Tsuji, Confocal micro-XRF
analysis of electrode materials of Li-ion battery, European Conference on X-Ray
Spectrometry (EXRS2014), 15-20 June 2014, Bologna, Italy (poster).
[3]
Ryota Yagi, Kouichi Tsuji, Low-Z
element analysis by confocal micro-XRF instrument, European Conference
on X-Ray Spectrometry (EXRS2014), 15-20 June 2014, Bologna, Italy (poster).
[4]
Yuri Tabuchi,
Masaki Yamanashi, Yuichiro Shimizu, Takashi Yamada,Kouichi Tsuji, Total reflection X-ray fluorescence analysis of halogen in liquid
samples, European
Conference on X-Ray Spectrometry (EXRS2014), 15-20 June 2014, Bologna, Italy
(poster).
[5]
Masaki Yamanashi, Seiji Emoto, Shuichi Kato, TakashiYamada,
Takashi Shoji, Kouichi Tsuji, Wavelength-dispersive
X-ray fluorescence imaging spectrometer with grazing incidence configuration, European
Conference on X-Ray Spectrometry (EXRS2014), 15-20 June 2014, Bologna, Italy
(poster).
[6]
Rogerta Dalipi,
Laura Borgese, Andrea Casaroli,
Marco Boniardi, Ursula Fittschen,
Kouichi Tsuji, and Laura E. Depero,
A TXRF study of metal release from AISI 304 in simulated food contact, European
Conference on X-Ray Spectrometry (EXRS2014), 15-20 June 2014, Bologna, Italy.
[7]
Padilla-Alvarez
R., Karydas A.G., Migliori
A., Diawara Y., Kouichi Tsuji, Borgese
L., Depero L. E., Proficiency test in TXRF water
analysis, European Conference on X-Ray Spectrometry (EXRS2014), 15-20 June
2014, Bologna, Italy.
[8]
R.Dalipi, L. Borgese,
A. Zacco, K. Tsuji, E. Bontempi,
and L.E. Depero, Trace elements determination in
Italian wines using total reflection X-ray fluorescence, 38th International
Symposium on Environmental Analytical Chemistry (ISEAC38), 17-20 June 2014,
Lausanne, Switzerland.
[9]
K.
Tsuji, M. Yamanashi, S. Kato, T. Yamada, and T. Shoji, Wavelength dispersive
XRF imaging spectrometer using polycapillary angular
filter and 2D X-ray detector, 63rd Annual Conference on Applications
of X-ray Analysis Denver X-ray Conference, 28 July - 1 August 2014, Big Sky,
Montana, USA (oral).
[10]
K.
Tsuji, Y. Tabuchi, Y. Shimizu, and T. Yamada, TXRF
analysis of halogen in Japanese soy sauce and other liquid samples, 63rd
Annual Conference on Applications of X-ray Analysis Denver X-ray Conference, 28
July - 1 August 2014, Big Sky, Montana, USA (oral).
[11]
K.
Tsuji, Y. Takimoto, and M. Yamanashi, WD-XRS imaging
with Polycapillary optics, The 6th International
Conference Channeling 2014 - Charged & Neutral Particles Channeling
Phenomena, 5-10 October 2014, Capri (NA), Italy (oral).
[12]
A.
Liedl, D. Hampai, K. Tsuji,
C. Polese, and S. Dabagov,
On X-Ray Channeling in a Vibrating Capillary, The 6th International Conference
Channeling 2014 - Charged & Neutral Particles Channeling Phenomena, 5-10
October 2014, Capri (NA), Italy (poster).
¹ñÆâ¤Ç¤Î¾·ÂÔ¡¦°ÍÍê¹Ö±é
Invited talks at domestic
conferences
[1] ÄÔ ¹¬°ì¡Öµ¡´ïʬÀϤˤª¤±¤ëÁõÃÖ¹»Àµ¤Èɸ½àʪ¼Á¡×2014ǯ5·î16Æü¡¢2014ǯÅ١֤֤󤻤¹Ö½¬²ñ¡×¡Ê´ðÁÃÊÔ¤½¤Î£±¡Ë¡ÖʬÀϤˤª¤±¤ëÅý·×¼êË¡¡¾Åý·×¤Î´ðÁäÈÅý·×¼êË¡¤Î¼ÂºÝ¤Ë¤Ä¤¤¤Æ¡Ý¡×¡ÊÂçºå»ÔΩÂç³Øʸ²½¸òή¥»¥ó¥¿¡¼¡¢Âçºå¡Ë
[2] ÄÔ ¹¬°ì¡ÖÁ´È¿¼Í·Ö¸÷XÀþʬÀÏ¡×2014ǯ7·î7-9Æü¡¢Âè19²óXÀþʬÀϹֽ¬²ñ¡¡·Ö¸÷XÀþʬÀÏ¤Î¼ÂºÝ (Âè8²ó)¡¾µ¡Ç½ÀºàÎÁ¡¢´Ä¶»îÎÁ¡¢¿©ÉÊÃæ¤Îͳ²¸µÁǤδʰ׿×®ʬÀÏË¡¡ÊÅìµþÍý²ÊÂç³ØµÇ°¹ÖƲ¡¢Åìµþ¡Ë
[3] ÄÔ ¹¬°ì¡Öʬ¸÷ʬÀϲ½³Ø¤Î´ðÁäȤ½¤Î±þÍÑ¡×2014ǯ7·î10Æü¡¢ËÌÀÝ»°ÅĹâÅù³Ø¹»¡Ö2ǯÀ¸°ìÆüÂç³ØÂθ³¹ÖºÂ¡×¡Êʼ¸Ë¸©Î©ËÌÀÝ»°ÅĹâÅù³Ø¹»¡¢Ê¼¸Ë¡Ë
[4] ÄÔ ¹¬°ì¡Öʬ¸÷ʬÀϤδðÁᾲĻë»ç³°¸÷¡ÁXÀþʬ¸÷¤Þ¤Ç¡Ý¡×2014ǯ7·î25Æü¡¢2014ǯÅ١֤֤󤻤¹Ö½¬²ñ¡×¡Ê¼ÂÁ©ÊÔ¡Ë¡ÖÂè61²óµ¡´ï¤Ë¤è¤ëʬÀϲ½³Ø¹Ö½¬²ñ¡×¡Ê³ô¼°²ñ¼ÒËÙ¾ìÀ½ºî½êʬÀÏ¥»¥ó¥¿¡¼¡¢µþÅÔ¡Ë
[5] ÄÔ ¹¬°ì¡Ö¶¦¾ÇÅÀ·¿£³¼¡¸µ·Ö¸÷XÀþʬÀÏË¡¤Î³«È¯±þÍÑÎ㤪¤è¤Ó´ØÏ¢¼êË¡¤ÎÆ°¸þ¡×2014ǯ9·î1-3Æü¡¢Âè17²óXAFSƤÏÀ²ñ¡ÊÆÁÅçÂç³ØÁí¹ç²Ê³ØÉô¡¢ÆÁÅç¡Ë
¹ñÆâ¤Ç¤Î³Ø²ñȯɽ¤Ê¤É
Presentations at conferences in
Japan
[1] ÄÔ ¹¬°ì¡¢È¬ÌÚ ÎÉÂÀ¡¢ÄÄ ¼«µÁ¡¢½©²¬ ¹¬»Ê¡¢ÅÚ°æ ¶µ»Ë¡¢¹Ó°æ Àµ¹À¡Ö¶¦¾ÇÅÀÈù¾®Éô·Ö¸÷£ØÀþʬÀÏË¡¤Ë¤è¤ëÅ´¹ÝºàÎÁÃæ¤Î·Ú¸µÁǤÎʬÀÏ¡×2014ǯ5·î21Æü¡¢À½¹ÝÂ裱£¹°Ñ°÷²ñ À½¹Ý·×¬²½³Ø¸¦µæ²ñÂ裶£´²ó²ñµÄ¡ÊÂçºåÂç³Ø¿áÅÄ¥¥ã¥ó¥Ñ¥¹¶ä°É²ñ´Û¡¢Âçºå¡Ë¡Ê¸ýƬ¡Ë
[2] ȬÌÚ ÎÉÂÀ¡¢Ê¿Ìî ¿·ÂÀϺ¡¢ÄÔ ¹¬°ì¡¢Ursula Fittschen¡Ö¶¦¾ÇÅÀ·¿£³¼¡¸µ·Ö¸÷XÀþʬÀÏÁõÃ֤ˤè¤ë¥ê¥Á¥¦¥à¥¤¥ª¥óÅÅÃÓÅŶ˺àÎÁ¤ÎʬÀÏ¡×2014ǯ5·î24-25Æü¡¢Âè74²óʬÀϲ½³ØƤÏÀ²ñ¡ÊÆüËÜÂç³Ø¹©³ØÉô¡¢Ê¡Åç¡Ë¡Ê¸ýƬ¡Ë
[3] »³Íü âÃÀ¸¡¢ÄÔ ¹¬°ì¡Ö¼ÐÆþ¼ÍÇÛÃ֤ǤÎÇÈĹʬ»¶·¿·Ö¸÷XÀþ¥¤¥á¡¼¥¸¥ó¥°ÁõÃ֤γ«È¯¡×2014ǯ5·î24-25Æü¡¢Âè74²óʬÀϲ½³ØƤÏÀ²ñ¡ÊÆüËÜÂç³Ø¹©³ØÉô¡¢Ê¡Åç¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[4] ÅÄÞ¼ ͳ轡¢ÄÔ ¹¬°ì¡Ö°ûÎÁ¿åÃæ¤Î¥Ï¥í¥²¥ó¤ÎÁ´È¿¼Í·Ö¸÷£ØÀþʬÀÏ¡×2014ǯ5·î24-25Æü¡¢Âè74²óʬÀϲ½³ØƤÏÀ²ñ¡ÊÆüËÜÂç³Ø¹©³ØÉô¡¢Ê¡Åç¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[5] ÄÔ ¹¬°ì¡Ö¥Ý¥ê¥¥ã¥Ô¥é¥ê¡¼£ØÀþ¸÷³ØÁǻҤȷָ÷£ØÀþʬÀϤؤαþÍÑ¡×2014ǯ7·î7-9Æü¡¢Âè19²óXÀþʬÀϹֽ¬²ñ¡¡·Ö¸÷XÀþʬÀÏ¤Î¼ÂºÝ (Âè8²ó)¡¾µ¡Ç½ÀºàÎÁ¡¢´Ä¶»îÎÁ¡¢¿©ÉÊÃæ¤Îͳ²¸µÁǤδʰ׿×®ʬÀÏË¡¡ÊÅìµþÍý²ÊÂç³ØµÇ°¹ÖƲ¡¢Åìµþ¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[6] ÄÔ ¹¬°ì¡Ö¶¦¾ÇÅÀ·¿£³¼¡¸µ·Ö¸÷£ØÀþʬÀÏË¡¡×2014ǯ7·î7-9Æü¡¢Âè19²óXÀþʬÀϹֽ¬²ñ¡¡·Ö¸÷XÀþʬÀÏ¤Î¼ÂºÝ (Âè8²ó)¡¾µ¡Ç½ÀºàÎÁ¡¢´Ä¶»îÎÁ¡¢¿©ÉÊÃæ¤Îͳ²¸µÁǤδʰ׿×®ʬÀÏË¡¡ÊÅìµþÍý²ÊÂç³ØµÇ°¹ÖƲ¡¢Åìµþ¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[7] ËÌ¸Í ÍºÂ硢ȬÌÚ ÎÉÂÀ¡¢ÄÄ ¼«µÁ¡¢ÄÔ ¹¬°ì¡Ö¶¦¾ÇÅÀ·¿·Ö¸÷XÀþʬÀÏË¡¤Ë¤ª¤±¤ë±öÁǤθ¡½Ð¸Â³¦¡×2014ǯ9·î17-19Æü¡¢ÆüËÜʬÀϲ½³Ø²ñÂè63ǯ²ñ¡Ê¹ÅçÂç³ØÅì¹Å祥ã¥ó¥Ñ¥¹¡¢¹Åç)¡Ê¥Ý¥¹¥¿¡¼¡Ë
[8] »³Íü âÃÀ¸¡¢ÂíËÜ Íºµ£¡¢²ÃÆ£ ½¨°ì¡¢»³ÅÄ Î´¡¢¾±»Ê ¹§¡¢ÄÔ ¹¬°ì¡Ö¹â´¶ÅÙ2¼¡¸µÈ¾Æ³Âθ¡½Ð´ï¤òÍѤ¤¤¿ÇÈĹʬ»¶·¿XRF¥¤¥á¡¼¥¸¥ó¥°ÁõÃÖ¤ÎÀǽɾ²Á¡×2014ǯ10·î30-31Æü¡¢Âè50²óXÀþʬÀÏƤÏÀ²ñ¡ÊÅìËÌÂç³ØÊÒÊ¿¤µ¤¯¤é¥Û¡¼¥ë¡¢µÜ¾ë¡Ë¡Ê¸ýƬ¡Ë
[9] ÅÄÞ¼ ͳ轡¢À¶¿å ͺ°ìϺ¡¢»³ÅÄ Î´¡¢ÄÔ ¹¬°ì¡Ö°ûÎÁ¿åÃæ¥Ï¥í¥²¥ó¤ÎÁ´È¿¼Í·Ö¸÷XÀþʬÀϤˤè¤ëÄêÎÌË¡¤Î¸¡Æ¤¡×2014ǯ10·î30-31Æü¡¢Âè50²óXÀþʬÀÏƤÏÀ²ñ¡ÊÅìËÌÂç³ØÊÒÊ¿¤µ¤¯¤é¥Û¡¼¥ë¡¢µÜ¾ë¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[10] ËÌ¸Í ÍºÂç¡¢½©²¬ ¹¬»Ê¡¢¹Ó°æ Àµ¹À¡¢ÅÚ°æ ¶µ»Ë¡¢ÄÔ ¹¬°ì¡Ö¶¦¾ÇÅÀ·¿·Ö¸÷XÀþʬÀÏË¡¤Ë¤è¤ëÃÖ´¹¤á¤Ã¤¤Î¥â¥Ë¥¿¥ê¥ó¥°¡×2014ǯ10·î30-31Æü¡¢Âè50²óXÀþʬÀÏƤÏÀ²ñ¡ÊÅìËÌÂç³ØÊÒÊ¿¤µ¤¯¤é¥Û¡¼¥ë¡¢µÜ¾ë¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[11] ȬÌÚ ÎÉÂÀ¡¢½©²¬ ¹¬»Ê¡¢¹Ó°æ
Àµ¹À¡¢ÅÚ°æ ¶µ»Ë¡¢ÄÔ ¹¬°ì¡Ö¶¦¾ÇÅÀ·¿·Ö¸÷XÀþʬÀÏË¡¤Ë¤è¤ëÅ´¹ÝºàÎÁÉå¿©µóÆ°¤Î²òÀÏ¡×2014ǯ10·î30-31Æü¡¢Âè50²óXÀþʬÀÏƤÏÀ²ñ¡ÊÅìËÌÂç³ØÊÒÊ¿¤µ¤¯¤é¥Û¡¼¥ë¡¢µÜ¾ë¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[12] »³Íü âÃÀ¸¡¢ÄÔ ¹¬°ì¡Ö¶â°ɸ½àʪ¼Á¤ÎÈù¾®Éô·Ö¸÷XÀþʬÀÏ¡×2015ǯ1·î23Æü¡¢´ØÀ¾Ê¬Àϸ¦µæ²ñÊ¿À®26ǯÅÙÂèÆó²óÎã²ñ¡ÊÃÏÊýÆÈΩ¹ÔÀ¯Ë¡¿ÍÂçºå»ÔΩ¹©¶È¸¦µæ½ê¡¢Âçºå¡Ë(¸ýƬ)
[13] ¾¾Ìî ¹ä»Î¡¢ÄÔ ¹¬°ì
¡Ö¶¦¾ÇÅÀ»°¼¡¸µ·Ö¸÷XÀþʬÀÏË¡¤Ë¤ª¤±¤ë¥Þ¥È¥ê¥¯¥¹¸ú²Ì¤Î¸¡¾Ú¡× 2015ǯ3·î15-18Æü¡¢ÆüËÜÅ´¹Ý¶¨²ñÂè169²ó½Õµ¨¹Ö±éÂç²ñ¡ÊÅìµþÂç³Ø¶ð¾ì¥¥ã¥ó¥Ñ¥¹¡¢Åìµþ¡Ë ¡Ê¥Ý¥¹¥¿¡¼¡Ë
[14] ÂíËÜ Íºµ£¡¢ÄÔ ¹¬°ì¡Ö¾®·¿ÇÈĹʬ»¶·¿·Ö¸÷XÀþ¥¤¥á¡¼¥¸¥ó¥°ÁõÃ֤γ«È¯¡×2015ǯ3·î18-20Æü¡¢ÆüËÜÅ´¹Ý¶¨²ñÂè169²ó½Õµ¨¹Ö±éÂç²ñ ¡ÊÅìµþÂç³Ø¶ð¾ì¥¥ã¥ó¥Ñ¥¹¡¢Åìµþ¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[15] ÄÔ ¹¬°ì¡¢µ×ÊÝÀî ÍøÌÀ¡¢È¬ÌÚ
ÎÉÂÀ¡¢À¶¿å ·ò°ì¡Ö¥°¥í¡¼ÊüÅÅ¥¹¥Ñ¥Ã¥¿¥ê¥ó¥°¤òÊ»ÍѤ·¤¿¶â°Ãæ²ðºßʪ¤ÎSEM-EDS²òÀÏ¡×2015ǯ3·î18-20Æü¡¢ÆüËÜÅ´¹Ý¶¨²ñÂè169²ó½Õµ¨¹Ö±éÂç²ñ¡ÊÅìµþÂç³Ø¶ð¾ì¥¥ã¥ó¥Ñ¥¹¡¢Åìµþ¡Ë¡Ê¸ýƬ)
[16] ȬÌÚ ÎÉÂÀ¡¢ÄÔ ¹¬°ì¡¢½©²¬
¹¬»Ê¡¢ÅÚ°æ ¶µ»Ë¡¢¹Ó°æ Àµ¹À¡Ö¶¦¾ÇÅÀ·¿·Ö¸÷XÀþʬÀÏË¡¤Ë¤è¤ë¹ÝÈÄÅÉËì²¼Éå¿©»îÎÁ¤Î¿¼¤µÊý¸þ¸µÁÇ¥¤¥á¡¼¥¸¥ó¥°¡×2015ǯ3·î18-20Æü¡¢ÆüËÜÅ´¹Ý¶¨²ñÂè169²ó½Õµ¨¹Ö±éÂç²ñ¡ÊÅìµþÂç³Ø¶ð¾ì¥¥ã¥ó¥Ñ¥¹¡¢Åìµþ¡Ë¡Ê¸ýƬ¡Ë
2013ǯÅ٤γèÆ°
¡Êfrom April 2013 to March 2014¡Ë
¹ñºÝ²ñµÄ¤Ç¤Î¾·ÂÔ¡¦°ÍÍê¹Ö±é
Invited
talks at international conferences
[1]
K.
Tsuji, Workshop-instructor on ¡ÈTrace Analysis¡É Instructor, 62nd
Annual Conference on Applications of X-ray Analysis Denver X-ray Conference,
5-9 August 2013, Westminster, Colorado, USA.
¹ñºÝ²ñµÄ¤Ç¤Î°ìÈֱ̹é
Presentations at international
conferences
[1]
T.
Ohmori, S. Emoto, S. Kato,
M. Doi, T. Shoji, and K. Tsuji, Fast Elemental Imaging by Wavelength Dispersive
X-ray Fluorescence Imaging Spectrometer, 62nd Annual Conference on Applications
of X-ray Analysis Denver X-ray Conference, 5-9 August 2013, Westminster,
Colorado, USA (poster).
[2]
K.
Akioka, T. Doi, M. Arai, T. Nakazawa, K. Tsuji, Under
Film Corrosion Process of Steel Sheets Observed by Confocal Micro XRF
Technique, 62nd Annual Conference on Applications of X-ray Analysis Denver
X-ray Conference, 5-9 August 2013, Westminster, Colorado, USA (poster).
[3]
S.
Smolek, T. Nakazawa, K. Nakano, K. Tsuji, C. Streli, P. Wobrauschek, Forensic
Investigations with Different Confocal Micro-XRF Spectrometers, 62nd Annual
Conference on Applications of X-ray Analysis Denver X-ray Conference, 5-9
August 2013, Westminster, Colorado, USA (poster).
[4]
Seiji
Emoto, Masaki Yamanashi, Takashi Shouji,
Shuichi Kato, Takashi Yamada, and Kouichi Tsuji,
Analytical characteristics of wavelength dispersive XRF imaging with polycapillary optics and 2D detector, 15th International
Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods
(TXRF2013), and the 49th Annual Conference on X-Ray Chemical Analysis,
September 23-27, 2013, Osaka City University, Osaka, Japan (poster).
[5]
Yuri
Tabuchi, Sho Kaku, and Kouichi Tsuji TXRF analysis of halogen in environmental and
biological samples, 15th International Conference on Total Reflection X-Ray
Fluorescence Analysis and Related Methods (TXRF2013), and the 49th Annual
Conference on X-Ray Chemical Analysis, September 23-27, 2013, Osaka City
University, Osaka, Japan (poster).
[6]
Ryota Yagi, Jigi Chin, Koji Akioka, Masahiro
Arai, Takashi Doi, Kouichi Tsuji, 3DXRF analysis for
observing corrosion process of painted coating layer on steel samples, 15th International
Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods
(TXRF2013), and the 49th Annual Conference on X-Ray Chemical Analysis,
September 23-27, 2013, Osaka City University, Osaka, Japan (poster).
[7]
Shintaro Hirano, Yuta Kitado, Koji Akioka, Takashi Doi,
Masahiro Arai, Kouichi and Tsuji, In situ 3DXRF
monitoring of metal-corrosion and deposition processes near liquid/solid
interface, 15th International Conference on Total Reflection X-Ray Fluorescence
Analysis and Related Methods (TXRF2013), and the 49th Annual Conference on
X-Ray Chemical Analysis, September 23-27, 2013, Osaka City University, Osaka,
Japan (poster).
[8]
Takafumi Ashida,
Tsuyoshi Sawamura, and Kouichi
Tsuji,? Development of a compact GE-XRF spectrometer for fast trace elemental
analysis, 15th International Conference on Total Reflection X-Ray Fluorescence
Analysis and Related Methods (TXRF2013), and the 49th Annual Conference on
X-Ray Chemical Analysis, September 23-27, 2013, Osaka City University, Osaka,
Japan (poster).
[9]
Shintaro Komatani,
Aoyama Tomoki, and Kouichi Tsuji,3DXRF analysis of
industrial device in comparison with SEM-EDS and conventional micro-XRF, 15th
International Conference on Total Reflection X-Ray Fluorescence Analysis and
Related Methods (TXRF2013), and the 49th Annual Conference on X-Ray Chemical
Analysis, September 23-27, 2013, Osaka City University, Osaka, Japan (poster).
¹ñÆâ¤Ç¤Î¾·ÂÔ¡¦°ÍÍê¹Ö±é
Invited talks at domestic
conferences
[1]
ÄÔ ¹¬°ì¡Ö·Ö¸÷XÀþʬÀÏË¡¤Î¿·¤¿¤ÊŸ³«¡§¡ÝÈùÎÌʬÀϤȸµÁÇ¥¤¥á¡¼¥¸¥ó¥°¡Ý¡×2013ǯ7·î23Æü¡¢Âè15²ó¥Æ¥¯¥Î¥á¥¤¥È¥³¡¼¥×¸ø³«¹Ö±é²ñ¡ÊÆ»ÆÜË٥ۥƥ롢Âçºå¡Ë
[2]
ÄÔ ¹¬°ì¡Ö£³¼¡¸µ·Ö¸÷XÀþʬÀÏË¡¤Î´ðÁäȹâʬ»ÒºàÎÁʬÀϤؤαþÍÑ¡×2013ǯ9·î19-20Æü¡¢ÆüËÜʬÀϲ½³Ø²ñ¡¡Âè18²ó¹âʬ»ÒʬÀÏƤÏÀ²ñ¡ÊÌÀ¼£Âç³Ø
½Ù²ÏÂ楥ã¥ó¥Ñ¥¹ ¥¢¥«¥Ç¥ß¡¼¥³¥â¥ó¡¢Åìµþ¡Ë
[3]
ÄÔ ¹¬°ì¡Öʬ¸÷ʬÀϲ½³Ø¤Î´ðÁäȤ½¤Î±þÍÑ¡×2013ǯ7·î11Æü¡¢ËÌÀÝ»°ÅĹâÅù³Ø¹»¡Ö°ìÆüÂç³ØÂθ³¹ÖºÂ¡×¡Êʼ¸Ë¸©Î©ËÌÀÝ»°ÅĹâÅù³Ø¹»¡¢Ê¼¸Ë¡Ë
[4]
ÄÔ ¹¬°ì¡ÖÁ´È¿¼Í·Ö¸÷XÀþʬ¸÷Ë¡¡ÊTXRF¡Ë¤Î¹ñºÝɸ½à²½¡×
2013ǯ9·î4Æü¡¢JASIS¥³¥ó¥Õ¥¡¥ì¥ó¥¹?
ɽÌ̲½³ØʬÀϵ»½Ñ¹ñºÝɸ½à²½¥»¥ß¥Ê¡¼¡ÖɽÌÌ¡¦Èù¾®ÎΰèʬÀϤˤª¤±¤ë¹ñºÝɸ½à²½¤Î¸½¾õ¡×¡ÊËëÄ¥¥á¥Ã¥»¹ñºÝ²ñµÄ¾ì3³¬301²ñµÄ¼¼¡¢ÀéÍÕ¡Ë
[5]
ÄÔ ¹¬°ì¡Ö£³¼¡¸µ·Ö¸÷£ØÀþʬÀÏÁõÃ֤γ«È¯¤È¤½¤Î±þÍѸ¦µæ¡×2014ǯ1·î27Æü¡¢ONSA
25¼þǯµÇ°¹Ö±é²ñ¡ÊÂçºåÂç³ØÃæÇ·Å祻¥ó¥¿¡¼¡¢Âçºå¡Ë
¹ñÆâ¤Ç¤Î³Ø²ñȯɽ¤Ê¤É
Presentations at conferences in
Japan
[1]
°²ÅÄ ¾°°ê¼Â¡¢²¬
Çî»Ë¡¢ÄÔ ¹¬°ì¡Ö¾®·¿¼Ð½Ð¼Í·Ö¸÷£ØÀþʬÀÏÁõÃ֤γ«È¯¤Ë¸þ¤±¤¿´ðÁø¡Æ¤¡×2013ǯ5·î18-19Æü¡¢Âè73²óʬÀϲ½³ØƤÏÀ²ñ¡ÊË̳¤Æ»Âç³ØÈ¡´Û¥¥ã¥ó¥Ñ¥¹¡¢Ë̳¤Æ»¡Ë¡Ê¸ýƬ¡Ë
[2]
ȬÌÚ ÎÉÂÀ¡¢Â¼¾å
ͪ¿Í¡¢ÄÔ ¹¬°ì¡¢ÊÆë µª»Ì¡ÖĶÎ׳¦¥¨¥¿¥Î¡¼¥ëÍÏÇÞ¤òÍѤ¤¤¿Æ¼¡¦¶ä¹ç¶â¥Ê¥Îγ»Ò¤Î¹çÀ®¤È¤½¤Î¥¥ã¥é¥¯¥¿¥ê¥¼¡¼¥·¥ç¥ó¡×2013ǯ5·î18-19Æü¡¢Âè73²óʬÀϲ½³ØƤÏÀ²ñ¡ÊË̳¤Æ»Âç³ØÈ¡´Û¥¥ã¥ó¥Ñ¥¹¡¢Ë̳¤Æ»¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[3]
Ê¿Ìî ¿·ÂÀϺ¡¢½©²¬
¹¬»Ê¡¢ÅÚ°æ ¶µ»Ë¡¢¹Ó°æ Àµ¹À¡¢ÄÔ
¹¬°ì¡Ö¶¦¾ÇÅÀ·¿»°¼¡¸µ·Ö¸÷XÀþʬÀÏË¡¤Ë¤è¤ë³¤¿åÃæÅ´¹ÝÉå¿©µóÆ°¤Î¤½¤Î¾ì´Ñ»¡¡×2013ǯ5·î18-19Æü¡¢Âè73²óʬÀϲ½³ØƤÏÀ²ñ¡ÊË̳¤Æ»Âç³ØÈ¡´Û¥¥ã¥ó¥Ñ¥¹¡¢Ë̳¤Æ»¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[4]
¹¾ËÜ ÀºÆó¡¢Â翹
¿ò»Ë¡¢²ÃÆ£ ½¨°ì¡¢Æ²°æ ¿¿¡¢¾±»Ê
¹§¡¢ÄÔ ¹¬°ì¡ÖÇÈĹʬ»¶·¿·Ö¸÷XÀþ¥¤¥á¡¼¥¸¥ó¥°¤Ë¤ª¤±¤ë¶õ´Öʬ²òǽ¤Îɾ²Á¡×2013ǯ5·î18-19Æü¡¢Âè73²óʬÀϲ½³ØƤÏÀ²ñ¡ÊË̳¤Æ»Âç³ØÈ¡´Û¥¥ã¥ó¥Ñ¥¹¡¢Ë̳¤Æ»¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[5]
¹¾ËÜ ÀºÆó¡¢²ÃÆ£
½¨°ì¡¢»³ÅÄ¡¡Î´¡¢¾±»Ê ¹§¡¢ÄÔ
¹¬°ì¡ÖÇÈĹʬ»¶·¿·Ö¸÷XÀþ¥¤¥á¡¼¥¸¥ó¥°¤Ë¤ª¤±¤ëÇÈĹʬ²òǽ¤Îɾ²Á¡×2013ǯ9·î10-12Æü¡¢ÆüËÜʬÀϲ½³Ø²ñÂè62ǯ²ñ¡Ê¶áµ¦Âç³ØÅìÂçºå¥¥ã¥ó¥Ñ¥¹¡¢Âçºå¡Ë¡Ê¸ýƬ¡Ë
[6]
ȬÌÚ ÎÉÂÀ¡¢Ãæß·
δ¡¢½©²¬ ¹¬»Ê¡¢ÅÚ°æ ¶µ»Ë¡¢¹Ó°æ
Àµ¹À¡¢ÄÔ ¹¬°ì¡Ö¶¦¾ÇÅÀ·¿»°¼¡¸µ·Ö¸÷XÀþʬÀÏË¡¤Ë¤è¤ë¹ÝÈÄÅÉËì²¼Éå¿©¤ÎµóÆ°´Ñ»¡¡×2013ǯ9·î10-12Æü¡¢ÆüËÜʬÀϲ½³Ø²ñÂè62ǯ²ñ¡Ê¶áµ¦Âç³ØÅìÂçºå¥¥ã¥ó¥Ñ¥¹¡¢Âçºå¡Ë¡Ê¸ýƬ¡Ë
[7]
ÄÔ ¹¬°ì¡¢È¬ÌÚ
ÎÉÂÀ¡¢Ãæß· δ¡¢½©²¬ ¹¬»Ê¡¢ÅÚ°æ
¶µ»Ë¡¢¹Ó°æ Àµ¹À¡¡¡Ö¿¿¶õ»ÅÍͤζ¦¾ÇÅÀ·¿3¼¡¸µ·Ö¸÷XÀþʬÀÏÁõÃ֤γ«È¯¤ÈÅÉËì¹ÝÈĤˤª¤±¤ëÉå¿©µóÆ°´Ñ»¡¡×2013ǯ9·î17-19Æü¡¢ÆüËÜÅ´¹Ý¶¨²ñÂè166²ó½©µ¨¹Ö±éÂç²ñ¡Ê¶âÂôÂç³Ø³Ñ´Ö¥¥ã¥ó¥Ñ¥¹¡¢ÀÐÀî¡Ë¡Ê¸ýƬ¡Ë
[8]
ȬÌÚ ÎÉÂÀ¡¢ÄÔ
¹¬°ì¡Ö£³¼¡¸µ·Ö¸÷£ØÀþʬÀÏÁõÃ֤γ«È¯¤ÈÅÅÃÓºàÎÁÅù¤Ø¤ÎŬÍÑ¡×2014ǯ1·î22Æü¡¢´ØÀ¾Ê¬Àϸ¦µæ²ñ Ê¿À®25ǯÅÙÂèÆó²óÎã²ñ¡ÊΩ̿´ÛÂç³Ø¡¦Ëɺҥ·¥¹¥Æ¥à¥ê¥µ¡¼¥Á¥»¥ó¥¿¡¼¡¢¼¢²ì¡Ë¡Ê¸ýƬ¡Ë
[9]
ÄÄ ¼«µÁ¡¢ÄÔ
¹¬°ì¡Ö¶¦¾ÇÅÀ»°¼¡¸µ·Ö¸÷£ØÀþʬÀϤˤè¤ëÅ´¹ÝºàÎÁ¤ÎÉå¿©µóÆ°¤½¤Î¾ì´Ñ»¡¡×2014ǯ3·î21-23Æü¡¢ÆüËÜÅ´¹Ý¶¨²ñÂè167²ó½Õµ¨¹Ö±éÂç²ñ¡ÊÅìµþ¹©¶ÈÂç³ØÂ粬»³¥¥ã¥ó¥Ñ¥¹¡¢Åìµþ¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
2012ǯÅ٤γèÆ°
¡Êfrom April 2012 to March 2013¡Ë
¹ñºÝ²ñµÄ¤Ç¤Î¾·ÂÔ¡¦°ÍÍê¹Ö±é
Invited talks at international
conferences
[1] K. Tsuji, A. Tabe, T. Nakazawa, T. Awane, X-Ray Micro Analysis of Environmental and Painting Samples, in the special session ¡ÈProf. Rene Van Grieken: 40 years of international environmental chemistry¡É at the 37th edition of the International Symposium on Environmental Analytical Chemistry (ISEAC-37), 22-25 May 2012, Antwerp, Belgium.
[2] K. Tsuji, T. Nakazawa, Development
of a Vacuum Confocal Micro-XRF Instrument and Its Applications, 61st
Annual Conference on Applications of X-ray Analysis
Denver X-ray Conference, 6-10 August 2012, Denver, Colorado, USA.
[3] K.
Tsuji, S. Kaku, T. Ohmori, T. Yoshioka, TXRF
Analysis of Environmental and Biological Samples, 61st Annual Conference on Applications of X-ray Analysis
Denver X-ray Conference, 6-10 August 2012, Denver, Colorado, USA.
[4] K. Tsuji, Workshop ¡ÈTrace/TXRF Analysis¡É Instructor, 61st Annual Conference on Applications of X-ray Analysis Denver X-ray Conference, 6-10 August 2012, Denver, Colorado, USA.
[5] K. Tsuji, T. Ohmori, T. Nakazawa, X-ray elemental imaging with scanning and projection modes in the
laboratory, "Channeling 2012" 5th International
Conference Charged and Neutral Particles Channeling Phenomena, 23-28 September
2012, Alghero, Italy.
[6]
K.
Tsuji, T. Nakazawa, K. Akioka, T. Doi, M. Arai,
Development of a vacuum confocal micro-XRF instrument and 3D-XRF analysis of
layered materials, International symposium on "Recent advance in
analytical techniques for steelmaking industry" (RATEC2012), 28-30
November 2012, National Museum of Emerging Science and Innovation (MIRAIKAN),
Tokyo, Japan.
¹ñºÝ²ñµÄ¤Ç¤Î°ìÈֱ̹é
Presentations at international
conferences
[1] S. Hirano, T. Yoshioka,
A. Tabe, T. Nakazawa, K. Tsuji, Application of
Confocal Micro-XRF to Solid-Liquid Interface Analysis and Ancient Chinese
Ceramics, 61st Annual Conference on Applications of X-ray Analysis
Denver X-ray Conference, 6-10 August 2012, Denver, Colorado, USA (poster).
[2] T.
Nakazawa, M. A. Malek, H.-W. Kang, C.-U. Ro, K. Tsuji, Characterization of Layerd Materials Related to Forensic Investigation by
Confocal Micro-XRF and ATR-FT-IR Imaging Techniques, 61st Annual Conference on Applications of X-ray Analysis Denver
X-ray Conference, 6-10 August 2012, Denver, Colorado, USA (poster).
[3] S.
Komatani, S. Hirano, T. Aoyama, Y. Yokota, H. Ueda,
K. Tsuji, Micro X-Ray Beam Produced with a Single Glass Capillary for XRF
Analysis, 61st Annual
Conference on Applications of X-ray Analysis Denver X-ray Conference, 6-10
August 2012, Denver, Colorado, USA (poster).
[4] K. Nakano, S. Emoto, T. Nakazawa, K. Otsuki, K.
Tsuji, Depth Elemental Imaging of Forensic Samples by Confocal Micro XRF
Method, 61st Annual Conference on Applications of X-ray Analysis Denver X-ray
Conference, 6-10 August 2012, Denver, Colorado, USA (poster).
[5] T. Nakazawa, A. Tabe, S. Smolek, C. Streli, P. Wobrauschek, K Tsuji, Evaluation
of analytical performance of confocal micro-XRF spectrometers, European
Conference on X-Ray Spectrometry (EXRS2012), 18-22 June 2012, Vienna, Austria
(oral).
[6] T. Nakazawa, M. A.
Malek, H. -W. Kang, K. Tsuji, C. -U. Ro, Characterization of Layered Materials
by Confocal Micro-XRF and ATR-FT-IR Imaging Techniques, European Conference on
X-Ray Spectrometry (EXRS2012), 18-22 June 2012, Vienna, Austria (poster).
[7] S. Hirano, S. Komatani, K. Tsuji, Micro X-ray beam produced with a single
glass capillary and a metal small ball for XRF analysis, European Conference on
X-Ray Spectrometry (EXRS2012), 18-22 June 2012, Vienna, Austria (poster).
[8] T. Ashida,
T. Ohmori, K. Tsuji, X-ray elemental imaging by using
two dimensional X-ray detector, European Conference on X-Ray Spectrometry
(EXRS2012), 18-22 June 2012, Vienna, Austria (poster).
[9] S. Emoto,
K. Tsuji, Depth elemental imaging of near surface of the forensic samples by
confocal 3D-XRF, European Conference on X-Ray Spectrometry (EXRS2012), 18-22
June 2012, Vienna, Austria (poster).
[10] M. A. Malek, T.
Nakazawa, H.-W. Kang, K. Tsuji, C.-U. Ro, Characterization of layered materials
related to forensic investigation by confocal micro-X-ray fluorescence and
attenuated total reflectance FT-IR imaging, 2012 Asia-Pacific Winter Conference
on Plasma Spectrochemistry (2012APWC), 26-29 August 2012, Jeju
Island, Korea (poster).
[11] F. Onoue,
T. Nakamura, K. Tsuji, Elemental X-ray imaging combined with glow discharge
sputtering, International symposium on "Recent advance in analytical techniques
for steelmaking industry" (RATEC2012), 28-30 November 2012, National
Museum of Emerging Science and Innovation (MIRAIKAN), Tokyo, Japan (poster).
[12] H. Oka, T. Sawamura, K. Tsuji, Development of a portable grazing-exit
XRF analyzer, International symposium on "Recent advance in analytical
techniques for steelmaking industry" (RATEC2012), 28-30 November 2012,
National Museum of Emerging Science and Innovation (MIRAIKAN), Tokyo, Japan
(poster).
¹ñÆâ¤Ç¤Î¾·ÂÔ¡¦°ÍÍê¹Ö±é
Invited talks at domestic
conferences
[1] ÄÔ ¹¬°ì¡Ö·Ö¸÷XÀþÈù¾®ÉôÈùÎÌʬÀÏË¡¤Î¸½¾õ¤ÈŸ˾¡×2012ǯ7·î6Æü¡¢Âè121²ó°ì¿å²ñʬÀÏ´ÉÍý¸¦µæ²ñ¡Ê½»Í§¶â°¹©¶ÈêÁí¹çµ»½Ñ¸¦µæ½ê£±¹æ´Û¡¢Ê¼¸Ë¡Ë
[2] ÄÔ ¹¬°ì¡ÖÁ´È¿¼Í·Ö¸÷XÀþʬ¸÷Ë¡¡ÊTXRF¡Ë¤Î¹ñºÝɸ½à²½¡× 2012ǯ9·î4Æü¡¢JASIS¥³¥ó¥Õ¥¡¥ì¥ó¥¹? ɽÌ̲½³ØʬÀϹñºÝɸ½à²½¥»¥ß¥Ê¡¼¡ÖɽÌÌʬÀϤˤª¤±¤ë¹ñºÝɸ½à²½¤Î¸½¾õ¡×¡ÊËëÄ¥¥á¥Ã¥»¹ñºÝ²ñµÄ¾ì2³¬201²ñµÄ¼¼¡¢ÀéÍÕ¡Ë
[3] ÄÔ ¹¬°ì¡Öʬ¸÷ʬÀϲ½³Ø¤Î´ðÁäȸ½Âå¼Ò²ñ¤Ë¤ª¤±¤ë±þÍÑ¡×2012ǯ10·î18Æü¡¢Ê¼¸Ë¸©Î©ËÌÀÝ»°ÅĹâÅù³Ø¹»1ÆüÂç³ØÂθ³¹ÖºÂ¡Êʼ¸Ë¸©Î©ËÌÀÝ»°ÅĹâÅù³Ø¹»¡¢Ê¼¸Ë¡Ë
¹ñÆâ¤Ç¤Î³Ø²ñȯɽ¤Ê¤É
Presentations at conferences in
Japan
[1] Â翹 ¿ò»Ë¡¢ÄÔ ¹¬°ì¡Ö£ØÀþ£Ã£Ã£Ä¥«¥á¥é¤òÍѤ¤¤¿·Ö¸÷XÀþ¥¤¥á¡¼¥¸¥ó¥°ÁõÃ֤λîºî¤Èɾ²Á¡×2012ǯ5·î19-20Æü¡¢Âè72²óʬÀϲ½³ØƤÏÀ²ñ¡Ê¼¯»ùÅçÂç³Ø·´¸µ¥¥ã¥ó¥Ñ¥¹¡¢¼¯»ùÅç¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[2] ¾¾Ìð ½ßÀë¡¢ÄÔ ¹¬°ì¡ÖÊ£¹ç·¿XÀþ¸÷³ØÁǻҤòÈ÷¤¨¤¿Èù¾®Éô·Ö¸÷XÀþʬÀÏÁõÃ֤γ«È¯¤Èɾ²Á¡×2012ǯ5·î19-20Æü¡¢Âè72²óʬÀϲ½³ØƤÏÀ²ñ¡Ê¼¯»ùÅçÂç³Ø·´¸µ¥¥ã¥ó¥Ñ¥¹¡¢¼¯»ùÅç¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[3] Ê¿Ìî ¿·ÂÀϺ¡¢½©²¬ ¹¬»Ê¡¢ÅÚ°æ ¶µ»Ë¡¢¹Ó°æ Àµ¹À¡¢¹âÉô ½¨¼ù¡¢ÄÔ ¹¬°ì¡Ö»°¼¡¸µ·Ö¸÷XÀþʬÀÏË¡¤Ë¤è¤ë¿åÍϱÕÃæ¶â°¸µÁǤÎʬÉÛ²òÀÏ¡×2012ǯ9·î19-21Æü¡¢ÆüËÜʬÀϲ½³Ø²ñ Âè61ǯ²ñ¡Ê¶âÂôÂç³Ø³Ñ´Ö¥¥ã¥ó¥Ñ¥¹¡¢ÀÐÀî¡Ë¡Ê¸ýƬ¡Ë
[4] ¹¾ËÜ ÀºÆó¡¢ÄÔ ¹¬°ì¡Ö¶¦¾ÇÅÀ·¿»°¼¡¸µ·Ö¸÷XÀþʬÀÏË¡¤Ë¤è¤ëË¡²Ê³Ø»îÎÁ¤Î¬Äê¤È¤½¤Î²òÀÏ¡×2012ǯ9·î19-21Æü¡¢ÆüËÜʬÀϲ½³Ø²ñ Âè61ǯ²ñ¡Ê¶âÂôÂç³Ø³Ñ´Ö¥¥ã¥ó¥Ñ¥¹¡¢ÀÐÀî¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[5] Ãæß· δ¡¢ÄÔ ¹¬°ì¡Ö¿¿¶õ»ÅÍͤζ¦¾ÇÅÀ·¿·Ö¸÷XÀþʬÀÏÁõÃ֤γ«È¯¤È¤½¤Î±þÍÑ¡×2012ǯ10·î31Æü-11·î2Æü¡¢Âè48²ó£ØÀþʬÀÏƤÏÀ²ñ¡Ê̾¸Å²°Âç³ØÅ컳¥¥ã¥ó¥Ñ¥¹¡¢°¦ÃΡˡʸýƬ¡Ë
[6] Â翹 ¿ò»Ë¡¢²ÃÆ£ ½¨°ì¡¢Æ²°æ
¿¿¡¢¾±»Ê ¹§¡¢ÄÔ ¹¬°ì¡ÖÇÈĹʬ»¶·¿·Ö¸÷XÀþ¥¤¥á¡¼¥¸¥ó¥°Ê¬¸÷Ë¡¤Î³«È¯¤È´ðÁÃÆÃÀ¤Îɾ²Á¡×2012ǯ10·î31Æü-11·î2Æü¡¢Âè48²ó£ØÀþʬÀÏƤÏÀ²ñ¡Ê̾¸Å²°Âç³ØÅ컳¥¥ã¥ó¥Ñ¥¹¡¢°¦ÃΡˡʸýƬ¡Ë
[7] ¾¾Ìð ½ßÀë¡¢ÄÔ ¹¬°ì¡ÖÊ£¹ç·¿XÀþ¸÷³ØÁǻҤòÈ÷¤¨¤¿Èù¾®Éô·Ö¸÷XÀþʬÀÏÁõÃ֤γ«È¯¤Èɾ²Á¡Ê¤½¤Î£²¡Ë¡×2012ǯ10·î31Æü-11·î2Æü¡¢Âè48²ó£ØÀþʬÀÏƤÏÀ²ñ¡Ê̾¸Å²°Âç³ØÅ컳¥¥ã¥ó¥Ñ¥¹¡¢°¦ÃΡˡʥݥ¹¥¿¡¼¡Ë
[8] °²ÅÄ ¾°°ê¼Â¡¢²¬ Çî»Ë¡¢ÄÔ
¹¬°ì¡Ö¼Ð½Ð¼Í·Ö¸÷XÀþʬÀÏÁõÃ֤ξ®·¿²½¤Î¸¡Æ¤¡×2012ǯ10·î31Æü-11·î2Æü¡¢Âè48²ó£ØÀþʬÀÏƤÏÀ²ñ¡Ê̾¸Å²°Âç³ØÅ컳¥¥ã¥ó¥Ñ¥¹¡¢°¦ÃΡˡʥݥ¹¥¿¡¼¡Ë
[9] ÄÔ ¹¬°ì¡¢Ãæß· δ¡¢ÂçÄÐ ÏÂÆÁ¡Ö¿¿¶õ»ÅÍͤζ¦¾ÇÅÀ»°¼¡¸µ·Ö¸÷XÀþʬÀÏÁõÃ֤γ«È¯¤ÈÈóÇ˲õ¿¼¤µÊý¸þ¸µÁÇʬÀϤؤαþÍÑ¡×2012ǯ11·î15-16Æü¡¢ÆüËÜË¡²Ê³Øµ»½Ñ³Ø²ñ Âè18²ó³Ø½Ñ½¸²ñ¡Ê¥Û¥Æ¥ë¥Õ¥í¥é¥·¥ª¥óÀÄ»³¡¢Åìµþ¡Ë¡Ê¸ýƬ¡Ë
[10] À¾ÏÆ Ë§Åµ¡¢³÷À¸ ·¼»Ê¡¢Ãæß· δ¡¢ÄÔ ¹¬°ì¡Ö»°¼¡¸µ·Ö¸÷XÀþʬÀϤˤè¤ë¼«Æ°¼Ö¥¬¥é¥¹¥×¥ê¥ó¥È¹õ¥»¥é¥ß¥Ã¥¯¥¹ÊÒ¤ÎÈóÇ˲õ°ÛƱ¼±ÊÌ¡×2012ǯ11·î15-16Æü¡¢ÆüËÜË¡²Ê³Øµ»½Ñ³Ø²ñ Âè18²ó³Ø½Ñ½¸²ñ¡Ê¥Û¥Æ¥ë¥Õ¥í¥é¥·¥ª¥óÀÄ»³¡¢Åìµþ¡Ë¡Ê¸ýƬ¡Ë
[11] ÄÔ ¹¬°ì¡¢Ê¿Ìî ¿·ÂÀϺ¡¢Ãæß·
δ¡¢½©²¬ ¹¬»Ê¡¢¹âÉô ½¨¼ù, ÅÚ°æ ¶µ»Ë¡¢¹Ó°æ Àµ¹À¡Ö¶¦¾ÇÅÀ£³¼¡¸µ·Ö¸÷£ØÀþʬÀÏË¡¤Ë¤è¤ë¿åÍϱղ¼¤Ç¤Î¹Ý¤ÎÉå¿©µóÆ°¤½¤Î¾ì´Ñ»¡¤Î»î¤ß¡×2013ǯ1·î17-18Æü¡¢À½¹ÝÂ裱£¹°Ñ°÷²ñ À½¹Ý·×¬²½³Ø¸¦µæ²ñ¡ÊÁá°ðÅÄÂç³ØÍý¹©¥¥ã¥ó¥Ñ¥¹¡ÊÀ¾Áá°ðÅÄ¥¥ã¥ó¥Ñ¥¹¡Ë¡¢Åìµþ¡Ë¡Ê¸ýƬ¡Ë¡ÊͽÄê¡Ë
[12] ²¬ Çî»Ë¡¢°²ÅÄ ¾°°ê¼Â¡¢ÄÔ
¹¬°ì¡Ö¾®·¿¼Ð½Ð¼Í·Ö¸÷XÀþʬÀÏÁõÃ֤γ«È¯¤Èɾ²Á¡×2013ǯ1·î25Æü¡¢´ØÀ¾Ê¬Àϸ¦µæ²ñ Ê¿À®24ǯÅÙÂèÆó²óÎã²ñ¡ÊµþÅÔÂç³Ø²½³Ø¸¦µæ½ê¡¢µþÅԡˡʸýƬ¡Ë
[13] Â翹 ¿ò»Ë¡¢ÄÔ
¹¬°ì¡ÖÇÈĹʬ»¶·¿·Ö¸÷XÀþ¥¤¥á¡¼¥¸¥ó¥°Ê¬¸÷Ë¡¤ÎÄó°Æ¡¦³«È¯¤È±þÍѲÄǽÀ¡×2013ǯ2·î8Æü¡¢¡Ö¥Ð¥¤¥ª¥¤¥ó¥¿¡¼¥Õ¥§¡¼¥¹Àèü¥Þ¥Æ¥ê¥¢¥ë¤ÎÁÏÀ¸¡×Âè3²ó¥·¥ó¥Ý¥¸¥¦¥à¡ÊÂçºå»ÔΩÂç³Ø¹â¸¶µÇ°´Û¡¢Âçºå¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[14] ÄÔ ¹¬°ì¡ÖXÀþʬÀϤȥ°¥í¡¼ÊüÅÅ¥¹¥Ñ¥Ã¥¿¥ê¥ó¥°¤Ë¤è¤ëÅ´¹ÝÃæ²ðºßʪ¤Î¸µÁÇ¥¤¥á¡¼¥¸¥ó¥°¡×2013ǯ3·î27-29Æü¡¢ÆüËÜÅ´¹Ý¶¨²ñÂè165²ó½Õµ¨¹Ö±éÂç²ñ¡ÊÅìµþÅŵ¡Âç³ØÅìµþÀé½»¥¥ã¥ó¥Ñ¥¹¡¢Åìµþ¡Ë¡Ê¸ýƬ¡Ë
[15] Â翹 ¿ò»Ë¡¢ÄÔ ¹¬°ì¡ÖÇÈĹʬ»¶·¿·Ö¸÷XÀþ¥¤¥á¡¼¥¸¥ó¥°ÁõÃ֤γ«È¯¤ÈÀǽɾ²Á¡×2013ǯ3·î27-29Æü¡¢ÆüËÜÅ´¹Ý¶¨²ñÂè165²ó½Õµ¨¹Ö±éÂç²ñ¡ÊÅìµþÅŵ¡Âç³ØÅìµþÀé½»¥¥ã¥ó¥Ñ¥¹¡¢Åìµþ¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
¡¡
2011ǯÅ٤γèÆ°
¡Êfrom April 2011 to March 2012¡Ë
¹ñÆâ¤Ç¤Î³Ø²ñȯɽ¤Ê¤É
Presentations at conferences in
Japan
[1]
ÅÄÉô ½ß»Ì¡¢Ãæß· δ¡¢ÃæÌî ÏÂɧ¡¢ÄÔ ¹¬°ì¡¢½©²¬ ¹¬»Ê¡¢ÅÚ°æ ¶µ»Ë¡¢¹Ó°æ Àµ¹À¡¢¹âÉô ½¨¼ù¡ÖÅ´¹ÝºàÎÁɽÌ̶á˵¤ÎÈóÇ˲õŪ¸µÁÇ¥¤¥á¡¼¥¸¥ó¥°¡×2011ǯ9·î14-16Æü¡¢ÆüËÜʬÀϲ½³Ø²ñÂè60ǯ²ñ¡Ê̾¸Å²°Âç³Ø¡¢°¦ÃΡË(¸ýƬ)
[2]
ÄÔ ¹¬°ì¡¢Ãæß· δ¡¢ÃæÌî ÏÂɧ¡¢À¶¿å
·ò°ì¡Ö¹ÝÃæ²ðºßʪ¤Î3¼¡¸µ¸µÁÇʬÀϤ˸þ¤±¤¿¼è¤êÁȤߡ×2011ǯ9·î20-22Æü¡¢ÆüËÜÅ´¹Ý¶¨²ñ Âè162²ó½©µ¨¹Ö±éÂç²ñ¡ÊÂçºåÂç³Ø¿áÅÄ¥¥ã¥ó¥Ñ¥¹¡¢Âçºå¡Ë¡Ê¸ýƬ¡Ë
[3]
ÄÔ ¹¬°ì¡Ö·Ö¸÷XÀþ¥¤¥á¡¼¥¸¥ó¥°¤Î¸¦µæÆ°¸þ¡×¡¢2011ǯ10·î28-29Æü¡¢Âè47²ó XÀþʬÀÏƤÏÀ²ñ¡Ê¶å½£Âç³ØÈ¢ºê¥¥ã¥ó¥Ñ¥¹¡¢Ê¡²¬¡Ë¡Ê¸ýƬ¡Ë
[4]
Ãæß· δ¡¢ÅÄÉô ½ß»Ì¡¢ÃæÌî ÏÂɧ¡¢ÂçÄÐ
ÏÂÆÁ¡¢½©²¬ ¹¬»Ê¡¢ÅÚ°æ ¶µ»Ë¡¢¹Ó°æ Àµ¹À¡¢¹âÉô ½¨¼ù¡¢ÄÔ
¹¬°ì¡Ö¶¦¾ÇÅÀ·¿3¼¡¸µ·Ö¸÷XÀþʬÀϤˤè¤ëÅÉËì¹ÝÈĤβòÀϵڤӹⴶÅÙ²½¡×2011ǯ10·î28-29Æü¡¢Âè47²ó XÀþʬÀÏƤÏÀ²ñ¡Ê¶å½£Âç³ØÈ¢ºê¥¥ã¥ó¥Ñ¥¹¡¢Ê¡²¬¡Ë¡Ê¸ýƬ¡Ë
[5]
¾¾Ìð ½ßÀë¡¢°²ÅÄ ¾°°ê¼Â¡¢ÄÔ ¹¬°ì¡ÖÊ£¹ç·¿XÀþÁõÃÖ¤òÍѤ¤¤¿Èù¾®Éô·Ö¸÷XÀþʬÀÏÁõÃÖ¤Îɾ²Á¡×2011ǯ10·î28-29Æü¡¢Âè47²ó XÀþʬÀÏƤÏÀ²ñ¡Ê¶å½£Âç³ØÈ¢ºê¥¥ã¥ó¥Ñ¥¹¡¢Ê¡²¬¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[6]
Â翹 ¿ò»Ë¡¢ÄÔ ¹¬°ì¡ÖÇÈĹʬ»¶·¿·Ö¸÷XÀþ¥¤¥á¡¼¥¸¥ó¥°ÁõÃ֤λîºî¡×2011ǯ10·î28-29Æü¡¢Âè47²ó XÀþʬÀÏƤÏÀ²ñ¡Ê¶å½£Âç³ØÈ¢ºê¥¥ã¥ó¥Ñ¥¹¡¢Ê¡²¬¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[7]
¶ðë ¿µÂÀϺ¡¢ÀÄ»³ Êþ¼ù¡¢Âçß· À¡¿Í¡¢ÊƸ¶ Íã¡¢ÄÔ ¹¬°ì¡ÖĶ¾®·¿XÀþ¸²Èù¶À¤Î³«È¯¡×2011ǯ10·î28-29Æü¡¢Âè47²ó XÀþʬÀÏƤÏÀ²ñ¡Ê¶å½£Âç³ØÈ¢ºê¥¥ã¥ó¥Ñ¥¹¡¢Ê¡²¬¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[8]
ÄÔ ¹¬°ì¡¢Ãæß· δ¡¢ÃæÌî ÏÂɧ¡¢ÂçÄÐ ÏÂÆÁ¡¢½©²¬ ¹¬»Ê¡¢ÅÚ°æ ¶µ»Ë¡¢¹Ó°æ Àµ¹À¡¢¹âÉô ½¨¼ù¡Ö3¼¡¸µ·Ö¸÷XÀþʬÀÏË¡¤Ë¤è¤ëºàÎÁɽÌ̶á˵¤Î¿¼¤µ¸µÁÇ¥¤¥á¡¼¥¸¥ó¥°¡×2011ǯ11·î7-9Æü¡¢ÆüËܶⰳزñ2011ǯ½©´ü¡ÊÂè149²ó¡ËÂç²ñ¡Ê²Æ쥳¥ó¥Ù¥ó¥·¥ç¥ó¥»¥ó¥¿¡¼¤ª¤è¤Ó¥«¥ë¥Á¥ã¡¼¥ê¥¾¡¼¥È¥Õ¥§¥¹¥È¡¼¥Í¡¢²Æì¡Ë¡Ê¸ýƬ¡Ë
[9] Ãæß· δ¡¢ÄÔ ¹¬°ì¡Ö¶¦¾ÇÅÀ·¿»°¼¡¸µ·Ö¸÷XÀþʬÀÏÁõÃ֤ˤè¤ëȾƳÂΤÎÈóÇ˲õ¿¼¤µÊ¬Àϡס¢2011ǯ11·î7-9Æü¡¢ÆüËܶⰳزñ2011ǯ½©´ü¡ÊÂè149²ó¡ËÂç²ñ¡Ê²Æ쥳¥ó¥Ù¥ó¥·¥ç¥ó¥»¥ó¥¿¡¼¤ª¤è¤Ó¥«¥ë¥Á¥ã¡¼¥ê¥¾¡¼¥È¥Õ¥§¥¹¥È¡¼¥Í¡¢²Æì¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[10]
ÅÄÉô ½ß»Ì¡¢ÄÔ ¹¬°ì¡Ö¶¦¾ÇÅÀ·¿»°¼¡¸µ·Ö¸÷XÀþʬÀÏÁõÃ֤ˤª¤±¤ëÆó¼¡Î嵯¸ú²Ì¤Î¸¡¾Ú¡×¡¢2011ǯ11·î7-9Æü¡¢ÆüËܶⰳزñ2011ǯ½©´ü¡ÊÂè149²ó¡ËÂç²ñ¡Ê²Æ쥳¥ó¥Ù¥ó¥·¥ç¥ó¥»¥ó¥¿¡¼¤ª¤è¤Ó¥«¥ë¥Á¥ã¡¼¥ê¥¾¡¼¥È¥Õ¥§¥¹¥È¡¼¥Í¡¢²Æì¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[11] ϲÅÄ ¿¿Í³¡¢Ãæß· δ¡¢ÄÔ ¹¬°ì¡¢Ìð»ý ¿Ê¡Ö·Ö¸÷XÀþʬÀÏË¡¤òÍѤ¤¤¿ÅÔ»Ô²ÏÀîÂçÏÂÀî¤Ë¤ª¤±¤ë¥¢¥æÁ̾å¿ô¤Î¿äÄê¡×¡¢2011ǯ11·î26Æü¡¢Ê¿À®23ǯÅÙÆüËܿ建³Ø²ñ¶áµ¦»ÙÉô¸å´üÎã²ñ¡ÊÂçºå»ÔΩÂç³Øʸ²½¸òή¥»¥ó¥¿¡¼¡¢Âçºå¡Ë¡Ê¸ýƬ¡Ë
[12] ¾¾Ìð ½ßÀë¡¢ÄÔ ¹¬°ì¡Ö¥°¥í¡¼ÊüÅŽèÍý¤Ë¤è¤ëºàÎÁɽÌ̤ο×®À¶¾ô²½¤È¹âʬ²òǽ£Ó£Å£Í´Ñ»¡¡×2012ǯ1·î19Æü¡¢´ØÀ¾Ê¬Àϸ¦µæ²ñ Ê¿À®23ǯÅÙÂèÆó²óÎã²ñ¡ÊÂçºåÉÜΩÂç³ØÃæÉ´ÀåÄ»¥¥ã¥ó¥Ñ¥¹¡¢Âçºå¡Ë¡Ê¸ýƬ¡Ë
[13] µÈ²¬ ã»Ë¡¢ÄÔ ¹¬°ì¡Ö³¤¿å»îÎÁ¤ÎÁ´È¿¼Í·Ö¸÷X ÀþʬÀϤˤª¤±¤ë»îÎÁ½àÈ÷Ë¡¡×2012ǯ1·î19Æü¡¢´ØÀ¾Ê¬Àϸ¦µæ²ñ Ê¿À®23ǯÅÙÂèÆó²óÎã²ñ¡ÊÂçºåÉÜΩÂç³ØÃæÉ´ÀåÄ»¥¥ã¥ó¥Ñ¥¹¡¢Âçºå¡Ë¡Ê¸ýƬ¡Ë
[14] ¾¾Ìð ½ßÀë¡¢ÄÔ ¹¬°ì¡ÖÊ£¹ç·¿XÀþ¸÷³ØÁǻҤòÍѤ¤¤¿Èù¾®Éô·Ö¸÷XÀþʬÀÏÁõÃ֤λîºî¡×2012ǯ2·î10Æü¡¢¡Ö¥Ð¥¤¥ª¥¤¥ó¥¿¡¼¥Õ¥§¡¼¥¹Àèü¥Þ¥Æ¥ê¥¢¥ë¤ÎÁÏÀ¸¡×Âè2²ó¥·¥ó¥Ý¥¸¥¦¥à¡ÊÂçºå»ÔΩÂç³Ø°å³Ø¸¦µæ²ÊÂç¹ÖµÁ¼¼¡¢Âçºå¡Ë(¥Ý¥¹¥¿¡¼)
[15] ÄÔ ¹¬°ì¡¢À¶¿å ·ò°ì¡Ö¥°¥í¡¼ÊüÅŽèÍý¸å¤ÎºàÎÁɽÌ̤Σӣţʹѻ¡¡×¡¢2012ǯ2·î17Æü¡¢Ê¿À®23ǯÅÙÂçºå»ÔΩÂç³ØÂç³Ø±¡¹©³Ø¸¦µæ²Ê¡Ö¿Í´Ö¡¦´Ä¶Å¬¹ç·¿µ¡Ç½À¥ª¥¥µ¥¤¥É¡¦¥Þ¥Æ¥ê¥¢¥ë¤Î¿·Å¸³«¡×¥×¥í¥¸¥§¥¯¥È¡¦¥·¥ó¥Ý¥¸¥¦¥à¡ÊÂçºå»ÔΩÂç³Ø³Ø½Ñ¾ðÊóÁí¹ç¥»¥ó¥¿¡¼¡¢Âçºå¡Ë¡Ê¸ýƬ¡Ë
[16] ¾¾Ìð ½ßÀë¡¢ÄÔ ¹¬°ì¡ÖÊ£¹ç·¿XÀþ¸÷³ØÁǻҤòÍѤ¤¤¿Èù¾®Éô·Ö¸÷XÀþʬÀÏÁõÃ֤γ«È¯¤Èɾ²Á¡×2012ǯ2·î17Æü¡¢Ê¿À®23ǯÅÙÂçºå»ÔΩÂç³ØÂç³Ø±¡¹©³Ø¸¦µæ²Ê¡Ö¿Í´Ö¡¦´Ä¶Å¬¹ç·¿µ¡Ç½À¥ª¥¥µ¥¤¥É¡¦¥Þ¥Æ¥ê¥¢¥ë¤Î¿·Å¸³«¡×¥×¥í¥¸¥§¥¯¥È¡¦¥·¥ó¥Ý¥¸¥¦¥à¡ÊÂçºå»ÔΩÂç³Ø³Ø½Ñ¾ðÊóÁí¹ç¥»¥ó¥¿¡¼¡¢Âçºå¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[17] Â翹 ¿ò»Ë¡¢ÄÔ ¹¬°ì¡ÖÇÈĹʬ»¶·¿·Ö¸÷XÀþ¥¤¥á¡¼¥¸¥ó¥°ÁõÃ֤λîºî¡×2012ǯ2·î17Æü¡¢Ê¿À®23ǯÅÙÂçºå»ÔΩÂç³ØÂç³Ø±¡¹©³Ø¸¦µæ²Ê¡Ö¿Í´Ö¡¦´Ä¶Å¬¹ç·¿µ¡Ç½À¥ª¥¥µ¥¤¥É¡¦¥Þ¥Æ¥ê¥¢¥ë¤Î¿·Å¸³«¡×¥×¥í¥¸¥§¥¯¥È¡¦¥·¥ó¥Ý¥¸¥¦¥à¡ÊÂçºå»ÔΩÂç³Ø³Ø½Ñ¾ðÊóÁí¹ç¥»¥ó¥¿¡¼¡¢Âçºå¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[18] ¥«¥¯ ¥·¥ç¥¦¡¢ÄÔ ¹¬°ì¡Ö´Ä¶¿å»îÎÁ¤ÎÁ´È¿¼Í·Ö¸÷£ØÀþ¤Î¹ñºÝɸ½àµ¬³Ê¤Î¤¿¤á¤Î¥é¥¦¥ó¥É¥í¥Ó¥ó¥Æ¥¹¥È¡×2012ǯ2·î17Æü¡¢Ê¿À®23ǯÅÙÂçºå»ÔΩÂç³ØÂç³Ø±¡¹©³Ø¸¦µæ²Ê¡Ö¿Í´Ö¡¦´Ä¶Å¬¹ç·¿µ¡Ç½À¥ª¥¥µ¥¤¥É¡¦¥Þ¥Æ¥ê¥¢¥ë¤Î¿·Å¸³«¡×¥×¥í¥¸¥§¥¯¥È¡¦¥·¥ó¥Ý¥¸¥¦¥à¡ÊÂçºå»ÔΩÂç³Ø³Ø½Ñ¾ðÊóÁí¹ç¥»¥ó¥¿¡¼¡¢Âçºå¡Ë(¥Ý¥¹¥¿¡¼)
[19] ¹¾ËÜ ÀºÆó¡¢ÄÔ ¹¬°ì¡Ö»°¼¡¸µ·Ö¸÷XÀþʬÀÏË¡¤Ë¤è¤ëºàÎÁɽÌ̶á˵¤Î¿¼¤µ¸µÁÇ¥¤¥á¡¼¥¸¥ó¥°¡×2012ǯ3·î28-30Æü ÆüËÜÅ´¹Ý¶¨²ñ Ê¿À®24ǯ Âè163²ó½Õµ¨¸ø±éÂç²ñ¡Ê²£É͹ñΩÂç³Ø¡¢¿ÀÆàÀî¡Ë(¥Ý¥¹¥¿¡¼)
[20] °²ÅÄ ¾°°ê¼Â¡¢ÄÔ ¹¬°ì¡ÖÆ󼡸µXÀþ¸¡½Ð´ï¤òÍѤ¤¤¿»îÎÁÆâÉô¤Î¸µÁǼ±ÊÌ·¿²Ä»ë²½¤Î¸¡Æ¤¡×2012ǯ3·î28-30Æü ÆüËÜÅ´¹Ý¶¨²ñ Ê¿À®24ǯ Âè163²ó½Õµ¨¹Ö±éÂç²ñ¡Ê²£É͹ñΩÂç³Ø¡¢¿ÀÆàÀî¡Ë(¥Ý¥¹¥¿¡¼)
[21] Ê¿Ìî ¿·ÂÀϺ¡¢ÄÔ ¹¬°ì¡Ö¥¬¥é¥¹¥¥ã¥Ô¥é¥ê¡¼¤òÍѤ¤¤ëXÀþ¥Ó¡¼¥à¤ÎÈùºÙ²½¡×2012ǯ3·î28-30Æü¡¡ÆüËÜÅ´¹Ý¶¨²ñ Ê¿À®24ǯ Âè163²ó½Õµ¨¹Ö±éÂç²ñ¡Ê²£É͹ñΩÂç³Ø¡¢¿ÀÆàÀî¡Ë(¥Ý¥¹¥¿¡¼)
¹ñºÝ²ñµÄ¤Ç¤Î¾·ÂÔ¡¦°ÍÍê¹Ö±é
Invited talks at international
conferences
[1]
K. Tsuji, M.
Yamaguchi, T. Ohmori, XRF imaging using total
reflection in polycapillary optics and X-ray CCD detector, The 14th
International Conference on Total Reflection X-ray Fluorescence and Related
Methods, 6-9 June 2011, Dortmund, Germany.
[2]
K. Tsuji, C. Nishi,
T. Nakazawa, K. Nakano, K.Otsuki, Y. Nishiwaki, H. Takenaka, 3D-XRF
Analysis of Several Forensic and Industrial Samples, 60th Annual Conference on
Applications of X-ray Analysis Denver X-ray Conference, 1-5 August 2011,
Colorado Springs, Colorado, USA.
[3] T. Nakazawa, K. Nakano, K. Tsuji, Chemical Depth Imaging by Confocal micro-XRF, The 38th FACSS conference, 2-6 October 2011, Reno,
Nevada, USA.
[4]
ÄÔ ¹¬°ì¡¢? ¾½¡ÖÁ´È¿¼Í·Ö¸÷XÀþʬÀÏË¡¤Ë¤è¤ëͳ²½Å¶â°¸µÁÇʬÀϡסʥݥ¹¥¿¡¼½ÐŸ¡Ë¡¢2011
Ãæ¹ñ¹ñºÝ¹©¶ÈÇîÍ÷²ñ¡¢2011ǯ10·î31Æü¡Ý11·î4Æü¡Ê¾å³¤»Ô¡¢Ãæ¹ñ¡Ë
[5] K. Tsuji, T. Nakazawa, 3D-XRF Analysis for Industrial
Samples and Projection Type XRF Imaging, The Seminar on Characterization of
Advanced Inorganic Materials with Different Methods, Shanghai Institute of
Ceramics, 3 November 2011, Shanghai, China.
[6]
K.
Tsuji, A few approaches for elemental imaging at OCU (Osaka City University),
TU Wien Seminar, 23 January 2012, TU Wien, Vienna, Austria.
[7]
K.
Tsuji, GD-SEM observation and 3D-XRF analysis of industrial materials, Inha University Seminar, 1-5 February 2012, Inha University, Incheon, Korea.
¹ñÆâ¤Ç¤Î¾·ÂÔ¡¦°ÍÍê¹Ö±é
Invited talks at domestic
conferences
[1] ÄÔ ¹¬°ì¡Ö·Ö¸÷XÀþ¸µÁÇ¥¤¥á¡¼¥¸¥ó¥°¤Î´Õ¼±»ñÎÁ¤Ø¤Î±þÍÑ¡×ËÙ¾ìÀ½ºî½ê¡¢2011ǯ6·î24Æü¡ÊËÙ¾ìÀ½ºî½ê¡¢µþÅÔ¡Ë
[2] ÄÔ ¹¬°ì¡Ê´ë²è¡Ë¡ÖË¡²Ê³Ø¤Ë͸ú¤Êµ¡´ïʬÀÏË¡¡×ÆüËÜʬÀϲ½³Ø²ñ¶áµ¦»ÙÉô¡¦¶áµ¦Ê¬Àϵ»½Ñ¸¦µæº©Ïòñ¡¡Ê¿À®23ǯÅÙ Âè1²ó Äó°Æ¸øÊç·¿¥»¥ß¥Ê¡¼¡¢2011ǯ11·î11Æü¡ÊÂçºå»ÔΩÂç³Øʸ²½¸òή¥»¥ó¥¿¡¼¡¢Âçºå¡Ë
[3] ÄÔ ¹¬°ì¡Ö¥¥ã¥Ô¥é¥ê¡¼XÀþ½¸¸÷ÁǻҤòÍѤ¤¤¿·Ö¸÷XÀþ¸µÁÇ¥¤¥á¡¼¥¸¥ó¥°¡×Âçºå»ÔΩÂç³ØÂç³Ø±¡¹©³Ø¸¦µæ²Ê Âè49²ó¥ª¡¼¥×¥ó¡¦¥é¥Ü¥é¥È¥ê¡¼¡¢2012ǯ2·î20Æü¡ÊÂçºå»º¶ÈÁϤ´Û¡¢Âçºå¡Ë
¹ñºÝ²ñµÄ¤Ç¤Î°ìÈֱ̹é
Presentations at international
conferences
[1]
T.
Nakazawa, A. Tabe, K. Nakano, K. Tsuji, Micro-XRF
Analysis in Helium Atmosphere, IUPAC International Congress on
Analytical Sciences (ICAS) 2011, 22-26 May 2011, Kyoto, Japan (poster).
[2]
T.
Yoshioka, Y.Imanishi, K. Tsuji, Y. Shimizu, T.
Yamada, H. Takabe, T. Doi, K. Akioka,
M. Arai, Sample preparation of sea water for TXRF analysis, The 14th International Conference on Total Reflection
X-ray Fluorescence and Related Methods, 6-9 June 2011, Dortmund, Germany
(poster).
[3]
T.
Nakazawa, K. Tsuji, Enhancement of XRF intensity using total reflection in
Au-coated capillary optics, The 14th
International Conference on Total Reflection X-ray Fluorescence and Related
Methods, 6-9 June 2011, Dortmund, Germany (poster).
2010ǯÅ٤γèÆ°
¡Êfrom April 2010 to March 2011¡Ë
¹ñÆâ¤Ç¤Î³Ø²ñȯɽ¤Ê¤É
Presentations at conferences in
Japan
[1]
ÄÔ ¹¬°ì¡¢ÃæÄ® ÏÂÃË¡¢À¾ÅÄ µÈɧ¡¢ÃæÌî ÏÂɧ¡¢ºäÅì ÆÆ¡¢Æ⸶ Çî¡¢Âçß· À¡¿Í¡¢¶ðë ¿µÂÀϺ¡Ö¼Â¸³¼¼¤Ë¤ª¤±¤ë¥Þ¥¤¥¯¥í£ØÀþ¥Ó¡¼¥à¤ÎºîÀ®¤ÈÈùÎ̸µÁÇʬÀϤؤαþÍÑ¡× 2010ǯ5·î15-16Æü Âè71²óʬÀϲ½³ØƤÏÀ²ñ (Å纬Âç³Ø¾¾¹¾¥¥ã¥ó¥Ñ¥¹¡¢Å纬)¡¡(¸ýƬ¡Ë
[2]
º£À¾ ͳµª»Ò¡¢À¾ÅÄ µÈɧ¡¢ÄÔ ¹¬°ì¡ÖÈù¾¯ÎÌ¥µ¥ó¥×¥ê¥ó¥°¤Ë¤è¤ëÍϱջîÎÁÃæÈù¾®¶õ´Ö¤ÎÁ´È¿¼Í·Ö¸÷£ØÀþʬÀÏ¡×2010ǯ5·î15-16Æü Âè71²óʬÀϲ½³ØƤÏÀ²ñ (Å纬Âç³Ø¾¾¹¾¥¥ã¥ó¥Ñ¥¹¡¢Å纬)¡Ê¥Ý¥¹¥¿¡¼¡Ë
[3]
ÅÄÉô ½ß»Ì¡¢ÃæÌî ÏÂɧ¡¢ÄÔ ¹¬°ì¡¢ºäÅì ÆÆ¡¢Æ⸶ Çî¡¢Âçß· À¡¿Í¡¢¶ðë ¿µÂÀϺ¡¢²¼»³ ¿Ê¡Ö³¨²è»îÎÁ¤Î¶¦¾ÇÅÀ·¿3¼¡¸µ·Ö¸÷£ØÀþʬÀÏ¡×2010ǯ5·î15-16Æü Âè71²óʬÀϲ½³ØƤÏÀ²ñ (Å纬Âç³Ø¾¾¹¾¥¥ã¥ó¥Ñ¥¹¡¢Å纬)¡Ê¥Ý¥¹¥¿¡¼¡Ë
[4]
ÃæÌî ÏÂɧ¡¢ºäÅì ÆÆ¡¢Æ⸶ Çî¡¢Âçß· À¡¿Í¡¢¶ðë ¿µÂÀϺ¡¢ÄÔ ¹¬°ì¡Ö3¼¡¸µ·Ö¸÷£ØÀþʬÀÏÁõÃ֤ζõ´Öʬ²òǽ¤Î¸þ¾å¡×2010ǯ5·î15-16Æü Âè71²óʬÀϲ½³ØƤÏÀ²ñ (Å纬Âç³Ø¾¾¹¾¥¥ã¥ó¥Ñ¥¹¡¢Å纬)¡Ê¸ýƬ¡Ë
[5]
ÄÔ ¹¬°ì¡¢Ãæß· δ¡¢ÃæÌî ÏÂɧ¡Ö3¼¡¸µ·Ö¸÷XÀþʬÀÏÁõÃ֤γ«È¯¾õ¶·¤È±þÍÑÎã¡×2010ǯ5·î11Æü ÆÈΩ¹ÔÀ¯Ë¡¿ÍÆüËܳؽѿ¶¶½²ñÀ½¹ÝÂè19°Ñ°÷²ñ (̾¸Å²°Âç³Ø¡¢°¦ÃÎ) (¸ýƬ)
[6]
ÄÔ ¹¬°ì¡Ö¸Ç±Õ³¦Ì̤ª¤è¤Ó±Õ±Õ³¦Ì̶á˵¤Î·Ö¸÷XÀþ¥¹¥Ú¥¯¥È¥ë¡×2010ǯ9·î25-27Æü ÆüËÜÅ´¹Ý¶¨²ñÂè160²ó½©µ¨¹Ö±éÂç²ñ¡ÊË̳¤Æ»Âç³Ø»¥ËÚ¥¥ã¥ó¥Ñ¥¹¡¢Ë̳¤Æ»¡Ë¡Ê¸ýƬ¡Ë
[7]
Ãæß· δ¡¢ÃæÌî ÏÂɧ¡¢ÄÔ ¹¬°ì¡¢µÈÅÄ
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[8]
Ãæß· δ¡¢À¾ ¤Á¤Ò¤í¡¢ÃæÌî ÏÂɧ¡¢ÄÔ
¹¬°ì¡¢À¾ÏÆ Ë§Åµ¡¢ÂçÄÐ ÏÂÆÁ¡Ö¹âʬ²òǽ£³¼¡¸µ·Ö¸÷£ØÀþʬÀÏÁõÃ֤γ«È¯¤È´Õ¼±»îÎÁ¤ÎÈóÇ˲õ¿¼¤µÊ¬ÀÏ¡×2010ǯ9·î15-17Æü ÆüËÜʬÀϲ½³Ø²ñÂè59ǯ²ñ¡ÊÅìËÌÂç³ØÀîÆâËÌ¥¥ã¥ó¥Ñ¥¹¡¢µÜ¾ë¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[9]
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[10]
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[11]
Ãæß·? δ¡¢ÃæÄ® ÏÂÃË¡¢ÃæÌî
ÏÂɧ¡¢Ìð»ý ¿Ê¡¢ÄÔ ¹¬°ì¡Ö°¾¤Î¼ªÀФηָ÷XÀþ¸µÁÇ¥¤¥á¡¼¥¸¥ó¥°¡×2010ǯ10·î22-23Æü Âè46²óXÀþʬÀÏƤÏÀ²ñ¡Ê¹Å縩¾ðÊó¥×¥é¥¶Â¿ÌÜŪ¥Û¡¼¥ë¡¢¹Åç¡Ë¡Ê¸ýƬ¡Ë
[12]
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[13]
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[14]
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µ×µ®¡Ö3 ¼¡¸µ¹½Â¤É¸½àʪ¼Á¤òÍѤ¤¤¿¶¦¾ÇÅÀ3¼¡¸µ·Ö¸÷XÀþʬÀÏÁõÃÖ¤Îɾ²Á¡×2010ǯ10·î22-23Æü Âè46²óXÀþʬÀÏƤÏÀ²ñ¡Ê¹Å縩¾ðÊó¥×¥é¥¶Â¿ÌÜŪ¥Û¡¼¥ë¡¢¹Åç¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[15]
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[16]
ÃæÌî ÏÂɧ¡Ö¤¤¤¯¤Ä¤«¤Î´Õ¼±»îÎÁ¤ÎÈóÇ˲õ·Ö¸÷XÀþʬÀÏ¡×2010ǯ11·î17Æü¡¡Âè105²óʬÀϵ»½Ñ¸¦µæ²ñÎã²ñ¡ÊÂçºå»ÔΩÂç³Ø¡¢Âçºå¡Ë¡Ê¸ýƬ¡Ë
[17]
Ãæß· δ¡Ö¶â°¥³¡¼¥Æ¥£¥ó¥°¥¥ã¥Ô¥é¥ê¡¼¤Ë¤ª¤±¤ëXÀþÁý¶¯¸ú²Ì¡×2010ǯ11·î17Æü¡¡Âè105²óʬÀϵ»½Ñ¸¦µæ²ñÎã²ñ¡ÊÂçºå»ÔΩÂç³Ø¡¢Âçºå¡Ë¡Ê¸ýƬ¡Ë
[18]
º£À¾ ͳµª»Ò¡Ö´á¶ñÍϽбդÎÁ´È¿¼Í·Ö¸÷XÀþʬÀÏ¡×2010ǯ11·î17Æü¡¡Âè105²óʬÀϵ»½Ñ¸¦µæ²ñÎã²ñ¡ÊÂçºå»ÔΩÂç³Ø¡¢Âçºå¡Ë¡Ê¸ýƬ¡Ë
[19]
ÄÔ ¹¬°ì¡Ö¼Â¸³¼¼3¼¡¸µ·Ö¸÷XÀþʬÀÏÁõÃ֤γ«È¯¤È´Õ¼±²Ê³Ø¤Ê¤É¤Ø¤Î±þÍÑ¡×2010ǯ12·î21Æü¡¡ÂçºåÉÜΩÂç³Ø¡¦Âçºå»ÔΩÂç³Ø¥Ë¥å¡¼¥Æ¥¯¥Õ¥§¥¢¡ÊÂçºå»º¶ÈÁϤ´Û¡¢Âçºå¡Ë¡Ê¸ýƬ¡Ë
[20]
ÄÔ ¹¬°ì¡ÖÂçºå»ÔΩÂç³Ø¹©³Ø¸¦µæ²Ê²½³ØÀ¸Êª·ÏÀ칶¹©¶ÈʪÍý²½³Ø¸¦µæ¼¼¡ÊÄÔ¹¬°ì¸¦µæ¼¼¡Ë¸¦µæ¼¼¾Ò²ð¡×2011ǯ1·î11Æü¡¡´ØÀ¾Ê¬Àϸ¦µæ²ñ¡¡Ê¿À®22ǯÅÙÂèÆó²óÎã²ñ¡ÊÂçºåÂç³Ø¿áÅÄ¥¥ã¥ó¥Ñ¥¹¡¢Âçºå¡Ë¡Ê¸ýƬ¡Ë
[21]
Ãæß· δ¡¢À¾ ¤Á¤Ò¤í¡¢ÅÄÉô ½ß»Ì¡¢ÃæÌî ÏÂɧ¡¢ÄÔ ¹¬°ì¡Ö3¼¡¸µ·Ö¸÷XÀþʬÀÏË¡¤Î´¶ÅÙ¸þ¾å¤È´Õ¼±»ñÎÁ¤ÎʬÀϤؤÎŬÍÑ¡×2011ǯ1·î11Æü¡¡´ØÀ¾Ê¬Àϸ¦µæ²ñ¡¡Ê¿À®22ǯÅÙÂèÆó²óÎã²ñ¡ÊÂçºåÂç³Ø¿áÅÄ¥¥ã¥ó¥Ñ¥¹¡¢Âçºå¡Ë¡Ê¸ýƬ¡Ë
[22]
ÄÔ ¹¬°ì¡¢ÃæÌî ÏÂɧ¡¢½©²¬ ¹¬»Ê¡¢ÅÚ°æ ¶µ»Ë¡¢¹Ó°æ Àµ¹À¡ÖÅÉÁõ¹ÝÈÄɽÌ̶á˵¤Î3¼¡¸µ·Ö¸÷XÀþʬÀϤˤè¤ëÈóÇ˲õ¸µÁÇ¥¤¥á¡¼¥¸¥ó¥°¡×2011ǯ1·î25Æü¡¡ÆÈΩ¹ÔÀ¯Ë¡¿ÍÆüËܳؽѿ¶¶½²ñ À½¹ÝÂè19°Ñ°÷²ñ À½¹Ý·×¬²½³Ø¸¦µæ²ñÂè51²ó²ñµÄ¡ÊÂçºå¥¬¡¼¥Ç¥ó¥Ñ¥ì¥¹¡¢Âçºå¡Ë¡Ê¸ýƬ¡Ë
[23]
ÄÔ ¹¬°ì¡¢Ãæß· δ¡¢ÃæÌî ÏÂɧ¡¢²¸ÃÏ ·¼¼Â¡¢Ï²ÅÄ ¿¿Í³¡¢Ìð»ý ¿Ê¡Ö°¾¤Î¼ªÀФηָ÷XÀþ¸µÁÇ¥¤¥á¡¼¥¸¥ó¥°²òÀÏ¡×2011ǯ2·î14Æü¡¡Ê¿À®22ǯÅÙÂçºå»ÔΩÂç³Ø½ÅÅÀ¸¦µæ¡Ö¥Ð¥¤¥ª¥¤¥ó¥¿¡¼¥Õ¥§¡¼¥¹Àèü¥Þ¥Æ¥ê¥¢¥ë¤ÎÁÏÀ¸¡×¥·¥ó¥Ý¥¸¥¦¥à¡ÊÂçºå»ÔΩÂç³Ø¡¢Âçºå¡Ë¡Ê¸ýƬ¡Ë
[24]
¾¾Ìð ½ßÀë¡¢ÄÔ ¹¬°ì¡Ö¥°¥í¡¼ÊüÅÅ¥¹¥Ñ¥Ã¥¿¥ê¥ó¥°¤òÍѤ¤¤¿XÀþ¸µÁÇ¥¤¥á¡¼¥¸¥ó¥°Ë¡¡×2011ǯ3·î25-27Æü¡¡ÆüËÜÅ´¹Ý¶¨²ñ Ê¿À®23ǯ Âè161²ó½Õµ¨¹Ö±éÂç²ñ¡ÊÅìµþÅÔ»ÔÂç³Ø¡¢Åìµþ¡Ë¡Ê³ØÀ¸¥Ý¥¹¥¿¡¼¥»¥Ã¥·¥ç¥ó¥¢¥Ö¥¹¥È¥é¥¯¥È½¸ PS-63¡Ë
[25] µÈ²¬ ã»Ë¡¢ÄÔ ¹¬°ì¡Ö¥Ú¡¼¥Ñ¡¼¥¯¥í¥Þ¥È¥°¥é¥Õ¥£¡¼¤òÍøÍѤ·¤¿·Ö¸÷£ØÀþʬÀÏË¡¤Î¸¡Æ¤¡×2011ǯ3·î25-27Æü¡¡ÆüËÜÅ´¹Ý¶¨²ñ Ê¿À®23ǯ Âè161²ó½Õµ¨¹Ö±éÂç²ñ¡ÊÅìµþÅÔ»ÔÂç³Ø¡¢Åìµþ¡Ë¡Ê³ØÀ¸¥Ý¥¹¥¿¡¼¥»¥Ã¥·¥ç¥ó¥¢¥Ö¥¹¥È¥é¥¯¥È½¸ PS-65¡Ë
¹ñºÝ²ñµÄ¤Ç¤Î¾·ÂÔ¡¦°ÍÍê¹Ö±é
Invited talks at international
conferences
[1] K. Tsuji, X-ray Chemical Imaging in Scanning and Projection modes in the laboratory, 59th Annual Conference on Applications of X-ray Analysis Denver X-ray Conference, 2-6 August 2010, Denver, Colorado, USA.
[2] K. Tsuji, Workshop ¡ÈStandards and Advanced Sample Preparation for XRF Analysis¡É Organizer, 59th Annual Conference on Applications of X-ray Analysis Denver X-ray Conference, 2-6 August 2010, Denver, Colorado, USA.
[3] K.
Tsuji, K. Nakano, C. Nishi, T. Nakazawa, Nondestructive elemental depth
profiling by confocal 3D-XRF method in the Laboratory, Workshop; National
Research Center for Geoanalysis, 13-14 September
2010, Beijing, China.
[4] K.
Tsuji, Comparison of analytical performance of 3D-XRF instruments, China 2010
XRS Conference, 15-17 September 2010, Shanghai, China.
¹ñÆâ¤Ç¤Î¾·ÂÔ¡¦°ÍÍê¹Ö±é
Invited talks at domestic
conferences
[1]
ÄÔ ¹¬°ì¡ÖÊü¼ÍÀþȯÀ¸ÁõÃ֤ΰÂÁ´¼è°·¤¤¡Ê¥¨¥Ã¥¯¥¹Àþ¡¢²Ã®´ï¡ËµÚ¤Ó¸¦µæ¤Ë¤ª¤±¤ëÊü¼ÍÀþ¤ÎÍÍÑÀ¡×2010ǯ4·î16Æü
Ê¿À®22ǯÅÙÊü¼ÍÀƱ°Ì¸µÁÇÅù¤Î¼è°·¼Ô¤ËÂФ¹¤ë¶µ°éµÚ¤Ó·±Îý¡ÊÂçºå»ÔΩÂç³Ø¡¢Âçºå¡Ë
[2]
ÄÔ ¹¬°ì¡Ö¹â¶õ´Öʬ²òǽ·Ö¸÷XÀþʬÀÏÁõÃ֤γ«È¯¡×2010ǯ6·î3Æü¡¡Ê¿À®22ǯÅÙJST¥¤¥Î¥Ù¡¼¥·¥ç¥ó¥×¥é¥¶ÂçºåÀ®²ÌÊó¹ð²ñ¡Ê°éÀ®¸¦µæ¡Ë(Âçºå¹ñºÝ²ñµÄ¾ì¡¢Âçºå)
[3]
ÄÔ ¹¬°ì¡Ö3¼¡¸µ·Ö¸÷XÀþʬÀÏÁõÃ֤γ«È¯¤È´Õ¼±»îÎÁʬÀÏÅù¤Ø¤Î±þÍÑ¡×2010ǯ9·î3Æü¡¡Åìµþ¥³¥ó¥Õ¥¡¥ì¥ó¥¹2010ʬÀϼã¼ê¸¦µæ¼Ô´ë²è¡Ö¼ÂºÝ¤ÎºàÎÁ²òÀÏ¡×(ËëÄ¥¥á¥Ã¥»¹ñºÝ²ñµÄ¾ì¡¢ÀéÍÕ)
[4]
ÄÔ ¹¬°ì¡ÖÈù¾®Éô¡¦ÈùÎÌXÀþʬÀϤ˸þ¤±¤Æ¤Î¼è¤êÁȤߡ×2010ǯ11·î17Æü¡¡Âè105²óʬÀϵ»½Ñ¸¦µæ²ñÎã²ñ¡ÊÂçºå»ÔΩÂç³Ø¡¢Âçºå¡Ë
¹ñºÝ²ñµÄ¤Ç¤Î°ìÈֱ̹é
Presentations at international
conferences
[1]
K.
Nakano, K. Tsuji, Nondestructive depth profiling of layered materials and
3D-XRF analysis of biological sample, European Conference on X-ray
Spectrometry, 20-25 June 2010, Figueira da Foz, Coimbra, Portugal (oral).
[2] Y.
Nishida, K. Tsuji, Liquid-Liquid near interface analysis by micro-XRF using
injection needle type collimators, European Conference on X-ray Spectrometry, 20-25 June
2010, Figueira da Foz,
Coimbra, Portugal (poster).
[3]
T.
Nakazawa, K. Nakano, K. Tsuji, Analytical Performance of Newly Developed
2D/3D-XRF Instruments, 59th Annual Conference on Applications
of X-ray Analysis Denver
X-ray Conference, 2-6 August 2010, Denver, Colorado, USA (poster).
[4]
K.
Tsuji, K. Nakano, Development of Micro and 3D XRF Instrument in the Laboratory,
The 10th International Conference on X-ray Microscopy, 15-20 August 2010,
Chicago, Illinois, USA (poster).
[5]
K. Tsuji, K. Nakano, T. Nakazawa,
Development of Confocal 3D-XRF Instrument and Nondestructive Depth Analysis of
Forensic Samples, Pittsburgh Conference on Analytical Chemistry and Applied
Spectroscopy, 13-18 March 2011, Atlanta, Georgia, USA (oral).
2009ǯÅ٤γèÆ°
¡Êfrom April 2009 to March 2010¡Ë
¹ñÆâ¤Ç¤Î³Ø²ñȯɽ¤Ê¤É
Presentations at conferences in
Japan
[1]
ÀîËô À¿Ìé¡¢ÃæÌî ÏÂɧ¡¢ÄÔ ¹¬°ì¡Ö´á¶ñɽÌÌÁؤÎͳ²¶â°¸µÁǤʤɤηָ÷XÀþʬÀÏ¡×2009ǯ5·î16¡Ý17Æü¡¡Âè70²óʬÀϲ½³Ø²ñƤÏÀ²ñ¡Êϲλ³Âç³Ø±É륥ã¥ó¥Ñ¥¹¡¢Ï²λ³¡Ë¡Ê¸ýƬ¡Ë
[2]
ÃæÌî ÏÂɧ¡¢ºäÅì ÆÆ¡¢Âçß· À¡¿Í¡¢¶ðë ¿µÂÀϺ¡¢Æ⸶ Çî¡¢ÄÔ ¹¬°ì¡Ö¶¦¾ÇÅÀ·¿»°¼¡¸µ·Ö¸÷XÀþʬÀϤδĶ»ñÎÁ¤Ø¤Î±þÍÑ¡×2009ǯ5·î16¡Ý17Æü¡¡Âè70²óʬÀϲ½³Ø²ñƤÏÀ²ñ¡Êϲλ³Âç³Ø±É륥ã¥ó¥Ñ¥¹¡¢Ï²λ³¡Ë¡Ê¸ýƬ¡Ë
[3]
ÃæÄ® ÏÂÃË¡¢ÃæÌî ÏÂɧ¡¢Âçß· À¡¿Í¡¢¶ðë
¿µÂÀϺ¡¢ºäÅì ÆÆ¡¢Æ⸶ Çî¡¢ÄÔ ¹¬°ì¡ÖÊ£¹ç·¿£ØÀþ¸÷³ØÁǻҤˤè¤ëÈù¾®Éô·Ö¸÷£ØÀþʬÀÏÁõÃ֤λîºî¡×2009ǯ5·î16¡Ý17Æü¡¡Âè70²óʬÀϲ½³Ø²ñƤÏÀ²ñ¡Êϲλ³Âç³Ø±É륥ã¥ó¥Ñ¥¹¡¢Ï²λ³¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[4]
À¾ÅÄ µÈɧ¡¢ÄÔ ¹¬°ì¡ÖÃí¼Í¿Ë·¿¥³¥ê¥á¡¼¥¿¡½¤òÍѤ¤¤¿·Ö¸÷XÀþʬÀÏÁõÃ֤λîºîµÚ¤ÓÉå¿©¥×¥í¥»¥¹¤Î¥â¥Ë¥¿¥ê¥ó¥°¡×2009ǯ5·î16¡Ý17Æü¡¡Âè70²óʬÀϲ½³Ø²ñƤÏÀ²ñ¡Êϲλ³Âç³Ø±É륥ã¥ó¥Ñ¥¹¡¢Ï²λ³¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[5] À¾ÅÄ µÈɧ¡¢µÜ³À ͵»Ö¡¢ÄÔ ¹¬°ì¡ÖÁ´È¿¼Í·Ö¸÷£ØÀþʬÀϤΤ¿¤á¤ÎÈù¾¯ÎÌÍϱեµ¥ó¥×¥ê¥ó¥°ÊýË¡¤Î¸¡Æ¤¡×2009ǯ9·î24¡Ý26Æü¡¡ÆüËÜʬÀϲ½³Ø²ñÂè58ǯ²ñin»¥ËÚ¡ÊË̳¤Æ»Âç³Ø¹âÅù¶µ°éµ¡Ç½³«È¯Áí¹ç¥»¥ó¥¿¡¼¡¢Ë̳¤Æ»¡Ë¡Ê¸ýƬ¡Ë
[6]
»³¸ý ¾ð¡¢Â翹 ¿ò»Ë¡¢ÄÔ ¹¬°ì¡Ö¥Ý¥ê¥¥ã¥Ô¥é¥ê¡¼¸÷³ØÁǻҤˤè¤ëXÀþ¥¨¥Í¥ë¥®¡¼¥Õ¥£¥ë¥¿¡¼¥ê¥ó¥°ÆÃÀ¡×2009ǯ9·î24¡Ý26Æü¡¡ÆüËÜʬÀϲ½³Ø²ñÂè58ǯ²ñin»¥ËÚ¡ÊË̳¤Æ»Âç³Ø¹âÅù¶µ°éµ¡Ç½³«È¯Áí¹ç¥»¥ó¥¿¡¼¡¢Ë̳¤Æ»¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[7]
º£À¾ ͳµª»Ò¡¢À¾ÅÄ µÈɧ¡¢°Àº¬ Å°¡¢ÃæÌî ÏÂɧ¡¢ÄÔ ¹¬°ì¡Ö´á¶ñɽÌÌÁؤÎÈù¾®Éô·Ö¸÷XÀþʬÀϤȤ½¤ÎÍϽбդλþ´Ö°Í¸·¿Á´È¿¼Í·Ö¸÷XÀþʬÀÏ¡×2009ǯ9·î24¡Ý26Æü¡¡ÆüËÜʬÀϲ½³Ø²ñÂè58ǯ²ñin»¥ËÚ¡ÊË̳¤Æ»Âç³Ø¹âÅù¶µ°éµ¡Ç½³«È¯Áí¹ç¥»¥ó¥¿¡¼¡¢Ë̳¤Æ»¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[8] ÄÔ ¹¬°ì¡¢ÅÄÉô ½ß»Ì¡¢ÃæÌî ÏÂɧ¡Ö¶¦¾ÇÅÀ·¿£³¼¡¸µ·Ö¸÷XÀþʬÀϤˤª¤±¤ë¶õ´Öʬ²òǽ¤Î¸þ¾å¤Ë¤Ä¤¤¤Æ¡×2009ǯ9·î24¡Ý26Æü¡¡ÆüËÜʬÀϲ½³Ø²ñÂè58ǯ²ñin»¥ËÚ¡ÊË̳¤Æ»Âç³Ø¹âÅù¶µ°éµ¡Ç½³«È¯Áí¹ç¥»¥ó¥¿¡¼¡¢Ë̳¤Æ»¡Ë¡Ê¸ýƬ¡Ë
[9]
ÃæÌî ÏÂɧ¡¢ÃæÄ® ÏÂÃË¡¢Âçß· À¡¿Í¡¢ºäÅì ÆÆ¡¢¶ðë ¿µÂÀϺ¡¢Æ⸶ Çî¡¢ÄÔ ¹¬°ì¡Ö¥¥ã¥Ô¥é¥ê¡¼XÀþ½¸¸÷ÁǻҤòÍѤ¤¤¿¹âµ±ÅÙ¥Þ¥¤¥¯¥íXÀþ¥Ó¡¼¥à¤ÎºîÀ®¡×2009ǯ9·î24¡Ý26Æü¡¡ÆüËÜʬÀϲ½³Ø²ñÂè58ǯ²ñin»¥ËÚ¡ÊË̳¤Æ»Âç³Ø¹âÅù¶µ°éµ¡Ç½³«È¯Áí¹ç¥»¥ó¥¿¡¼¡¢Ë̳¤Æ»¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[10] À¾ÅÄ µÈɧ¡¢µÜ³À Í´»Ö¡¢ÄÔ
¹¬°ì¡ÖÈù¾¯ÎÌÍϱեµ¥ó¥×¥ê¥ó¥°¤ÈÁ´È¿¼Í·Ö¸÷XÀþʬÀÏ¡×2009ǯ11·î5¡Ý6Æü¡¡Âè45²óXÀþʬÀÏƤÏÀ²ñ¡ÊÂçºå»ÔΩÂç³Ø³Ø½Ñ¾ðÊóÁí¹ç¥»¥ó¥¿¡¼¡Ë¡Ê¸ýƬ¡Ë
[11] »³¸ý ¾ð¡¢ÄÔ ¹¬°ì¡Ö¥Ý¥ê¥¥ã¥Ô¥é¥ê¡¼¸÷³ØÁǻҤÎXÀþ¥¨¥Í¥ë¥®¡¼¥Õ¥£¥ë¥¿¥ê¥ó¥°ÆÃÀ¤òÍøÍѤ·¤¿XÀþ²½³Ø¥¤¥á¡¼¥¸¥ó¥°¡×2009ǯ11·î5¡Ý6Æü¡¡Âè45²óXÀþʬÀÏƤÏÀ²ñ¡ÊÂçºå»ÔΩÂç³Ø³Ø½Ñ¾ðÊóÁí¹ç¥»¥ó¥¿¡¼¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[12] º£À¾ ͳµª»Ò¡¢À¾ÅÄ µÈɧ¡¢°Àº¬
Å°¡¢ÃæÌî ÏÂɧ¡¢ÄÔ ¹¬°ì¡Ö´á¶ñɽÌÌÁؤÎÈù¾®Éô·Ö¸÷XÀþʬÀϤȤ½¤ÎÍÏ½Ð¥×¥í¥»¥¹¤ÎÁ´È¿¼Í·Ö¸÷XÀþʬÀÏ¡×2009ǯ11·î5¡Ý6Æü¡¡Âè45²óXÀþʬÀÏƤÏÀ²ñ¡ÊÂçºå»ÔΩÂç³Ø³Ø½Ñ¾ðÊóÁí¹ç¥»¥ó¥¿¡¼¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[13] ÃæÄ® ÏÂÃË¡¢ÃæÌî ÏÂɧ¡¢Âçß·
À¡¿Í¡¢¶ðë ¿µÂÀϺ¡¢ºäÅì ÆÆ¡¢Æ⸶ Çî¡¢ÄÔ ¹¬°ì¡ÖÊ£¹ç·¿XÀþ¸÷³ØÁǻҤˤè¤ëÈù¾®Éô·Ö¸÷XÀþʬÀÏÁõÃ֤βþÎÉ¡×2009ǯ11·î5¡Ý6Æü¡¡Âè45²óXÀþʬÀÏƤÏÀ²ñ¡ÊÂçºå»ÔΩÂç³Ø³Ø½Ñ¾ðÊóÁí¹ç¥»¥ó¥¿¡¼¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[14] ÃæÌî ÏÂɧ¡¢Âçß· À¡¿Í¡¢ºäÅì
ÆÆ¡¢¶ðë ¿µÂÀϺ¡¢Æ⸶ Çî¡¢ÄÔ ¹¬°ì¡Ö¹â¶õ´Öʬ²òǽ·¿¶¦¾ÇÅÀ3¼¡¸µ·Ö¸÷XÀþʬÀϤˤè¤ëɽÌ̶á˵¤ÎÈóÇ˲õ¿¼¤µÊý¸þʬÀÏ¡×2009ǯ11·î5¡Ý6Æü¡¡Âè45²óXÀþʬÀÏƤÏÀ²ñ¡ÊÂçºå»ÔΩÂç³Ø³Ø½Ñ¾ðÊóÁí¹ç¥»¥ó¥¿¡¼¡Ë¡Ê¸ýƬ¡Ë
[15] ÄÔ ¹¬°ì¡Ö¿·µ¬¤Ç´ÊÊؤʷָ÷XÀþ¥¤¥á¡¼¥¸¥ó¥°µ»½Ñ¡¢ÁõÃÖ¡×2010ǯ1·î14Æü¡¡Âçºå»ÔΩÂç³Ø¥Ë¥å¡¼¥Æ¥¯¥Î¥¬¥¤¥É2010¡ÊÂçºå»º¶ÈÁϤ´Û¡¢Âçºå¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[16] ÄÔ ¹¬°ì¡¢ÃæÌî ÏÂɧ¡Ö¹â¶õ´Öʬ²òǽ·¿3¼¡¸µ·Ö¸÷£ØÀþʬÀÏÁõÃÖ¡×2010ǯ2·î12Æü¡¡Ê¿À®21ǯÅÙÂçºå»ÔΩÂç³Ø½ÅÅÀ¸¦µæ¡Ö¥Ò¥å¡¼¥Þ¥ó¥¢¥À¥×¥Æ¥£¥Ö¡¦¥Þ¥Æ¥ê¥¢¥ë¤Î³«Âó¡×Âè5²ó¥·¥ó¥Ý¥¸¥¦¥à¡ÊÂçºå»ÔΩÂç³Ø³Ø½Ñ¾ðÊóÁí¹ç¥»¥ó¥¿¡¼10³¬¡¢Âçºå¡Ë¡Ê¸ýƬ¡Ë¡¡
[17] Â翹 ¿ò»Ë¡¢»³¸ý ¾ð¡¢ÄÔ ¹¬°ì¡ÖÆ󼡸µÊ¬¸÷ÁǻҤòÍѤ¤¤¿Åê±Æ·¿·Ö¸÷XÀþ¸µÁÇ¥¤¥á¡¼¥¸¥ó¥°Ë¡¤Î³«È¯¡×2010ǯ2·î12Æü¡¡Ê¿À®21ǯÅÙÂçºå»ÔΩÂç³Ø½ÅÅÀ¸¦µæ¡Ö¥Ò¥å¡¼¥Þ¥ó¥¢¥À¥×¥Æ¥£¥Ö¡¦¥Þ¥Æ¥ê¥¢¥ë¤Î³«Âó¡×Âè5²ó¥·¥ó¥Ý¥¸¥¦¥à¡ÊÂçºå»ÔΩÂç³Ø³Ø½Ñ¾ðÊóÁí¹ç¥»¥ó¥¿¡¼10³¬¡¢Âçºå¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë¡¡
[18] µÜ³À Í´»Ö¡¢ÃæÌî ÏÂɧ¡¢ÄÔ ¹¬°ì¡Ö¥È¥é¥ó¥¹¥Ý¡¼¥¿¥Ö¥ëÈù¾®Éô·Ö¸÷XÀþʬÀÏÁõÃ֤βþÎÉ¡×2010ǯ2·î12Æü¡¡Ê¿À®21ǯÅÙÂçºå»ÔΩÂç³Ø½ÅÅÀ¸¦µæ¡Ö¥Ò¥å¡¼¥Þ¥ó¥¢¥À¥×¥Æ¥£¥Ö¡¦¥Þ¥Æ¥ê¥¢¥ë¤Î³«Âó¡×Âè5²ó¥·¥ó¥Ý¥¸¥¦¥à¡ÊÂçºå»ÔΩÂç³Ø³Ø½Ñ¾ðÊóÁí¹ç¥»¥ó¥¿¡¼10³¬¡¢Âçºå¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[19] ÅÄÉô ½ß»Ì¡¢ÃæÌî ÏÂɧ¡¢ÄÔ ¹¬°ì¡Ö¶¦¾ÇÅÀ·¿3¼¡¸µ·Ö¸÷XÀþʬÀÏÁõÃ֤θ¡½Ð²¼¸Â¤Îɾ²Á¤ª¤è¤Ó³¨²è»îÎÁ¤Ø¤Î±þÍÑ¡×2010ǯ2·î12Æü¡¡Ê¿À®21ǯÅÙÂçºå»ÔΩÂç³Ø½ÅÅÀ¸¦µæ¡Ö¥Ò¥å¡¼¥Þ¥ó¥¢¥À¥×¥Æ¥£¥Ö¡¦¥Þ¥Æ¥ê¥¢¥ë¤Î³«Âó¡×Âè5²ó¥·¥ó¥Ý¥¸¥¦¥à¡ÊÂçºå»ÔΩÂç³Ø³Ø½Ñ¾ðÊóÁí¹ç¥»¥ó¥¿¡¼10³¬¡¢Âçºå¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
¹ñºÝ²ñµÄ¤Ç¤Î¾·ÂÔ¡¦°ÍÍê¹Ö±é
Invited talks at international
conferences
[1] K.
Tsuji, K. Nakamachi, K. Nakano, Improvement of spatial
resolution in 2D and 3D X-ray fluorescence analysis, 36th CSI, 31
Aug.- 3 Sep. 2009, Budapest, Hungary (Keynote lecture)
[2] K. Tsuji, K. Nakano, Micro and Trace X-ray Fluorescence Analysis in
Laboratory, FACSS2009, 18-22 October 2009, Louisville, KY, USA (oral).
¹ñÆâ¤Ç¤Î¾·ÂÔ¡¦°ÍÍê¹Ö±é
Invited talks at domestic
conferences
[1]
ÄÔ ¹¬°ì¡ÖXÀþ¤òÍøÍѤ·¤¿Ê¬ÀϬÄêʬÌî¤ÎÀèüµ»½Ñ¤È¸¦µæÆ°¸þ¡×¡¢Âè2²óNEDO¸÷½¸ÀÑ¥é¥Ü¥é¥È¥ê¡¼¸ø³«¥»¥ß¥Ê¡¼¡¢2009ǯ4·î17Æü¡Ê¶â¡Ë13:15¡Ý16:30¡¢¡ÊµþÅÔÂç³Ø·Ë¥¥ã¥ó¥Ñ¥¹¥í¡¼¥àµÇ°´Û3F¥»¥ß¥Ê¡¼¼¼¡¢µþÅÔ»Ô¡Ë
[2]
ÄÔ ¹¬°ì¡¢Êü¼ÍÀþȯÀ¸ÁõÃ֤ΰÂÁ´¼è°·¤Ë¤Ä¤¤¤Æ¤Î¹ÖµÁ¡¢Êü¼ÍÀƱ°Ì¸µÁÇÅù¤Î¼è°·¼Ô¤ËÂФ¹¤ë¶µ°éµÚ¤Ó·±Îý¡¢2009ǯ4·î17Æü¡Ê¶â¡Ë9:00¡Ý12:00¡¢¡ÊÂçºå»ÔΩÂç³Ø³Ø½Ñ¾ðÊóÁí¹ç¥»¥ó¥¿¡¼10³¬¡¡²ñµÄ¼¼L¡Ë
[3]
ÄÔ ¹¬°ì¡Ö·Ö¸÷£ØÀþ¥¤¥á¡¼¥¸¥ó¥°µ»½Ñ¡×¡¢ÂçºåÉÜΩÂç³Ø¡¦Âçºå»ÔΩÂç³Ø ¿·µ»½ÑÀâÌÀ²ñ¡¢2009ǯ7·î1Æü¡Ê¿å¡Ë¡Ý3Æü¡Ê¶â¡Ë¡¢¡Ê²Ê³Øµ»½Ñ¿¶¶½µ¡¹½ JST¥Û¡¼¥ë¡¢Åìµþ¡Ë
[4]
ÄÔ ¹¬°ì¡Ö¿·µ¬¤Ç´ÊÊؤʷָ÷XÀþ¥¤¥á¡¼¥¸¥ó¥°µ»½Ñ¡¢ÁõÃ֤γ«È¯¡×¡¢JST¥¤¥Î¥Ù¡¼¥·¥ç¥ó¡¦¥¸¥ã¥Ñ¥ó2009¡ÝÂç³Ø¸«Ëܻԡ¢2009ǯ9·î16Æü¡½18Æü¡ÊÅìµþ¹ñºÝ¥Õ¥©¡¼¥é¥à¡Ë
[5] ÄÔ ¹¬°ì¡ÖÈù¾®Éô¡Ê£³£Ä¡Ë·Ö¸÷£ØÀþʬÀÏÁõÃ֤γ«È¯¡×2009ǯ12·î21¡Ý22Æü¡¡ÅìËÌÂç³Ø¶â°ºàÎÁ¸¦µæ½ê¥ï¡¼¥¯¥·¥ç¥Ã¥×¡¡¥ï¡¼¥¯¥·¥ç¥Ã¥×¸¦µæ¥Æ¡¼¥Þ¡¡"¿·ÁǺ೫ȯ¤È¹©ÄøÀ©¸æ¡¦ÉʼÁ´ÉÍý¤Ë¸þ¤±¤¿Ê¬ÀÏ¡¦²òÀϵ»½Ñ¤Î¿ÊŸ"¡ÊÅìËÌÂç³Ø¶â°ºàÎÁ¸¦µæ½ê£²¹æ´Û¹ÖƲ¡¢µÜ¾ë¡Ë¡Ê¸ýƬ¡Ë
¹ñºÝ²ñµÄ¤Ç¤Î°ìÈֱ̹é
Presentations at international
conferences
[1]
K. Tsuji, M.
Yamaguchi, and T. Yonehara, X-ray Energy Filtering by
Using Total Reflection in Polycapillary X-ray Optics,
TXRF2009 Conference, 15-19 June 2009,Gothenburg, Sweden (oral).
[2]
T.Awane, S. Fukuoka,
K. Nakano, K. Tsuji, Grazing Exit Micro XRF Analysis of Harzardous
Comtaminations on a Plant Leaf, TXRF2009 Conference,
15-19 June 2009,Gothenburg, Sweden (poster).
[3]
K. Tsuji, M. Kawamata, and K. Nakano, TXRF AND MICRO-XRF ANALYSIS OF PLASTIC
TOYS AND SOILS, 58th Annual Conference on Applications of X-ray
Analysis Denver X-ray Conference, 27-31 July 2009, Colorado Springs, Colorado,
USA (oral).
[4]
K. Nakano, M. Kawamata,
and K. Tsuji, TXRF Analysis of Multiple Droplet Residues, 58th
Annual Conference on Applications of X-ray Analysis Denver X-ray Conference,
27-31 July 2009, Colorado Springs, Colorado, USA (oral).
2008ǯÅ٤γèÆ°
¡Êfrom April 2008 to March 2009¡Ë
¹ñÆâ¤Ç¤Î³Ø²ñȯɽ¤Ê¤É
Presentations at conferences in
Japan
[1]
¾¾°æ ¹¨¡¢ÀîËô À¿Ìé¡¢¹ÓÇÈ °ì»Ë¡¢À¶¿å ͺ°ìϺ¡¢»³ÅÄ Î´¡¢ÆüÌî ²íÇ·¡¢ÄÔ ¹¬°ì¡Ö·ì±ÕÃæ¶â°¸µÁǤο×®Á´È¿¼Í·Ö¸÷£ØÀþʬÀÏ¡×2008ǯ5·î15¡Ý16Æü¡¡Âè69²óÆüËÜʬÀϲ½³Ø²ñƤÏÀ²ñ¡Ê̾¸Å²°¹ñºÝ²ñµÄ¾ì¡¢°¦ÃΡË
[2]
ÃæÌî ÏÂɧ¡¢¾¾ÅÄ ¹¸Åµ¡¢¶ðë ¿µÂÀϺ¡¢Âçß· À¡¿Í¡¢ºäÅì ÆÆ¡¢Æ⸶ Çî¡¢ÄÔ ¹¬°ì¡ÖÈù¾®Éô·Ö¸÷£ØÀþʬÀϤΤ¿¤á¤ÎÊ£¹ç·¿£ØÀþ½¸¸÷ÁǻҤλîºî¡×2008ǯ5·î15¡Ý16Æü¡¡Âè69²óÆüËÜʬÀϲ½³Ø²ñƤÏÀ²ñ¡Ê̾¸Å²°¹ñºÝ²ñµÄ¾ì¡¢°¦ÃΡË
[3]
ÃæÌî ÏÂɧ¡¢Âçµ×ÊÝ ·òÂÀ¡¢ÄÔ ¹¬°ì¡ÖÅ·Á³¹âʬ»Ò¤òÍѤ¤¤¿·Ö¸÷£ØÀþʬÀÏË¡¤Î¤¿¤á¤Î´Ä¶¿å»îÎÁ¤Î¹âÅÙÇ»½ÌË¡¤Î¸¡Æ¤¡×2008ǯ5·î15¡Ý16Æü¡¡Âè69²óÆüËÜʬÀϲ½³Ø²ñƤÏÀ²ñ¡Ê̾¸Å²°¹ñºÝ²ñµÄ¾ì¡¢°¦ÃΡË
[4]
ÃæÌî ÏÂɧ¡¢¿åÊ¿ ³Ø¡¢¾¾ÅÄ ¸»Î¡¢ÄÔ ¹¬°ì¡Ö¿©ºàÃæÈùÎ̶â°ÄêÎÌÍÑ·Ö¸÷£ØÀþʬÀÏÍÑɸ½àʪ¼Á¤Î³«È¯¡¦Âè2Êó¡×2008ǯ5·î15¡Ý16Æü¡¡Âè69²óÆüËÜʬÀϲ½³Ø²ñƤÏÀ²ñ¡Ê̾¸Å²°¹ñºÝ²ñµÄ¾ì¡¢°¦ÃΡË
[5]
¾¡°æ ·Ä»Ò¡¢ÄÔ ¹¬°ì¡Ö¿¢Êª»ñÎÁ¤Ë¤ª¤±¤ë¸µÁÇ°ÜÆ°²áÄø¤Î·Ö¸÷£ØÀþ´Ñ»¡¼Â¸³¡×2008ǯ5·î15¡Ý16Æü¡¡Âè69²óÆüËÜʬÀϲ½³Ø²ñƤÏÀ²ñ¡Ê̾¸Å²°¹ñºÝ²ñµÄ¾ì¡¢°¦ÃΡË
[6]
×¢À¥ ¹¬ÈÏ¡¢¹©Æ£ ½¤°ì¡¢Â¼Ãæ À¿»Ö¡¢À¶¿å ·ò°ì¡¢ÄÔ ¹¬°ì¡ÖSEM¤òÍѤ¤¤¿CuÈùºÙÇÛÀþ·ë¾½Àɾ²Áµ»½Ñ¡×2008ǯ5·î21¡Ý23Æü¡¡¼ÒÃÄË¡¿ÍÆüËܸ²Èù¶À³Ø²ñÂè64²ó³Ø½Ñ¹Ö±é²ñJSM-2008¡Ê¹ñΩµþÅÔ¹ñºÝ²ñ´Û¡¢µþÅÔ¡Ë
[7]
ÃæÌî ÏÂɧ¡¢À¾ÅÄ µÈɧ¡¢ÄÔ ¹¬°ì¡ÖÍϱդª¤è¤Ó±Õ¡Ý±Õ³¦Ì̶á˵¤ÎÈù¾®Éô·Ö¸÷XÀþʬÀÏ¡×2008ǯ9·î10¡Ý12Æü¡¡ÆüËÜʬÀϲ½³Ø²ñÂè57ǯ²ñ¡ÊÊ¡²¬Âç³Ø¼··¨¥¥ã¥ó¥Ñ¥¹¡¢Ê¡²¬¡Ë
[8]
ÊƸ¶ Íã¡¢¿¥ÅÄ ÂçÊå¡¢ÃæÌî ÏÂɧ¡¢ÄÔ ¹¬°ì¡Ö¾®·¿Èù¾®Éô·Ö¸÷XÀþʬÀÏÁõÃ֤γ«È¯¡×2008ǯ9·î10¡Ý12Æü¡¡ÆüËÜʬÀϲ½³Ø²ñÂè57ǯ²ñ¡ÊÊ¡²¬Âç³Ø¼··¨¥¥ã¥ó¥Ñ¥¹¡¢Ê¡²¬¡Ë
[9]
À¾ÅÄ µÈɧ¡¢ÃæÌî ÏÂɧ¡¢ÄÔ ¹¬°ì¡Ö·Ö¸÷XÀþʬÀÏË¡¤Ë¤è¤ë±Õ±Õ³¦ÌÌ¡¦¸Ç±Õ³¦Ì̶á˵¤Î¸µÁÇʬÉÛ¬Äê¡×2008ǯ9·î10¡Ý12Æü¡¡ÆüËÜʬÀϲ½³Ø²ñÂè57ǯ²ñ¡ÊÊ¡²¬Âç³Ø¼··¨¥¥ã¥ó¥Ñ¥¹¡¢Ê¡²¬¡Ë
[10] ÄÔ ¹¬°ì¡¢Ãæ¼ ÂîÌé¡¢ÀîËô À¿Ìé¡¢¹ÓÇÈ °ì»Ë¡¢»³ÅÄ Î´¡Ö·ì±ÕÅùÀ¸ÂδØÏ¢»îÎÁÃæ¤Î¶â°¸µÁǤο×®Á´È¿¼Í·Ö¸÷XÀþʬÀÏ¡×2008ǯ9·î3¡Ý5Æü¡¡2008ʬÀÏŸ¡¡Åìµþ¥³¥ó¥Õ¥¡¥ì¥ó¥¹2008¡ÊËëÄ¥¥á¥Ã¥»¹ñºÝ²ñµÄ¾ì¡¢ÀéÍÕ¡Ë
[11] ÀîËô À¿Ìé¡¢ÄÔ ¹¬°ì¡ÖÈù¾®ÉôÁ´È¿¼Í·Ö¸÷XÀþʬÀÏË¡¤Ë¤è¤ëƱ°ì´ðÈľåÊ£¿ô»îÎÁ¤Î¿×®ʬÀÏ¡×2008ǯ10·î18¡Ý19Æü¡¡Âè44²óXÀþʬÀÏƤÏÀ²ñ¡ÊÆüËܽ÷»ÒÂç³Ø¡¢Åìµþ¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[12] ÀîËô À¿Ìé¡¢Ãæ¼ ÂîÌé¡¢ÄÔ ¹¬°ì¡¢¹ÓÇÈ °ì»Ë¡¢»³ÅÄ Î´¡¢ÊÒ»³ µ®»Ò¡¢ÆüÌî ²íÇ·¡¢ÏÌÞ¼ ±Ñµ¡¡Ö·ì±ÕÃæ¶â°¸µÁǤÎÁ´È¿¼Í·Ö¸÷XÀþ¿×®ʬÀÏ¡×2008ǯ10·î18¡Ý19Æü¡¡Âè44²óXÀþʬÀÏƤÏÀ²ñ¡ÊÆüËܽ÷»ÒÂç³Ø¡¢Åìµþ¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë¡¡
[13] Ê¡²¬ ¿µÂÀϺ¡¢°Àº¬ Å°¡¢ÄÔ ¹¬°ì¡ÖÈù¾®Éô¼Ð½Ð¼Í·Ö¸÷XÀþʬÀÏË¡¤òÍѤ¤¤¿¿¼¤µÊý¸þʬÀÏ¡×2008ǯ10·î18¡Ý19Æü¡¡Âè44²óXÀþʬÀÏƤÏÀ²ñ¡ÊÆüËܽ÷»ÒÂç³Ø¡¢Åìµþ¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[14] ÊƸ¶ Íã¡¢¿¥ÅÄ ÂçÊå¡¢ÃæÌî ÏÂɧ¡¢ÄÔ ¹¬°ì¡ÖʬÀÏ»ëÌîÀ©¸Â·¿¤Î¾®·¿Èù¾®Éô·Ö¸÷XÀþʬÀÏÁõÃ֤γ«È¯¡×2008ǯ10·î18¡Ý19Æü¡¡Âè44²óXÀþʬÀÏƤÏÀ²ñ¡ÊÆüËܽ÷»ÒÂç³Ø¡¢Åìµþ¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[15] ÊƸ¶ Íã¡¢»³¸ý ¾ð¡¢ÄÔ ¹¬°ì¡Ö¥Ý¥ê¥¥ã¥Ô¥é¥ê¡¼XÀþ¸÷³ØÁǻҤòÍѤ¤¤ë¥¨¥Í¥ë¥®¡¼¥Õ¥£¥ë¥¿¡¼ÆÃÀ¡×2008ǯ10·î18¡Ý19Æü¡¡Âè44²óXÀþʬÀÏƤÏÀ²ñ¡ÊÆüËܽ÷»ÒÂç³Ø¡¢Åìµþ¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[16] ÃæÄ® ÏÂÃË¡¢ÃæÌî ÏÂɧ¡¢ÄÔ ¹¬°ì¡¢Âçß· À¡¿Í¡¢ºäÅì ÆÆ¡¢¶ðë ¿µÂÀϺ¡¢Æ⸶ Çî¡ÖÊ£¹ç·¿£ØÀþ¸÷³ØÁǻҤˤè¤ëÈù¾®Éô·Ö¸÷£ØÀþʬÀÏÁõÃ֤γ«È¯¡×2008ǯ10·î18¡Ý19Æü¡¡Âè44²óXÀþʬÀÏƤÏÀ²ñ¡ÊÆüËܽ÷»ÒÂç³Ø¡¢Åìµþ¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[17] À¾ÅÄ µÈɧ¡¢ÄÔ ¹¬°ì¡Ö¥Ë¡¼¥É¥ë·¿¥³¥ê¥á¡¼¥¿¡¼¤òÍѤ¤¤¿±Õ±Õ³¦Ì̶á˵¤Î·Ö¸÷XÀþʬÀÏ¡×2008ǯ10·î18¡Ý19Æü¡¡Âè44²óXÀþʬÀÏƤÏÀ²ñ¡ÊÆüËܽ÷»ÒÂç³Ø¡¢Åìµþ¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[18] ÃæÌî ÏÂɧ¡¢ÄÔ ¹¬°ì¡¢Âçß· À¡¿Í¡¢ºäÅì ÆÆ¡¢¶ðë ¿µÂÀϺ¡¢Æ⸶ Çî¡ÖÆ󼡸µ¤ª¤è¤Ó»°¼¡¸µ·Ö¸÷£ØÀþʬÀÏË¡¤ÎÍϱջîÎÁ¤Ø¤Î±þÍÑ¡×2008ǯ10·î18¡Ý19Æü¡¡Âè44²óXÀþʬÀÏƤÏÀ²ñ¡ÊÆüËܽ÷»ÒÂç³Ø¡¢Åìµþ¡Ë(¸ýƬ)
[19] ÊƸ¶ Íã¡¢ÃæÌî ÏÂɧ¡¢ÄÔ ¹¬°ì¡Ö¾®·¿Èù¾®Éô·Ö¸÷ÀþʬÀÏÁõÃ֤γ«È¯¤È±þÍÑÎã¡×2008ǯ10·î30Æü¡¡ÆÈΩ¹ÔÀ¯Ë¡¿ÍÆüËܳؽѿ¶¶½²ñ¡¡À½¹ÝÂè19°Ñ°÷²ñ¡¡À½¹Ý·×¬²½³Ø¸¦µæ²ñ¡ÊÅìµþÂç³ØÀ¸»ºµ»½Ñ¸¦µæ½ê¡¢Åìµþ¡Ë¡Ê¸ýƬ¡Ë
[20] ÄÔ ¹¬°ì¡¢À¾ÅÄ µÈɧ¡¢ÃæÌî ÏÂɧ¡Ö¿åÍϱÕÃæ¤ÎÈù¾®Éô·Ö¸÷XÀþʬÀÏ¡×2009ǯ2·î12Æü¡¡Ê¿À®20ǯÅÙÂçºå»ÔΩÂç³Ø½ÅÅÀ¸¦µæ¡Ö¥Ò¥å¡¼¥Þ¥ó¥¢¥À¥×¥Æ¥£¥Ö¡¦¥Þ¥Æ¥ê¥¢¥ë¤Î³«Âó¡×Âè4²ó¥·¥ó¥Ý¥¸¥¦¥à¡ÊÂçºå»ÔΩÂç³Ø³Ø½Ñ¾ðÊóÁí¹ç¥»¥ó¥¿¡¼10³¬¡¢Âçºå¡Ë¡Ê¸ýƬ¡Ë
[21] Ãæ¼ ÂîÌé¡¢ÀîËô À¿Ìé¡¢ÄÔ ¹¬°ì¡ÖÁ´È¿¼Í·Ö¸÷XÀþʬÀÏË¡¤Ë¤è¤ëÀ¸ÂδØÏ¢»îÎÁÃæ¶â°¸µÁǤÎÈùÎÌʬÀÏ¡×2009ǯ2·î12Æü¡¡Ê¿À®20ǯÅÙÂçºå»ÔΩÂç³Ø½ÅÅÀ¸¦µæ¡Ö¥Ò¥å¡¼¥Þ¥ó¥¢¥À¥×¥Æ¥£¥Ö¡¦¥Þ¥Æ¥ê¥¢¥ë¤Î³«Âó¡×Âè4²ó¥·¥ó¥Ý¥¸¥¦¥à¡ÊÂçºå»ÔΩÂç³Ø³Ø½Ñ¾ðÊóÁí¹ç¥»¥ó¥¿¡¼10³¬¡¢Âçºå¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
[22] ¿¥ÅÄ ÂçÊå¡¢ÊƸ¶ Íã¡¢ÃæÌî ÏÂɧ¡¢ÄÔ ¹¬°ì¡Ö¥È¥é¥ó¥¹¥Ý¡¼¥¿¥Ö¥ëÈù¾®Éô·Ö¸÷XÀþʬÀÏÁõÃ֤γ«È¯¤È±þÍÑ¡×2009ǯ2·î12Æü¡¡Ê¿À®20ǯÅÙÂçºå»ÔΩÂç³Ø½ÅÅÀ¸¦µæ¡Ö¥Ò¥å¡¼¥Þ¥ó¥¢¥À¥×¥Æ¥£¥Ö¡¦¥Þ¥Æ¥ê¥¢¥ë¤Î³«Âó¡×Âè4²ó¥·¥ó¥Ý¥¸¥¦¥à¡ÊÂçºå»ÔΩÂç³Ø³Ø½Ñ¾ðÊóÁí¹ç¥»¥ó¥¿¡¼10³¬¡¢Âçºå¡Ë¡Ê¥Ý¥¹¥¿¡¼¡Ë
¹ñºÝ²ñµÄ¤Ç¤Î¾·ÂÔ¡¦°ÍÍê¹Ö±é
Invited talks at international
conferences
[1] K. Tsuji, M. Yamaguchi, T. Yonehara, Feasibility of X-ray
Energy Filtering by using Polycapillary X-ray Optics, INFN ELOISATRON Project
The 51st Workshop: ¡ÈChanneling
2008¡È Charged and Neutral Particles Channeling Phenomena, 25 October-1
November, 2008, Erice (Trapani), Italy (oral).
[2] K.
Tsuji, K. Nakano, Trace and Micro XRF analysis in the Laboratory, The 7th
Chinese X-Ray Spectrometry Conference, 20-25 October, 2008, Sanya
(Hainan Province), Chaina (oral).
[3] K.
Tsuji, Applications of Glow Discharge Plasma and Micro X-ray Fluorescence
Analysis, The International Expert Meeting on GDS, 25 November, 2008, Keio
University Hiyoshi Campus, Japan (oral).
¹ñÆâ¤Ç¤Î¾·ÂÔ¡¦°ÍÍê¹Ö±é
Invited talks at domestic
conferences
[1]
ÄÔ ¹¬°ì¡Ö·Ö¸÷£ØÀþʬÀϤˤè¤ë´Ä¶»îÎÁÃæ¤Îͳ²¸µÁǤάÄê¡ÝRoHS¡¢ÅÚ¾í±øÀ÷ÂкöËÉ»ßË¡¤Ø¤ÎÂбþ¡Ý¡×¡¢Âè3²óÂçºå»ÔΩÂç³Ø»º³ØÏ¢·È¥»¥ß¥Ê¡¼¡¦¥¨¥³¥í¥¸¡¼¼Ò²ñ¤òÁϤ¤¹¤ë¤â¤Î¤Å¤¯¤ê¡¢2008ǯ7·î11Æü¡Ê¶â¡Ë13:00¡Ý17:00¡¢¡ÊÂçºå»º¶ÈÁϤ´Û¡¢Âçºå»Ô¡Ë
[2]
ÄÔ ¹¬°ì¡Ö·ì±ÕÃæ¶â°¥¤¥ª¥ó¤Î¸µÁÇʬÀÏË¡¡×¡¢¥á¥¿¥ë¥¤¥ª¥ó¥¹¥¿¥Ç¥£¥×¥í¥È¥³¡¼¥ë¥ß¡¼¥Æ¥£¥ó¥°¡¢2008ǯ9·î6Æü¡ÊÅÚ¡Ë14:00¡Ý16:00¡¢¡ÊÂçºå»ÔΩÂç³Ø°å³ØÉô¡¢Âçºå»Ô¡Ë
[3]
ÄÔ ¹¬°ì¡Ö¼Â¸³¼¼¤Ë¤ª¤±¤ëÈù¾®Éô¡¦ÈùÎÌ·Ö¸÷XÀþʬÀÏË¡¡×¡¢Âè37²óÊü¼ÍÀþ²Ê³Ø¸¦µæ²ñ¡¢2008ǯ10·î17Æü¡Ê¶â¡Ë¡ÊÂçºå½»Í§¥¯¥é¥Ö¡¢Âçºå»Ô¡Ë
[4]
ÄÔ ¹¬°ì¡Ö¸µÁǼ±Ê̲Äǽ¤ÊXÀþ¥¤¥á¡¼¥¸¥ó¥°¡×¡¢Âçºå»ÔΩÂç³Ø(OCU)¡¡¥Ë¥å¡¼¥Æ¥¯¥¬¥¤¥É2009¡¢2009ǯ1·î14Æü¡Ê¿å¡Ë¡¢¡ÊÂçºå»º¶ÈÁϤ´Û¡¢Âçºå»Ô¡Ë
¹ñºÝ²ñµÄ¤Ç¤Î°ìÈֱ̹é
Presentations at international
conferences
[1]
K. Tsuji and Y.
Nishida, X-ray Fluorecenece Analysis of
Liquid/Solid Samples, EXRS2008 (European Conference on X-ray Spectrometry), 16-20 June,
2008, Cavtat, Dubrovnik, CROATIA
(oral).
[2]
K. Tsuji, K. Nakano, K. Okubo and Y. Nishida, X-ray
Fluorecenece Analysis Using X-ray Transparent Thin Films for Sample Surpport
EXRS2008 (European Conference on X-ray Spectrometry),
16-20 June, 2008, Cavtat, Dubrovnik, CROATIA
(poster).
[3]
K. Tsuji and S. Kawamata, Micro TXRF Analyses of Multiple
Residues on A Flat Substrate, EXRS2008 (European Conference on X-ray Spectrometry), 16-20 June,
2008, Cavtat, Dubrovnik, CROATIA
(poster).
[4]
K. Tsuji, K. Nakano,3D-XRF Analysis of Solutions in Micro
Chemical Chip, XRM2008 (PSI 9th International Conference on X-Ray Microscopy),
21-25 July, 2008, Zurich, Swizerland (poster).
[5]
K. Tsuji, A. Matsuda, K. Nakano, S. Komatani, S. Ohzawa, H. Uchihara, APPLICATIONS
OF POLYCAPILLARY OPTICS TO MICRO AND TWO DIMENSIONAL XRF ANALYSIS, 57th
Annual Conference on Applications of X-ray Analysis Denver X-ray Conference,
4-8 August, 2008, Denver, Colorado, USA (oral).
[6]
K. Tsuji, H. Matsui, M. Hino, H. Wanibuchi, H. Kohno, K. Aranami,
Y. Shimizu, T. Yamada, SAMPLE
PREPARATION FOR TOTAL-REFLECTION X-RAY FLUORESCENCE ANALYSIS OF BLOOD SAMPLE,
57th Annual Conference on Applications of X-ray Analysis Denver
X-ray Conference, 4-8 August, 2008, Denver, Colorado, USA (poster).
[7]
K. Nakano, K. Okubo, K. Tsuji,
Preconcentration of the Environmental water by Agar for X-ray fluorescence, 57th
Annual Conference on Applications of X-ray Analysis Denver X-ray Conference,
4-8 August, 2008, Denver, Colorado, USA (oral).
[8]
K. Nakano, K. Tsuji, Preparation of the
Multi-Layered Plastic Reference Materials for Confocal 3D-Micro X-ray
Fluorescence Analysis, 57th Annual Conference on Applications of
X-ray Analysis Denver X-ray Conference, 4-8 August, 2008, Denver, Colorado, USA
(poster).
[9]
K. Tsuji, Micro
and imaging x-ray analysis by using polycapillary x-ray
optics, Part of the SPIE
International Symposium on Optical Engineering
+ Applications, 10-14 August, 2008, San Diego Convention Center, San Diego, CA
USA (oral).
[10] K.
Nakano, S. Fukuoka, and K. Tsuji, Reference materials (in film) for 3D-XRF
analysis, JST International
Symposium on ¡ÈMicro and Trace X-ray Analysis¡É, 12-14 February, 2009, Osaka City
University, Osaka, JAPAN (oral).
[11] K.
Tsuji, T. Yonehara, M. Yamaguchi, and K. Nakano,
X-ray chemical imaging with scanning- and projection modes in the laboratory, JST International Symposium on ¡ÈMicro and
Trace X-ray Analysis¡É, 12-14 February, 2009, Osaka City University, Osaka,
JAPAN (oral).
[12] M. Kawamata,
and K. Tsuji, Fundamental research on sample preparation for TXRF analysis, JST International Symposium on ¡ÈMicro and
Trace X-ray Analysis¡É, 12-14 February, 2009, Osaka City University, Osaka,
JAPAN (poster).
[13] S. Fukuoka, K. Nakano, and K. Tsuji,
Grazing exit micro XRF analysis of layered reference materials, JST International Symposium on ¡ÈMicro and
Trace X-ray Analysis¡É, 12-14 February, 2009, Osaka City University, Osaka,
JAPAN (poster).
[14] T. Yonehara,
and K. Tsuji, X-ray chemical imaging using polycapillary
x-ray optics in the laboratory, JST
International Symposium on ¡ÈMicro and Trace X-ray Analysis¡É, 12-14 February,
2009, Osaka City University, Osaka, JAPAN (poster).
[15] K. Nakamachi,
and K. Tsuji, Micro X-ray beam produced by polycapillary
x-ray lens and conical pinhole aperture, JST International Symposium on ¡ÈMicro and
Trace X-ray Analysis¡É, 12-14 February, 2009, Osaka City University, Osaka,
JAPAN (poster).
[16] Y. Nishida, K. Nakano, and K. Tsuji,
Micro XRF analysis in the solutions by using needle-type X-ray collimators, JST International Symposium on ¡ÈMicro and
Trace X-ray Analysis¡É, 12-14 February, 2009, Osaka City University, Osaka,
JAPAN (poster).
[17] T. Awane,
S. Fukuoka, and K. Tsuji, Grazing Exit Micro X-ray Fluorescence Analysis of a
Hazardous Metal Attached to a Plant Leaf Surface using an X-ray Absorber
Method, JST International
Symposium on ¡ÈMicro and Trace X-ray Analysis¡É, 12-14 February, 2009, Osaka City
University, Osaka, JAPAN (poster).
2007ǯÅ٤γèÆ°
¡Êfrom April 2007 to March 2008¡Ë
¹ñÆâ¤Ç¤Î³Ø²ñȯɽ¤Ê¤É
Presentations at conferences in
Japan
[1]
ÃæÌî ÏÂɧ¡¢¾¾°æ ¹¨¡¢ÄÔ ¹¬°ì¡Ö¿©ºàÃæÈùÎ̶â°ÄêÎÌÍÑ·Ö¸÷£ØÀþʬÀÏÍÑɸ½àʪ¼Á¤Î³«È¯¡×2007ǯ5·î19¡Ý20Æü¡¡Âè68²óÆüËÜʬÀϲ½³Ø²ñƤÏÀ²ñ¡Ê±§ÅÔµÜÂç³Ø¡¢ÆÊÌÚ¡Ë
[2]
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[3]
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[4]
ÀîËô À¿Ìé¡¢ÄÔ ¹¬°ì¡Ö¥Ô¥ó¥Û¡¼¥ë¤òÍѤ¤¤¿Èù¾®ÉôÁ´È¿¼Í·Ö¸÷£ØÀþʬÀÏÁõÃ֤λîºî¡×2007ǯ5·î19¡Ý20Æü¡¡Âè68²óÆüËÜʬÀϲ½³Ø²ñƤÏÀ²ñ¡Ê±§ÅÔµÜÂç³Ø¡¢ÆÊÌÚ¡Ë
[5]
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[6]
×¢À¥ ¹¬ÈÏ¡¢ÄÔ ¹¬°ì¡ÖEBSD¤òÍѤ¤¤¿ULSI¶â°ºàÎÁ¤Î·ë¾½²òÀϵ»½Ñ¤È²ÝÂê¡×2007ǯ5·î20Æü-22Æü¡¢ÆüËܸ²Èù¶À³Ø²ñÂè63²ó³Ø½Ñ¹Ö±é³¬¡Ê¿·³ã¥³¥ó¥Ù¥ó¥·¥ç¥ó¥»¥ó¥¿¡¼¡¢¿·³ã¡Ë
[7] ÄÔ ¹¬°ì¡Ö·Ö¸÷XÀþ¤Ë¤è¤ëÈùÎ̸µÁÇʬÀϵ»½Ñ¡×2007ǯ11·î12Æü Âè30²ó¡Ö¥ª¡¼¥×¥ó¡¦¥é¥Ü¥é¥È¥ê¡¼¡×¡Ø¤è¤êÎɤ¤À¸³è¤ò»Ù¤¨¤ë¥Þ¥Æ¥ê¥¢¥ë¤Î³«Âó¡Ù¡Ö¥Þ¥Æ¥ê¥¢¥ë¤ÎʪÀ¤È·×¬¤ÎºÇÁ°Àþ¡×¡ÊÂçºå»º¶ÈÁϤ´Û¡¢Âçºå¡Ë
[8] ÄÔ ¹¬°ì¡¢ÃæÌî ÏÂɧ¡¢¾¾ÅÄ ¹¸Åµ¡¢ÊƸ¶ Íã¡Ö¼Â¸³¼¼¤Ë¤ª¤±¤ëÈù¾®Éô·Ö¸÷£ØÀþʬÀÏË¡¤Î³«È¯¤ÈŬÍÑÎã¡×2008ǯ2·î5Æü¡¢H19ǯÅÙÂçºå»ÔΩÂç³Ø½ÅÅÀ¸¦µæ¡Ö¥Ò¥å¡¼¥Þ¥ó¥¢¥À¥×¥Æ¥£¥Ö¡¦¥Þ¥Æ¥ê¥¢¥ë¤Î³«Âó¡×Âè3²ó¥·¥ó¥Ý¥¸¥¦¥à¡ÊÂçºå»ÔΩÂç³Ø¡¢Âçºå¡Ë
[9] Âçµ×ÊÝ ·òÂÀ¡¢ÃæÌî ÏÂɧ¡¢ÄÔ ¹¬°ì¡Ö·Ö¸÷£ØÀþʬÀϤΤ¿¤á¤Î´¨Å·¤òÍѤ¤¤¿¿åÍϱջîÎÁ¤ÎÇ»½ÌÊýË¡¡×2008ǯ2·î5Æü¡¢H19ǯÅÙÂçºå»ÔΩÂç³Ø½ÅÅÀ¸¦µæ¡Ö¥Ò¥å¡¼¥Þ¥ó¥¢¥À¥×¥Æ¥£¥Ö¡¦¥Þ¥Æ¥ê¥¢¥ë¤Î³«Âó¡×Âè3²ó¥·¥ó¥Ý¥¸¥¦¥à¡ÊÂçºå»ÔΩÂç³Ø¡¢Âçºå¡Ë
[10] ¾¡°æ ·Ä»Ò¡¢ÄÔ ¹¬°ì¡Ö¿¢Êª»ñÎÁ¤Ë¤ª¤±¤ë¸µÁÇ°ÜÆ°¤Î·Ö¸÷£ØÀþ´Ñ»¡¡×2008ǯ2·î5Æü¡¢H19ǯÅÙÂçºå»ÔΩÂç³Ø½ÅÅÀ¸¦µæ¡Ö¥Ò¥å¡¼¥Þ¥ó¥¢¥À¥×¥Æ¥£¥Ö¡¦¥Þ¥Æ¥ê¥¢¥ë¤Î³«Âó¡×Âè3²ó¥·¥ó¥Ý¥¸¥¦¥à¡ÊÂçºå»ÔΩÂç³Ø¡¢Âçºå¡Ë
[11] À¾ÅÄ µÈɧ¡¢ÄÔ ¹¬°ì¡Ö±ÕÂÎÃæ¤Î¸ÇÂκàÎÁʬÀÏÁõÃ֤λîºî¡×2008ǯ3·î27Æü¡¢ÆüËÜÅ´¹Ý¶¨²ñÂè155²ó½Õµ¨¹Ö±éÂç²ñ¡¡³ØÀ¸¥Ý¥¹¥¿¡¼¥»¥Ã¥·¥ç¥ó¡ÊÉ𢹩¶ÈÂç³Ø¡Ë
[12] ÃæÄ® ÏÂÃË¡¢ÄÔ ¹¬°ì¡Ö¥°¥í¡¼ÊüÅÅ¥¹¥Ñ¥Ã¥¿¥ê¥ó¥°¤Ë¤è¤ë¶â°ɽÌÌÀ¶¾ôË¡¤Î¸¡Æ¤¡×2008ǯ3·î27Æü¡¢ÆüËÜÅ´¹Ý¶¨²ñÂè155²ó½Õµ¨¹Ö±éÂç²ñ¡¡³ØÀ¸¥Ý¥¹¥¿¡¼¥»¥Ã¥·¥ç¥ó¡ÊÉ𢹩¶ÈÂç³Ø¡Ë
¹ñºÝ²ñµÄ¤Ç¤Î¾·ÂÔ¡¦°ÍÍê¹Ö±é
Invited talks at international
conferences
[1] K.
Tsuji, ¡ÈMicro-TXRF analysis with a pinhole aperture¡É, 12th Conference on
Total Reflection X-Ray Fluorescence Analysis and Related Methods (TXRF2007), 18-22 June, 2007, Trento, Italy.
[2] K.
Tsuji, ¡ÈSpecial Configurations in X-ray Fluorescence
for Environmental Analysis¡É, The 9th Asian Conference on Analytical
Sciences (Asianalysis), 4-8 Nov. 2007, Jeju, Korea.
[3] K.
Tsuji, ¡ÈResearch Plan for Development of High Spatial
Resolution XRF Instrument¡É, ICXOM 2007 Satellite meeting of Micro Area Analysis by X-ray in Laboratory,
15-16, Sep. 2007, Osaka, Japan.
¹ñÆâ¤Ç¤Î¾·ÂÔ¡¦°ÍÍê¹Ö±é
Invited talks at domestic
conferences
[1]
ÄÔ ¹¬°ì¡Ö³Æ¼ï¸µÁÇʬÀÏË¡¤Î¸¶Íý¤ÈÆÃħ¡¡¡ÝÆä˷ָ÷XÀþ¸µÁÇʬÀϤˤĤ¤¤Æ-¡×¡¢ÆüËÜÅ´¹Ý¶¨²ñÅ´¹Ý¹©³Ø¥¢¥É¥Ð¥ó¥¹¥È¥»¥ß¥Ê¡¼¡¢2007ǯ10·î29¡Ý31Æü
[2]
ÄÔ ¹¬°ì¡ÖÂçºå»ÔΩÂç³Ø¤Ë¤ª¤±¤ë»º³Ø´±Ï¢·È¤Î¼è¤êÁȤߡס¢Âè56²ó¶ºÀµ¶µ°é¸¦µæ²ñ¡¢2007ǯ10·î16Æü
[3]
ÄÔ ¹¬°ì¡Ö·Ö¸÷£ØÀþ¤Ë¤è¤ëÈùÎ̸µÁÇʬÀϵ»½Ñ¡×¡¢Âè30²ó¡Ö¥ª¡¼¥×¥ó¡¦¥é¥Ü¥é¥È¥ê¡¼¡×¡¢2007ǯ11·î12Æü
[4]
ÄÔ ¹¬°ì¡Ö·Ö¸÷£ØÀþʬÀÏË¡¤Î°å³ØʬÌî¤Ø¤ÎŬÍѲÄǽÀ¡×¡¢Âè2²ó¥¤¥ó¥¿¡¼¥¥ã¥ó¥Ñ¥¹¡Ê¿ùËÜ-°¤ÇÜÌî¡Ë¸¦µæ¸òή²ñ¡¢2008ǯ2·î14Æü
¹ñºÝ²ñµÄ¤Ç¤Î°ìÈֱ̹é
Presentations at international
conferences
[1]
K. Tsuji, T. Yonehara, K. Nakano,
SOLID-LIQUID INTERFACE
ANALYSIS BY LABORATORY-MADE 3D-MICRO-XRF INSTRUMENT, EMAS2007 (European Microbeam Analysis Society, 10th
European Workshop on Modern Developments and Applications in Microbeam
Analysis), 6-10, May, 2007, Antwerp, Belgium (poster).
[2]
Kazuhiko Nakano, Hiroshi Matsui, Masayuki
Hino, Takashi Yamada, Kouichi Tsuji, TXRF analysis of
the biological fluid samples using bench-top type TXRF spectrometer, 12th Conference on
Total Reflection X-Ray Fluorescence Analysis and Related Methods (TXRF2007),
18-22, June, 2007, Trento, Italy (poster).
[3]
K. Nakano, K. Tsuji, ¡ÈDevelopment and
Application of confocal 3D-micro-XRF spectrometer¡É, 19th International
Conference on X-Ray Optics and Microanalysis (ICXOM2007), 16-21 Sep. 2007,
Kyoto, Japan.(oral).
[4]
K.
Katsui, K. Tsuji,
¡ÈTime-Resolved XRF Measurement of Living Plants¡É, 19th International
Conference on X-Ray Optics and Microanalysis (ICXOM2007), 16-21 Sep. 2007,
Kyoto, Japan.(poster).
[5]
H. Matsui, K. Nakano, K. Tsuji,
¡ÈComparison of Micro-TXRF and Micro Grazing-Exit XRF¡É, 19th
International Conference on X-Ray Optics and Microanalysis (ICXOM2007), 16-21
Sep. 2007, Kyoto, Japan.(poster).
[6]
Y. Nishida, T. Yonehara,
K. Tsuji, ¡ÈSolid-Liquid Interface Analysis by Compact XRF Probe¡É, 19th
International Conference on X-Ray Optics and Microanalysis (ICXOM2007), 16-21
Sep. 2007, Kyoto, Japan.(poster).
[7]
T. Yonehara, K.
Tsuji, ¡ÈDevelopment of a Compact XRF Probe with a Ring-type Secondary Target¡É,
19th International Conference on X-Ray Optics and Microanalysis
(ICXOM2007), 16-21 Sep. 2007, Kyoto, Japan.(poster).
[8]
Y. Hanaoka, H. Matsui, K. Nakano, K.
Tsuji, ¡ÈCompact TXRF Instrument Developed by Using a Secondary Target and a Si
Reflector¡É, 19th International Conference on X-Ray Optics and
Microanalysis (ICXOM2007), 16-21 Sep. 2007, Kyoto, Japan.(poster).
[9]
A. Matsuda, K. Nakano, S. Komatani, S. Ohzawa, H. Uchihara, K. Tsuji, ¡ÈFundamental Research of X-ray Focusing
Lens¡É, 19th International Conference on X-Ray Optics and
Microanalysis (ICXOM2007), 16-21 Sep. 2007, Kyoto, Japan.(poster).
[10] S.
Fukuoka, K. Tsuji, ¡ÈPreliminary Experiment of Micro-XRF combined with AFM¡É, 19th
International Conference on X-Ray Optics and Microanalysis (ICXOM2007), 16-21
Sep. 2007, Kyoto, Japan.(poster).
[11] K. Nakano, H. Matsui, K. Matsuda, M. Mizuhira, K. Tsuji, ¡ÈA Quick Preparation of In-house
Reference materials of the Food Grain Sample for XRF analysis¡É, The 9th Asian Conference on Analytical Sciences (Asianalysis), 4-8 Nov. 2007, Jeju,
Korea.(poster)
[12] K. Nakano, K. Tsuji, ¡ÈTotal Reflection X-Ray
Fluorescence and Confocal-3D micro X-Ray Fluorescence Analyses for Chemical
Microchips¡É, The 9th Asian Conference on
Analytical Sciences (Asianalysis), 4-8 Nov. 2007, Jeju, Korea.(oral)
[13]
A. Matsuda, K. Nakano, K. Tsuji, S. Komatani, S. Ohzawa, H. Uchihara, ¡ÈFundamental
Research of New Optics System for micro-X-ray Fluorescence¡É, The 9th
Asian Conference on Analytical Sciences (Asianalysis),
4-8 Nov. 2007, Jeju, Korea.(poster).
[14] T. Yonehara,
K. Tsuji, ¡ÈDevelopment of compact XRF probe and solid-liquid interface XRF
analysis¡É, The 9th Asian Conference on Analytical Sciences (Asianalysis),
4-8 Nov. 2007, Jeju, Korea.(poster).
[15]
K.Tsuji, ¡ÈMicro and 3D XRF
studies in Osaka City University¡É, Inha University, 9
Nov. 2007, Soul, Korea
[16]
Y. Hirose, N. Murata, T.
Katayama, K. Tsuji, ¡ÈMulti-dimension analysis of vias in ULSIs¡É, International
Symposium on ¡ÈFuture Prospects of Scanning Electron / He¡ÜIon Microscope for Nano-surface Analysis¡É-bridging the gap between
surface analysis and electron microscopy-, 26-29 Nov.2007, Keio University,
Japan (oral)
2006ǯÅ٤γèÆ°
¡Êfrom April 2006 to March 2007¡Ë
¹ñÆâ¤Ç¤Î³Ø²ñȯɽ¤Ê¤É
Presentations at conferences in
Japan
[1]
ÃæÌî ÏÂɧ¡¢ÄÔ ¹¬°ì¡Ö¶¦¾ÇÅÀ·¿·Ö¸÷£ØÀþʬÀÏÁõÃ֤γ«È¯¤È»°¼¡¸µ¸µÁÇʬÀÏ¡×2006ǯ5·î13¡Ý14Æü¡¡Âè67²óÆüËÜʬÀϲ½³Ø²ñƤÏÀ²ñ¡Ê½©ÅÄÂç³Ø¡¢½©ÅÄ¡Ë
[2]
ÄÔ ¹¬°ì¡¦ÃæÌî ÏÂɧ¡¦Andriy
Okhrimovskyy¡¦¼ò°æ¡¡ÂîϺ¡¦»³ËÜ¡¡½ÕÌé¡Ö¼Ð½Ð¼ÍPIXEË¡¤Ë¤è¤ëÈù¾®Éô¤ÎɽÌÌ¡¦ÇöËì¬Äê¡×2006ǯ5·î13¡Ý14Æü¡¡Âè67²óÆüËÜʬÀϲ½³Ø²ñƤÏÀ²ñ¡Ê½©ÅÄÂç³Ø¡¢½©ÅÄ¡Ë
[3]
¾¾ÅÄ ¹¸Åµ¡¦ÄÔ ¹¬°ì¡Ö¥Ë¡¼¥É¥ë·¿¥³¥ê¥á¡¼¥¿¡¼¤òÍѤ¤¤¿£³£Ä¡Ý£Ø£Ò£ÆÁõÃÖ¤ÎÀ߷פȻîºî¡×2006ǯ5·î13¡Ý14Æü¡¡Âè67²óÆüËÜʬÀϲ½³Ø²ñƤÏÀ²ñ¡Ê½©ÅÄÂç³Ø¡¢½©ÅÄ¡Ë
[4]
ÄÔ ¹¬°ì¡¦ÃæÅÄ ½¡´²¡ÖÅ´¹Ý»îÎÁ¤ÎÈù¾®ÉôXÀþʬÀÏ¡×2006ǯ7·î28Æü¡¡(¼Ò)ÆüËÜÅ´¹Ý¶¨²ñ ɾ²Á¡¦Ê¬ÀÏ¡¦²òÀÏÉô²ñ¥»¥ß¥Ê¡¼¡ÊÂçºå»ÔΩÂç³Ø¡¡Âçºå¡Ë
[5]
ÄÔ ¹¬°ì¡¢ÊƸ¶ Íã¡¢ÃæÌî ÏÂɧ¡¢¡Ö3¼¡¸µ·Ö¸÷XÀþʬÀÏË¡¤Ë¤è¤ë»îÎÁÆâÉô¤ä¸Ç±Õ³¦Ì̤θµÁÇʬÀÏ¡×2006ǯ9·î20¡Ý22Æü¡¢ÆüËÜʬÀϲ½³Ø²ñÂè55ǯ²ñ¡ÊÂçºåÂç³Ø¡¢Âçºå¡Ë
[6]
ÄéËÜ ·°¡¢ÄÔ ¹¬°ì¡Ö·Ö¸÷XÀþʬÀÏË¡¤Ë¤è¤ëÍϱդª¤è¤Ó¸Ç±Õ³¦Ì̤ÎľÀܬÄê¡×2006ǯ9·î20¡Ý22Æü¡¢ÆüËÜʬÀϲ½³Ø²ñÂè55ǯ²ñ¡ÊÂçºåÂç³Ø¡¢Âçºå¡Ë
[7]
¾¾ÅÄ ¹¸Åµ¡¢ÊƸ¶ Íã¡¢ÄÔ ¹¬°ì¡ÖÃí¼Í¿ËÍÍXÀþ¥³¥ê¥á¡¼¥¿¡¼¤òÍøÍѤ¹¤ë±ÕÃæµÚ¤Ó¸Ç¸Ç³¦ÌÌ¡¦¸Ç±Õ³¦Ì̤ηָ÷XÀþʬÀÏË¡¤ÎÄó°Æ¡×2006ǯ9·î20¡Ý22Æü¡¢ÆüËÜʬÀϲ½³Ø²ñÂè55ǯ²ñ¡ÊÂçºåÂç³Ø¡¢Âçºå¡Ë
[8]
ÄÔ ¹¬°ì¡¢ÄéËÜ ·°¡¢ÊƸ¶ Íã¡¢ÃæÌî ÏÂɧ¡Ö¸Ç±Õ³¦Ì̤ؤηָ÷£ØÀþʬÀÏË¡¤ÎŬÍÑ¡×2006ǯ10·î3Æü¡¢ÆüËܳؽѿ¶¶½²ñÀ½¹ÝÂè19°Ñ°÷²ñ
[9]
ÃæÌî ÏÂɧ¡¢ÄéËÜ ·°¡¢¾¾ÅÄ ¹¸Åµ¡¢ÊƸ¶ Íã¡¢ÀîËô À¿Ìé¡¢ÄÔ ¹¬°ì¡ÖÈù¾®Éô·Ö¸÷XÀþʬÀϤθ½¾õ¤ÈÌäÂêÅÀ¡×2006ǯ10·î19Æü¡¢ÆüËÜʬÀϲ½³Ø²ñ¶áµ¦»ÙÉô¡¡Äó°Æ¸øÊç·¿»ö¶È¡Ê¥»¥ß¥Ê¡¼¡Ë¡Ö£³¼¡¸µ·Ö¸÷XÀþʬÀϤ˴ؤ¹¤ë¸¦µæ²ñ¡×¡ÊÂçºå»ÔΩÂç³Ø¡¢Âçºå¡Ë
[10] ²Ö²¬ Íβð¡¢ÄÔ ¹¬°ì¡¢»³ÅÄ Î´¡Ö¥Þ¥¤¥¯¥í²½³Ø¥Á¥Ã¥×¤òÍøÍѤ¹¤ëÁ´È¿¼Í·Ö¸÷ʬÀÏË¡¤Îɾ²Á¡×2006ǯ10·î20¡Ý21Æü¡¢ÆüËÜʬÀϲ½³Ø£ØÀþʬÀϸ¦µæº©Ã̲ñ¼çºÅ¡¡Âè42²ó£ØÀþʬÀÏƤÏÀ²ñ¡ÊÌÀ¼£Âç³Ø¡¢Åìµþ¡Ë
[11] ÀîËô À¿Ìé¡¢ÅÄÃæ ·¼ÂÀ¡¢ÄÔ ¹¬°ì¡ÖÈù¾®ÉôÁ´È¿¼Í·Ö¸÷£ØÀþÁõÃ֤λîºî¡×2006ǯ10·î20¡Ý21Æü¡¢ÆüËÜʬÀϲ½³Ø£ØÀþʬÀϸ¦µæº©Ã̲ñ¼çºÅ¡¡Âè42²ó£ØÀþʬÀÏƤÏÀ²ñ¡ÊÌÀ¼£Âç³Ø¡¢Åìµþ¡Ë
[12] ÄéËÜ ·°¡¢ÄÔ ¹¬°ì¡Ö·Ö¸÷£ØÀþʬÀÏË¡¤Ë¤è¤ë¸ÇÂγ¦Ì̤Ǥβ½³ØÈ¿±þ¤Î·×¬¡×2006ǯ10·î20¡Ý21Æü¡¢ÆüËÜʬÀϲ½³Ø£ØÀþʬÀϸ¦µæº©Ã̲ñ¼çºÅ¡¡Âè42²ó£ØÀþʬÀÏƤÏÀ²ñ¡ÊÌÀ¼£Âç³Ø¡¢Åìµþ¡Ë
[13] ¾¾ÅÄ ¹¸Åµ¡¢ÃæÌî ÏÂɧ¡¢ÄÔ ¹¬°ì¡Ö¥¥ã¥Ô¥é¥ê¡¼£ØÀþ¥ì¥ó¥º¤òÁȤ߹ç¤ï¤»¤¿Èù¾®Éô·Ö¸÷£ØÀþʬÀÏÁõÃÖ¤Îɾ²Á¡× 2006ǯ10·î20¡Ý21Æü¡¢ÆüËÜʬÀϲ½³Ø£ØÀþʬÀϸ¦µæº©Ã̲ñ¼çºÅ¡¡Âè42²ó£ØÀþʬÀÏƤÏÀ²ñ¡ÊÌÀ¼£Âç³Ø¡¢Åìµþ¡Ë
[14] ÊƸ¶ Íã¡¢¾¾ÅÄ ¹¸Åµ¡¢ÄÔ ¹¬°ì¡Ö·Ö¸÷£ØÀþ¤ÎÎ嵯¡¦¸¡½Ð¤òƱ¼´¤Ç¹Ô¤¦¾®·¿·Ö¸÷£ØÀþ¥×¥í¡¼¥Ö¤Î»îºî¡× 2006ǯ10·î20¡Ý21Æü¡¢ÆüËÜʬÀϲ½³Ø£ØÀþʬÀϸ¦µæº©Ã̲ñ¼çºÅ¡¡Âè42²ó£ØÀþʬÀÏƤÏÀ²ñ¡ÊÌÀ¼£Âç³Ø¡¢Åìµþ¡Ë
[15] ÃæÌî ÏÂɧ¡¢Ìî»û ͺÂÀ¡¡ÊƸ¶ Íã¡¢ÄÔ ¹¬°ì¡Ö¶¦¾ÇÅÀ·¿·Ö¸÷£ØÀþʬÀÏÁõÃÖ¤òÍѤ¤¤¿»°¼¡¸µÈù¾®ÉôÎΰè¤Ë¤ª¤±¤ëÄêÎÌÀ¤Î¸¡Æ¤¡× 2006ǯ10·î20¡Ý21Æü¡¢ÆüËÜʬÀϲ½³Ø£ØÀþʬÀϸ¦µæº©Ã̲ñ¼çºÅ¡¡Âè42²ó£ØÀþʬÀÏƤÏÀ²ñ¡ÊÌÀ¼£Âç³Ø¡¢Åìµþ¡Ë
[16] ÄÔ ¹¬°ì¡¢ÃæÌî ÏÂɧ¡¢ÄéËÜ ·°¡¢¾¾ÅÄ ¹¸Åµ¡¢ÊƸ¶ Íã¡¢ÀîËô À¿Ìé¡ÖMicro
XRF studies at Osaka City University¡×¡¢2006ǯ10·î19Æü¡¢£³¼¡¸µ·Ö¸÷£ØÀþʬÀϤ˴ؤ¹¤ë¸¦µæ²ñ¡ÊÂçºå»ÔΩÂç³Ø¡¢Âçºå¡Ë
[17] ÄÔ ¹¬°ì¡¢ÃæÌî ÏÂɧ¡¢ÄéËÜ ·°¡¢¾¾ÅÄ ¹¸Åµ¡¢ÊƸ¶ Íã¡¢Ìî»û ͺÂÀ¡Ö¶¦¾ÇÅÀ·¿¤Î3¼¡¸µ·Ö¸÷£ØÀþʬÀÏÁõÃ֤γ«È¯¤È»îÎÁÆâÉô¤ÎÈóÇ˲õ¸µÁÇʬÀϡס¢2006ǯ11·î6-9Æü¡¢ÆüËÜɽÌ̲ʳزñÂè26²óɽÌ̲ʳعֱéÂç²ñ¡ÊÂçºåÂç³Ø¡¢Âçºå¡Ë
[18] ÄÔ ¹¬°ì¡¢ÊƸ¶ Íã¡¢ÃæÌî ÏÂɧ¡Ö¶¦¾ÇÅÀ·¿·Ö¸÷£ØÀþʬÀÏÁõÃ֤γ«È¯¡×¡¢2006ǯ12·î14Æü¡¢Âè50²óÆüËܳؽѲñµÄºàÎÁ¹©³ØÏ¢¹ç¹Ö±é²ñ¡ÊµþÂç²ñ´Û¡¢µþÅÔ¡Ë
[19] ÄÔ ¹¬°ì¡¢ÃæÌî ÏÂɧ¡¢ÄéËÜ ·°¡¢ÊƸ¶ Íã¡Ö·Ö¸÷XÀþʬÀÏË¡¤ÎÍϱջîÎÁ¤ä¸Ç±Õ³¦ÌÌʬÀϤؤαþÍѡס¢2007ǯ2·î1Æü¡¢H18ǯÅÙÂçºå»ÔΩÂç³Ø½ÅÅÀ¸¦µæ¡Ö¥Ò¥å¡¼¥Þ¥ó¥¢¥À¥×¥Æ¥£¥Ö¡¦¥Þ¥Æ¥ê¥¢¥ë¤Î³«Âó¡×Âè2²ó¥·¥ó¥Ý¥¸¥¦¥à¡ÊÂçºå»ÔΩÂç³Ø¡¢Âçºå¡Ë
[20] ¾¾°æ ¹¨¡¢ÄÔ ¹¬°ì¡¢»³ÅÄ Î´¡Ö·ì±ÕÃæÈùÎ̶â°¸µÁǤÎÁ´È¿¼Í·Ö¸÷XÀþʬÀϡס¢2007ǯ2·î1Æü¡¢H18ǯÅÙÂçºå»ÔΩÂç³Ø½ÅÅÀ¸¦µæ¡Ö¥Ò¥å¡¼¥Þ¥ó¥¢¥À¥×¥Æ¥£¥Ö¡¦¥Þ¥Æ¥ê¥¢¥ë¤Î³«Âó¡×Âè2²ó¥·¥ó¥Ý¥¸¥¦¥à¡ÊÂçºå»ÔΩÂç³Ø¡¢Âçºå¡Ë
[21] Ìî»û ͺÂÀ¡¢¾¾ÅÄ ¹¸Åµ¡¢ÃæÌî ÏÂɧ¡¢ÄÔ ¹¬°ì¡Ö¥Ý¥ê¥¥ã¥Ô¥é¥ê¡¼XÀþ¥ì¥ó¥º¤Î¾ÜºÙ¤ÊÆÃÀɾ²Á¡×¡¢2007ǯ2·î1Æü¡¢H18ǯÅÙÂçºå»ÔΩÂç³Ø½ÅÅÀ¸¦µæ¡Ö¥Ò¥å¡¼¥Þ¥ó¥¢¥À¥×¥Æ¥£¥Ö¡¦¥Þ¥Æ¥ê¥¢¥ë¤Î³«Âó¡×Âè2²ó¥·¥ó¥Ý¥¸¥¦¥à¡ÊÂçºå»ÔΩÂç³Ø¡¢Âçºå¡Ë
¹ñºÝ²ñµÄ¤Ç¤Î¾·ÂÔ¡¦°ÍÍê¹Ö±é
Invited talks at international
conferences
[1] K.
Tsuji, ¡ÈGrazing-Exit and Micro Wavelength-Dispersive X-Ray Spectrometry
(GE-WDXRS and m-WDXRS)¡É, EXRS 2006, 19-23 June, 2006, Paris, France.
[2] A.
Von Bohlen, and K. Tsuji, ¡ÈImproving the detection limits by TXRF and GEXRF¡É,
55th Denver X-ray Conference, 7-11 August, 2006, Denver, USA.
[3] K.
Tsuji, ¡ÈFundamental and New Trends of X-Ray Fluorescence Analysis¡É, Âçºå»ÔŽ¥¾å³¤»Ô¡¡¸¦µæ¼Ô¸òή»ö¶È¤Ë¤è¤ë¾·ÂÔ¹Ö±é²ñ¡¢7
September 2006, Shanghai, China.
[4] K. Tsuji, ¡ÈTXRF analysis
with chemical microchip and 3D XRF analysis of solid/liquid interfaces ¡È, 8
December, 2006, Dortmund, Germany
¹ñÆâ¤Ç¤Î¾·ÂÔ¡¦°ÍÍê¹Ö±é
Invited talks at domestic
conferences
[1]
ÄÔ ¹¬°ì¡Ö¹â´¶ÅÙ£³¼¡¸µ·Ö¸÷XÀþʬÀÏÁõÃ֤γ«È¯¤Ø¸þ¤±¤¿¼è¤êÁȤߡ×2006ǯ5·î14-15Æü¡¡ÆüËÜʬÀϲ½³Ø²ñ¼ã¼ê¥Õ¥©¡¼¥é¥à in ½©ÅÄ¡¥
[2]
ÄÔ ¹¬°ì¡ÖÅ´¹Ý»îÎÁ¤ÎÈù¾®ÉôXÀþʬÀÏ¡×2006ǯ7·î28Æü¡¢ÆüËÜÅ´¹Ý¶¨²ñ¡¡É¾²Á¡¦Ê¬ÀÏ¡¦²òÀÏÉô²ñ¥»¥ß¥Ê¡¼¡¢Âçºå»ÔΩÂç³Ø
[3]
ÄÔ ¹¬°ì¡ÖÈù¾®Éô·Ö¸÷XÀþʬÀϸ¦µæ¤ÎÆ°¸þ¤ÈÅ´¹ÝºàÎÁ¤Ø¤ÎŬÍѲÄǽÀ¡×2006ǯ12·î15Æü¡¢½»Í§¶â°¹©¶ÈÃÌÏòñ¡ÊÂçºå¡Ë
[4]
ÄÔ ¹¬°ì¡Ö¿åÍϱÕÃæ¤ÎXÀþ¸ÇÂÎɽÌ̲òÀÏ¡×2007ǯ1·î26Æü¡¢É½Ì̲ʳص»½Ñ¸¦µæ²ñ¡Ê¿À¸ÍÂç³Ø¡¢¿À¸Í¡Ë
[5]
ÄÔ ¹¬°ì¡Ö£ØÀþʬÀϵ¡Ç½¤òͤ¹¤ëÁöºº¥×¥í¡¼¥Ö¸²Èù¶À¤Î³«È¯¡×2007ǯ1·î19Æü¡¢Âçºå»ÔΩÂç³Ø¥Ë¥å¡¼¥Æ¥¯¥¬¥¤¥É2007¡ÊÂçºå»º¶ÈÁϤ´Û¡¢Âçºå¡Ë
[6]
ÄÔ ¹¬°ì¡Ö·Ö¸÷£ØÀþʬÀÏË¡¤Î°åÎÅʬÌî¤Ø¤ÎŬÍѲÄǽÀ¡×2007ǯ3·î13Æü¡¢Âè12²ó¼¡À¤Âå°åÎÅ¥·¥¹¥Æ¥à»º¶È²½¥Õ¥©¡¼¥é¥à2006¡ÊÂçºå¾¦¹©²ñµÄ½ê7³¬¹ñºÝ²ñµÄ¥Û¡¼¥ë¡¢Âçºå¡Ë
¹ñºÝ²ñµÄ¤Ç¤Î°ìÈֱ̹é
Presentations at international
conferences
[1] Kouichi TSUJI,
Keita TANAKA, Yosuke NISHIDA, Kazuhiko NAKANO, Ken-ichi
SASAKI, ¡ÈMicro Total Reflection X-ray Fluorescence (m-TXRF)¡É, EXRS 2006, 19-23
June, 2006, Paris, France. (Poster)
[2] Kazuhiko
Nakano1,2, Xunliang Ding 3, Kouichi
TSUJI, ¡ÈDevelopment of Confocal 3D micro XRF Spectrometer with Cr-Mo Dual
Excitation¡É, EXRS 2006, 19-23 June, 2006, Paris, France. (Oral)
[3] Kazuhiko
NAKANO, Kouichi Tsuji, Toshihiro NAKAMURA, Izumi
NAKAI, Akira KAWASE, Makoto IMAI, Mikio HASEGAWA, Yohichi
ISHIBASHI, ¡ÈPreparation and certification of the new
reference materials; Plastics (disk form, JSAC 0621 ? 0625) for determination
of Mercury using X-ray fluorescent analysis ¡É, EXRS 2006, 19-23 June,
2006, Paris, France. (Poster)
[4] K.
Tsuji, A. Matsuda, ¡ÈMicro-XRF Analysis using Needle-Type Collimators¡É, Denver
X-ray Conference, 7-11 August, 2006, Denver, USA (oral).
[5] K. Tsuji, K. Nakano,
¡ÈNondestructive elemental depth profile of Japanese lacquer Ware ¡ÈTamamushi-Nuri¡Éby Micro GE-XRF and Confocal 3D-XRF¡É,
Cultural Heritage and Science, 5 December, 2006, Gent University,
Belgium.(Poster)
2005ǯÅ٤γèÆ°
¡Êfrom April
2005 to March 2006¡Ë
¹ñÆâ¤Ç¤Î³Ø²ñȯɽ¤Ê¤É
Presentations at conferences in
Japan
[1]
ÄÔ ¹¬°ì¡¢¹¾ËÜ
ůÌé¡¢À¾ÅÄ Íβ𡢶ÌÌÚ ±É°ìϺ¡¢²Ð¸¶
¾´½¨¡¢µÆë Á±¹ñ¡¢ËÌ¿¹ Éðɧ¡Ö²½³Ø¥Þ¥¤¥¯¥í¥Á¥Ã¥×¤ËÂФ¹¤ë·Ö¸÷XÀþ¤ÎŬ±þ¡×2005ǯ5·î14¡Ý15Æü¡¡ÆüËÜʬÀϲ½³Ø²ñƤÏÀ²ñ¡ÊË̸«¹©¶ÈÂç³Ø¡¢Ë̳¤Æ»¡Ë
[2]
ÄÔ ¹¬°ì¡¢Andriy
Okhrimovskyy¡¢¿¹»³ ¹§ÃË¡ÖĶÇöËì¤ò»îÎÁÊÝ»ýºà¤È¤¹¤ë·Ö¸÷XÀþʬÀϤˤª¤±¤ë¬ÄêÇÛÃ֤θ¡Æ¤¡×2005ǯ5·î14¡Ý15Æü¡¡ÆüËÜʬÀϲ½³Ø²ñƤÏÀ²ñ¡ÊË̸«¹©¶ÈÂç³Ø¡¢Ë̳¤Æ»¡Ë
[3]
ÃæÌî ÏÂɧ¡¦Ãæ¼ Íø×¢¡¦À¾ÅÄ ¹¯Ê塦ËÜ´Ö ¼÷¡Ö¥×¥é¥¹¥Á¥Ã¥¯É¸½àʪ¼ÁÃæ¤Î Pb, Cd, Cr ¤Î¶Ñ°ìÀ»î¸³¡× Âè 66 ²óʬÀϲ½³ØƤÏÀ²ñ, Ë̸«¹©¶ÈÂç³Ø, 2005 ǯ 5 ·î.
[4]
ÄÔ ¹¬°ì¡¢ÃæÌî ÏÂɧ¡¢¼ò°æ ÂîϺ¡¢»³ËÜ ½ÕÌé¡Ö¼Ð½Ð¼ÍXÀþ¬Äê¤Ë¤è¤ë¹â´¶ÅÙPIXE¤Ë´Ø¤¹¤ë´ðÁø¦µæ¡×2005ǯ6·î23¡Ý24Æü¡¡Âè14²ó TIARA ¸¦µæȯɽ²ñ¡Ê¸¶»ÒÎϸ¦µæ½ê¡¢¹âºê¸¦µæ½ê¡Ë
[5]
ÅÄÃæ ·¼ÂÀ¡¢ÃæÌî ÏÂɧ¡¢ÄÔ ¹¬°ì¡Ö¥Ý¥ê¥¥ã¥Ô¥é¥ê¡¼XÀþ¥ì¥ó¥º¤òÍѤ¤¤¿Èù¾®ÉôÎΰè¤Ç¤ÎÁ´È¿¼Í·Ö¸÷XÀþʬÀÏÁõÃ֤λîºî¡×2005ǯ9·î14¡Ý16Æü¡¡ÆüËÜʬÀϲ½³Ø²ñǯ²ñ¡Ê̾¸Å²°Âç³Ø¡Ë
[6]
ÄéËÜ ·°¡¢¹¾ËÜ
ůÌé¡¢µÜÉð Í¥¡¢Ä¹Â¼ ½Óɧ¡¢ÄÔ
¹¬°ì¡Ö¥Ý¥ê¥¥ã¥Ô¥é¥ê¡¼XÀþ¥ì¥ó¥º¤òÍѤ¤¤¿m¡ÝXRF¤ÈAFM¤ÎÍ»¹çÁõÃ֤λîºî¡×2005ǯ9·î14¡Ý16Æü¡¡ÆüËÜʬÀϲ½³Ø²ñǯ²ñ¡Ê̾¸Å²°Âç³Ø¡Ë
[7]
ÅÄÃæ ·¼ÂÀ¡¢ÄéËÜ
·°¡¢X. Ding¡¢ÄÔ ¹¬°ì¡Ö¼Â¸³¼¼¤Ç»ÈÍѤµ¤ì¤ë¥Ý¥ê¥¥ã¥Ô¥é¥ê¡¼XÀþ¥ì¥ó¥º¤ÎÆÃÀɾ²Á¡× 2005ǯ10·î21¡Ý22Æü¡¡Âè41²óXÀþʬÀÏƤÏÀ²ñ¡ÊµþÅÔÂç³Ø¡Ë
[8]
¾¾°æ ¹¨¡¢ÃæÌî
ÏÂɧ¡¢ÄÔ ¹¬°ì¡Ö·Ö¸÷XÀþʬÀϤˤè¤ë¹òÎà¿©ÉÊÃæ¤ÎÈùÎ̶â°¤ÎÄêÎÌ¡×2005ǯ10·î21¡Ý22Æü¡¡Âè41²óXÀþʬÀÏƤÏÀ²ñ¡ÊµþÅÔÂç³Ø¡Ë
[9]
ÃæÌî ÏÂɧ¡¢¾¾ÅÄ
¹¸Åµ¡¢X. Ding¡¢ÄÔ ¹¬°ì¡Ö¥Ý¥ê¥¥ã¥Ô¥é¥ê¡¼XÀþ¥ì¥ó¥º¤òÍѤ¤¤¿¶¦¾ÇÅÀ·¿3¼¡¸µ·Ö¸÷XÀþʬÀÏÁõÃÖ¤ÎÀ߷פȻîºî¡×2005ǯ10·î21¡Ý22Æü¡¡Âè41²óXÀþʬÀÏƤÏÀ²ñ¡ÊµþÅÔÂç³Ø¡Ë
[10]
¾¾ÅÄ ¹¸Åµ¡¢ÄÔ
¹¬°ì¡ÖÃí¼Í¿Ë¤òÍѤ¤¤¿£³DXRFʬÀÏÁõÃÖ¤ÎÀ߷פȻîºî¡×2005ǯ10·î21¡Ý22Æü¡¡Âè41²óXÀþʬÀÏƤÏÀ²ñ¡ÊµþÅÔÂç³Ø¡Ë
[11]
²Ö²¬ Íβð¡¢ÅϷļ¡
³Ø¡¢ËÌ¿¹ Éðɧ¡¢ÄÔ ¹¬°ì¡Ö¥Þ¥¤¥¯¥í²½³Ø¥Á¥Ã¥×¤ËÂФ¹¤ëÁ´È¿¼Í·Ö¸÷XÀþʬÀϤÎŬÍÑ¡×2005ǯ10·î21¡Ý22Æü¡¡Âè41²óXÀþʬÀÏƤÏÀ²ñ¡ÊµþÅÔÂç³Ø¡Ë
[12]
ÄéËÜ ·°¡¢ÃæÌî
ÏÂɧ¡¢¾®À¾? ÍÎÂÀϺ¡¢X.
Ding¡¢ÄÔ ¹¬°ì¡Ö¥Ý¥ê¥¥ã¥Ô¥é¥ê¡¼XÀþ¥ì¥ó¥º¤òÍѤ¤¤¿Èù¾®Éô·Ö¸÷XÀþʬÀÏË¡¤ÎÀ¸Êª»îÎÁ¤Ø¤Î±þÍÑ¡× 2005ǯ10·î21¡Ý22Æü¡¡Âè41²óXÀþʬÀÏƤÏÀ²ñ¡ÊµþÅÔÂç³Ø¡Ë
[13]
ÄÔ ¹¬°ì¡ÖºÇ¶á¤ÎXÀþÍ×Áǵ»½Ñ¤ÎȯŸ¤È·Ö¸÷XÀþʬÀϤؤαþÍÑ¡×2005ǯ10·î18Æü¡¢(³ô)¥ë¥Í¥µ¥¹¥Æ¥¯¥Î¥í¥¸
[14]
ÄÔ ¹¬°ì¡Ö¥Ý¥ê¥¥ã¥Ô¥é¥ê¡¼XÀþ¥ì¥ó¥º¤òÍѤ¤¤¿¼Â¸³¼¼¤Ë¤ª¤±¤ëÈù¾®Éô·Ö¸÷XÀþʬÀϤλî¤ß¡× 2005ǯ12·î2-3Æü¡¢ÆüËÜÅ´¹Ý¶¨²ñ¡¢É¾²Á¡¦Ê¬ÀÏ¡¦²òÀÏÉô²ñ¡¢µÆÃÓ¥Õ¥©¡¼¥é¥à¡¡¡ÊËÙ¾ìÀ½ºî½ê¡Ë
[15]
ÄÔ ¹¬°ì¡Ö¹â´¶ÅÙ¡¦Èù¾®Éô·Ö¸÷XÀþʬÀϤγ«È¯¤È±þÍÑ¡×2005ǯ12·î13Æü¡¢¸¦µæµ¡¹½¡§¥Õ¥¡¥¤¥ó¥Õ¥í¡¼¥Æ¥¯¥Î¥í¥¸¡¼¤Î³«Âó¤ÈºàÎÁÁÏÀ®¸¦µæ²ñ¡ÊÂ裱²ó¡Ë¡ÊÂçºå»ÔΩÂç³Ø¡Ë
[16]
ÄÔ ¹¬°ì¡¢ÃæÌî ÏÂɧ¡Ö¥Ý¥ê¥¥ã¥Ô¥é¥ê¡¼XÀþ¥ì¥ó¥º¤òÍѤ¤¤¿2¼¡¸µ¡¦3¼¡¸µ·Ö¸÷XÀþʬÀÏ¡×2006ǯ1·î24Æü¡¢ÆüËܳؽѿ¶¶½²ñÀ½¹ÝÂè19°Ñ°÷²ñÀ½¹Ý·×¬²½³Ø¸¦µæ²ñ¡ÊµþÅÔÂç³Ø¡Ë
[17]
¾¾°æ ¹¨¡¢ÃæÌî ÏÂɧ¡¢ÄÔ ¹¬°ì¡Ö¹òÎà¤Î·Ö¸÷£ØÀþʬÀϤΤ¿¤á¤Îɸ½à»îÎÁºîÀ½¡×2006ǯ2·î7Æü¡¢Ê¿À®£±£·Ç¯ÅÙÂçºå»ÔΩÂç³Ø½ÅÅÀ¸¦µæ¡Ö¥Ò¥å¡¼¥Þ¥ó¥¢¥À¥×¥Æ¥£¥Ö¡¦¥Þ¥Æ¥ê¥¢¥ë¤Î³«Âó¡×¥·¥ó¥Ý¥¸¥å¡¼¥à
[18]
²Ö²¬Íβð¡¢ÄÔ ¹¬°ì¡Ö¥Þ¥¤¥¯¥í²½³Ø¥·¥¹¥Æ¥à¤ÎÁ´È¿¼Í·Ö¸÷£ØÀþʬÀÏ¡×2006ǯ2·î7Æü¡¢Ê¿À®£±£·Ç¯ÅÙÂçºå»ÔΩÂç³Ø½ÅÅÀ¸¦µæ¡Ö¥Ò¥å¡¼¥Þ¥ó¥¢¥À¥×¥Æ¥£¥Ö¡¦¥Þ¥Æ¥ê¥¢¥ë¤Î³«Âó¡×¥·¥ó¥Ý¥¸¥å¡¼¥à
[19]
ÄÔ ¹¬°ì¡¢¾¾ÅÄ ¹¸Åµ¡¢ÃæÌî ÏÂɧ¡Ö3¼¡¸µ·Ö¸÷XÀþ¸µÁÇʬÀÏ¡×2006ǯ2·î7Æü¡¢Ê¿À®£±£·Ç¯ÅÙÂçºå»ÔΩÂç³Ø½ÅÅÀ¸¦µæ¡Ö¥Ò¥å¡¼¥Þ¥ó¥¢¥À¥×¥Æ¥£¥Ö¡¦¥Þ¥Æ¥ê¥¢¥ë¤Î³«Âó¡×¥·¥ó¥Ý¥¸¥å¡¼¥à
[20]
ÃæÌî ÏÂɧ¡¢ÄÔ ¹¬°ì¡ÖÈù¾®Éô·Ö¸÷XÀþ¸µÁÇʬÀϤθ½¾õ¡× 2006ǯ2·î£¹Æü¡¢£Ê£Ó£ÔÀèüµ¡´ï³«È¯¸¦µæÀ®²ÌÊó¹ð²ñ
[21]
ÄéËÜ ·°¡¢ÃæÅÄ ½¡´²¡¢ÅÄÃæ ·¼ÂÀ¡¢ÄÔ ¹¬°ì¡¢¹Ó°æ Àµ¹À¡Ö¥Ý¥ê¥¥ã¥Ô¥é¥ê¡¼£ØÀþ¥ì¥ó¥º¤òÍѤ¤¤¿Å´¹Ý»îÎÁ¤ÎÈù¾®Éô·Ö¸÷£ØÀþʬÀÏ¡×2006ǯ3·î21¡Ý23Æü¡¢ÆüËÜÅ´¹Ý¶¨²ñÂè151²ó½Õµ¨¹Ö±éÂç²ñ¡ÊÁá°ðÅÄÂç³Ø¡Ë
¹ñºÝ²ñµÄ¤Ç¤Î¾·ÂÔ¹Ö±é
Invited talks at international conferenecs
[1] K.
Tsuji, K. Tanaka, K. Nakano, A. Okhrimovskyy, Y. Konish, X. Ding, ¡ÈMicro-XRF analysis of biological
materials¡É, Denver X-ray Conference, 1-5 August, 2005, Denver, USA.
[2] K.
Tsuji, K. Tsutsumimoto, K. Tanaka, K. Nakano, X.
Ding, T. Nagamura, Micro-XRF
Studies using Polycapillary X-ray Lens and AFM
Instrument, 18th International Conference on X-ray Optics and Microanalysis
(ICXOM 2005), Frascati (Rome), Italy, 25-30 September, 2005.
[3] K.
Tsuji, K. Nakano, ¡ÈX-ray Fluorescence analysis of Food Materials¡É, National
Research Center of Geoanalysis, 17-23 October, 2005
[4] K.
Tsuji, K. Nakano, X. Ding, ¡ÈMicro X-ray Fluorescence analysis at OCU¡É, 6th
China XRF International Conference 24-28 October, 2005.
¹ñºÝ²ñµÄ¤Ç¤Î°ìÈֱ̹é
Presentations at international
conferences
[1] K.
Nakano, K. Tsuji, T. Nakamura, ¡ÈDevelopment of
Plastic Certified Reference Materials for XRF analysis (JSAC 0611-0615)
containing Pb, Cd, Cr¡É, Denver X-ray Conference, 1-5 August, 2005,
Denver, USA (poster).
[2] K. Tsuji,
Y. Nishida, Y. Hanaoka, K. Tsutsumimoto, K. Nakano,
E. Tamaki, Y. Kikutani, A. Hibara
and T. Kitamori,
¡ÈX-RAY FLUORESCENCE ANALYSIS FOR CHEMICAL MICROCHIPS¡É, Colloquium Spectroscopicum Internationake
CSI XXXIV, Antwerp, Belgium, 4-9, Sep. 2005 (oral).
[3] K Tsuji,
A. Matsuda, K. Nakano, A. Okhrimovskyy, ¡ÈDEPTH UNLIMITED X-RAY FLUORESCENCE ANALYSIS FOR SOFT MATERIALS
USING NEEDLE-TYPE COLIMATORS¡É,
Colloquium Spectroscopicum Internationake
CSI XXXIV, Antwerp, Belgium, 4-9, Sep. 2005 (poster).
[4] K Nakano, H. Matsui, K. Tsutsumimoto, K. Tanaka, T. Nakamura and K.
Tsuji, ¡ÈX-RAY FLUORESCENCE ANALYSIS OF FOOD AND
PLASTIC MATERIALS USING CRMS JSAC 0611-0615¡É, Colloquium Spectroscopicum
Internationake CSI XXXIV, Antwerp, Belgium, 4-9, Sep.
2005 (poster).
[5] M. Nakata and K. Tsuji,
¡ÈSTUDY ON CHEMICAL SPUTTERING IN Ar(He)?H2
GAS MIXTURES GLOW DISCHERGE PLASMAS BY OPTICAL EMISSION SPECTROSCOPY¡É, Colloquium Spectroscopicum Internationake
CSI XXXIV, Antwerp, Belgium, 4-9, Sep. 2005 (poster).
[6] A. Okhrimovskyy,
K. Tsuji, ¡ÈNondestructive
depth profiling with GE-XRF through numerical modeling¡É, 11th Conference on Total
Reflection X-Ray Fluorescence Analysis and Related Methods (TXRF2005),
Budapest, Hundgary, 18-22, Sep., 2005 (oral).
[7] A. Okhrimovskyy,
Y. Matsuoka, K. Saito, K. Tsuji, ¡ÈTheoretical
characterization of reflector-assisted TXRF analysis¡É, 11th Conference on Total Reflection X-Ray Fluorescence Analysis
and Related Methods (TXRF2005), Budapest, Hundgary,
18-22, Sep., 2005 (poster).
[8] A. Okhrimovskyy,
K.
Tsuji, ¡ÈNumerical
Analysis of X-ray Induced by Electron
Beam under Grazing Exit Conditions¡É, 11th Conference on Total
Reflection X-Ray Fluorescence Analysis and Related Methods (TXRF2005),
Budapest, Hundgary, 18-22, Sep., 2005 (poster).
[9] K. Nakano,
K. Tanaka, X. Ding, K. Tsuji, ¡ÈDevelopment of a New TXRF Instrument using Polycapillary
X-ray Lens¡É, 11th
Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods
(TXRF2005), Budapest, Hundgary, 18-22, Sep., 2005
(poster).
[10] K.
Tsuji, K. Tanaka, Y. Matsuoka, A. Okhrimovskyy, X.
Ding, ¡ÈApplications of Focusing X-ray Optics
to TXRF Analysis¡É, 18th International Conference on X-ray Optics and
Microanalysis (ICXOM 2005), Frascati (Rome), Italy, 25-30 September, 2005
(poster).
[11] K.
Tsuji, K. Tetsuoka, A. Okhrimovskyy,
K. Saito, K. Asami, ¡ÈLateral
Resolution of Electron Probe Microanalysis under Grazing Exit Conditions¡É, 18th
International Conference on X-ray Opticas and
Microanalysis (ICXOM 2005), Frascati (Rome), Italy, 25-30 September, 2005
(poster).
[12] K. Tsuji,
T. Emoto, Y. Nishida, K. Tsutsumimoto,
K. Nakano, E. Tamaki, Y. Kikutani, A. Hibara and T. Kitamori,,
¡ÈAPPLICATIONS OF X-RAY FLUORESCENCE
ANALYSIS FOR CHEMICAL MICROCHIPS¡É, 9th International Conference on
Miniaturized Systems for Chemical and Life Sciences (m-TAS), 9-13, October,
2005, Boston, USA.(poster)
2004ǯÅ٤γèÆ°
(from April 2004 to March
2005)
¹ñÆâ¤Ç¤Î³Ø²ñȯɽ¤Ê¤É
Presentations at conferences in
Japan
[1]
2004ǯ5·î15¡Ý16Æü¡¡ÆüËÜʬÀϲ½³Ø²ñƤÏÀ²ñ¡ÊΰµåÂç³Ø¡¢²Æì¡ËÄÔ¡¡¹¬°ì¡¢º´Æ£¡¡Í¦´õ¡¢¹¾ËÜ¡¡Å¯Ìé
[2]
2004ǯ5·î15¡Ý16Æü¡¡ÆüËÜʬÀϲ½³Ø²ñƤÏÀ²ñ¡ÊΰµåÂç³Ø¡¢²Æì¡Ë¹¾ËÜ¡¡Å¯Ìé¡¢ÄÔ¡¡¹¬°ì¡¡¡ÖÈù¾®Éô·Ö¸÷XÀþʬÀÏË¡¤Ë¤è¤ë¿¢Êª¡Ê¥¥Î¥¢¡Ë¤ÎÀ®Ä¹²áÄø¤Ë¤ª¤±¤ë¸µÁǥޥåԥ󥰡×
[3]
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[13] 2004ǯ11·î26Æü¡¢Âè10²óÂçºå»ÔΩÂç³Ø¥Ê¥Î¥µ¥¤¥¨¥ó¥¹¡¦¥Ê¥Î¥Æ¥¯¥Î¥í¥¸¡¼¥Õ¥©¡¼¥é¥à¡¢¥Ý¥¹¥¿¡¼È¯É½¡¢ÅÄÃæ·¼ÂÀ¡¢¾¾²¬Âå»Ö»Ò¡¢ÁÒËÜÍƻҡ¢ÄÔ¡¡¹¬°ì¡¢¡ÖÁ´È¿¼Í·Ö¸÷XÀþʬÀÏË¡¤Ë¤è¤ëÈù¾®ÉôÈùÎÌʬÀÏ¡×
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[1]
2004ǯ6·î5¡Ý11Æü¡¡EXRS (European X-Ray Spectrometry) 2004
K. Tsuji, Y. Sato, T. Emoto, "Variation of
mapping area and effect of flatness of sample surface in grazing-exit m-XRF
(GE-m-XRF) analysis ", ¸ýƬȯɽ
[2]
2004ǯ6·î5¡Ý11Æü¡¡EXRS (European X-Ray Spectrometry) 2004
K. Tsuji, K. Tetsuoka, T. Nagamura,
"Improvement of? reproducibility and lateral resolution of elemental
analysis in grazing-exit EPMA (GE-EPMA) ", ¥Ý¥¹¥¿¡¼È¯É½
[3]
2004ǯ8·î2-6Æü¡¡¡¡53rd?
Denver X-Ray Conference
¾·ÂԹֱ顢K.Tsuji, T. Emoto, Y. Mtsuoka, Y. Miyatake, T. Nagamura, X Ding, "Combination of scanning probe
microscope and x-ray analysis"
[4]
2004ǯ11·î28Æü¡Ý12·î2Æü¡¡Ë̵þ»ÕÈÏÂç³Ø
°ÍÍê¹Ö±é¡¢K Tsuji, "Appllications of
micro x-ray fluorescence using a polycapillary x-ray
lens"
2003ǯÅ٤γèÆ°
(from April 2003 to March 2004)
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[2] 2003ǯ5·î24Æü¡¡Âè64²óʬÀϲ½³ØƤÏÀ²ñ¡Ê¹âÃÎÂç³Ø¡Ë¸ýƬ¡§ÄÔ¹¬°ì¡¡¡Ö£ØÀþ¸µÁǥޥåԥ󥰤ˤè¤ë¶â°¡Ý¥»¥é¥ß¥Ã¥¯¥¹³¦Ì̤δѻ¡¡×
[3] 2003ǯ9·î13Æü¡¡TXRF2003¥µ¥Æ¥é¥¤¥È¹ñºÝ²ñµÄ¡ÊÂçºå»ÔΩÂç³Øʸ²½¸òή¥»¥ó¥¿¡¼¡Ë¥Ý¥¹¥¿¡¼¡§K. Tsuji?
¡ÈCombination of Scanning Tunneling Microscope and X-ray Analysis¡É
[4] 2003ǯ9·î13Æü¡¡TXRF2003¥µ¥Æ¥é¥¤¥È¹ñºÝ²ñµÄ¡ÊÂçºå»ÔΩÂç³Øʸ²½¸òή¥»¥ó¥¿¡¼¡Ë¥Ý¥¹¥¿¡¼¡§T. Emoto, K. Tsuji, Y. Kikutani, M. Tokeshi, T. Kitamori (Osaka City
University, KAST, The University of Tokyo, Japan)¡¡¡ÈDevelopment
of a Micro- and Surface- XRF Instrument and its Application in Micro-Chemical
Systems¡É
[5]
2003ǯ9·î14¡Ý19Æü¡¡TXRF2003¡ÊÁ´È¿¼Í·Ö¸÷XÀþʬÀϤ˴ؤ¹¤ë¹ñºÝ²ñµÄ¡Ë¡Êʼ¸Ë¸©Ã¸Ï©Å硢̴ÉñÂæ¹ñºÝ²ñµÄ¾ì¡Ë¥Ý¥¹¥¿¡¼¡§¡¡Emoto, Y. Sato, K. Tsuji, Xunliang
Ding¡¡¡ÈDevelopment of micro X-ray fluorescence analysis
instrument using polycapillary X-ray lens and its
application¡É
[6]
2003ǯ9·î14¡Ý19Æü¡¡TXRF2003¡ÊÁ´È¿¼Í·Ö¸÷XÀþʬÀϤ˴ؤ¹¤ë¹ñºÝ²ñµÄ¡Ë¡Êʼ¸Ë¸©Ã¸Ï©Å硢̴ÉñÂæ¹ñºÝ²ñµÄ¾ì¡Ë¥Ý¥¹¥¿¡¼¡§¡¡Y.
Matsuoka, M. Nakata, K. Tsuji¡¡¡ÈDevelopment
of directly sampling method of solid materials for total-reflection x-ray
fluorescence¡É
[7] 2003ǯ9·î23-25Æü¡¡ÆüËÜʬÀϲ½³Ø²ñÂè52ǯ²ó¡ÊÀçÂæ¡¢µÜ¾ë¶µ°éÂç³Ø¡Ë¸ýƬ¡§ÄÔ¡¡¹¬°ì¡¢¹¾ËÜ¡¡Å¯Ìé¡¢º´Æ£¡¡Í¦´õ¡¢X. Ding¡¡¡Ö¥Ý¥ê¥¥ã¥Ô¥é¥ê¡¼XÀþ¥ì¥ó¥º¤òÍѤ¤¤¿Èù¾®Éô·Ö¸÷XÀþʬÀÏ¡×
[8] 2003ǯ10·î5-10Æü¡¡ALC¹ñºÝ²ñµÄ (4th International Symposium on Atomic Level Characterizations for New Materials and Devices) (¥¢¥á¥ê¥«¡¦¥Ï¥ï¥¤The
Radisson Kauai Beach Resort) ¥Ý¥¹¥¿¡¼¡§¡¡K. Tetsuoka and K. Tsuji,
¡ÈImprovement
of lateral resolution of EPMA by applying grazing-exit X-ray measurements¡É
[9] 2003ǯ10·î27Æü ´ØÀ¾Ê¬Àϸ¦µæ²ñ¡Ê¥³¥Ù¥ë¥³²Ê¸¦¡Ë°ÍÍê¹Ö±é¡§ÄÔ¡¡¹¬°ì¡¢¡Ö¶É½ê¡¦É½ÌÌ¡¦ÈùÎÌXÀþʬÀϤòÌÜɸ¤È¤¹¤ë£²¡¦£³¤Î¸¦µæ¡×
[10] 2003ǯ11·î26-28Æü¡¡Âè23²óɽÌ̲ʳعֱéÂç²ñ ¸ýƬ¡§ÄÔ¡¡¹¬°ì¡¢¾¾²¬¡¡Âå»Ö»Ò¡¢¿¹ÅÄ¡¡´²Æó¡¢ÆüÌî¡¡²íÇ·¡¡¡ÖÁ´È¿¼Í·Ö¸÷XÀþʬÀÏË¡¤Ë¤è¤ë·ì±ÕÃæÈùÎ̶â°¸µÁÇʬÀϤδðÁø¡Æ¤¡×
[11] 2003ǯ12·î11Æü Âçºå»ÔΩÂç³ØEMAº©Ïòñ °ÍÍê¹Ö±é¡§ÄÔ¡¡¹¬°ì¡¢¡ÖºÇ¶á¤ÎXÀþ¸µÁÇʬÀϤοÊŸ¡×
[12] 2004ǯ3·î8Æü¡¡É½ÌÌʬÀϸ¦µæ²ñ¡¡Âè23²ó¸¦µæ²ñ¡¡¡ÊµþÅÔÂç³ØÉ´¼þǯ»þ·×ÂæµÇ°´Û¡Ë °ÍÍê¹Ö±é¡§¡¡ÄÔ¡¡¹¬°ì¡¢¡Ö¼Ð½Ð¼Í£ØÀþʬÀÏË¡¤Î³«È¯¤È±þÍÑ¡×
[13] 2004ǯ3·î31Æü¡¡ÆüËÜÅ´¹Ý¶¨²ñ¡¡¥Ý¥¹¥¿¡¼¡§¡¡¾¾²¬¡¡Âå»Ö»Ò¡¢º´Æ£¡¡²Å¹°¡¢ÄÔ¡¡¹¬°ì¡¢¡ÖÁ´È¿¼Í·Ö¸÷XÀþʬÀÏË¡¤Ë¤è¤ë¶â°»îÎÁ¤ÎÂ絤°µ²¼É½ÌÌʬÀÏ¡×
[14] 2004ǯ3·î31Æü¡¡ÆüËÜÅ´¹Ý¶¨²ñ¡¡¥Ý¥¹¥¿¡¼¡§¡¡¹¾ËÜůÌé¡¢º´Æ£Í¦´õ¡¢ÄÔ¹¬°ì¡¢¡Ö¥Ý¥ê¥¥ã¥Ô¥é¥ê¡¼XÀþ¥ì¥ó¥º¤Ë¤ª¤±¤ë¥Þ¥¤¥¯¥íXÀþ¥Ó¡¼¥à¥µ¥¤¥º¤Îɾ²Á¤È»ëÌî²ÄÊÑXÀþ¸µÁǥޥåԥ󥰡×
2002ǯÅÙ¸åȾ¤Î³èÆ°
(from October 2002 to March
2003)
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2002ǯ10·î28¡Ý29Æü¡¡Âè38²óXÀþʬÀÏƤÏÀ²ñ¡ÊÊ¡²¬Âç³Ø¡Ë
¸ýƬȯɽ¡§ÄÔ¡¡¹¬°ì¡¢Filip Delalieux¡¢Ä¹Â¼ ½Óɧ¡ÖÈùºÙXÀþ¥Ó¡¼¥à¤È¼Ð½Ð¼ÍXÀþ¬Äê¤Ë¤è¤ë3¼¡¸µ·Ö¸÷XÀþʬÀÏ¡×
¥Ý¥¹¥¿¡¼È¯É½¡§ÄÔ¡¡¹¬°ì¡¢Filip Delalieux¡Ö¥·¥ê¥³¥óÈ¿¼ÍÈĤòÍѤ¤¤ëÁ´È¿¼Í·Ö¸÷XÀþʬÀÏ¡×
¥Ý¥¹¥¿¡¼È¯É½¡§F. Delalieux, K. Tsuji ¡È3-D XRF analysis of Japanese art
crafts¡É
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2002ǯ11·î11¡Ý12Æü¡¡¡Ö³¦ÌÌÈù¾®Îΰè¤Îɾ²Á¤ÈÀ©¸æ¡×¹ñºÝ¥ï¡¼¥¯¥·¥ç¥Ã¥×¡ÊÅìËÌÂç³Ø¡Ë
¥Ý¥¹¥¿¡¼È¯É½¡§K. Tsuji and F. Delalieux, ¡ÉFEASIBILITY STUDY OF THREE-DIMENSIONAL XRF
SPECTROMETRY USING A PINHOLE
APERTURE IN QUASI-CONTACT MODE¡É
2002ǯ11·î28Æü¡¡Âè22²óɽÌ̲ʳعֱéÂç²ñ¡ÊÁá°ðÅÄÂç³Ø¡Ë
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2003ǯ3·î28¡Ý29Æü¡¡Âè145²óÆüËÜÅ´¹Ý¶¨²ñ½Õµ¨¹Ö±éÂç²ñ
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