ICXOM 2007@Satellite Meeting of

Micro Area Analysis by X-ray in Laboratory

 

September 15-16, 2007, in Osaka

 

SCOPE

The x-ray microscope and the micro analysis in the micro area are useful in analysis of the small particle in the environment and the metal in biological unit cell. And it is necessary to develop X-ray source, X-ray optics, and X-ray detector for this micro area analysis. This meeting is planed as a satellite meeting of ICXOM 2007 from September 16 to 21, and it will be focused on micro area analysis by X-ray in laboratory.

 

CONFERENCE             Hotel Granvia Osaka, directly accessible from JR Osaka Station

& Accommodation:  

 

ACSESS:          Direct JR train from Kansai Airport to Osaka station

(1 hour, by JR train - Kansai Airport Rapid Service - )

 

 

PROGRAM:

Sep. 15 (Sat)

 

13:00-13:15

Opening

13:15-15:15

Recent Topics of X-ray Key Technologies in Japan

 

Development of Micro Focus X-ray Tube with Multi Targets for Small Area Analysis

Shuji Maeo (Osaka Electro-Communication University)@

 

X-Ray Analytical Microscope

Yoshihiro Yokota  (HORIBA Ltd,.)

 

Feasibility of InSb Compound Semiconductor as the Substrate of High Energy Resolution, High Counting Rate Detectors

Ikuo Kanno (Kyoto University)

 

Superconducting Series-Junction Detectors

Masahiko Kurakado  (Osaka Electro-Communication University)

15:15-15:45

Coffee break

15:45-16:45

Introduction of Related National Research Programs in Japan

Quantitative Analysis of Nano Particle by XRF

Kazuo Taniguchi (Osaka Electro-Communication University) 

Research Plan for Development of Highly Spatial Resolution XRF Instrument

Kouichi Tsuji (Osaka City University)

16:45-17:00

Coffee break

17:00-19:00

Key Technologies I

 

Novel Monochromatic X-ray Generators and Their Applications

Eiichi Sato (Iwate Medical University)

 

X-ray Standing Waves and X-ray Reflectivity Measurements: A Powerful Combination

Markus Kraemer (ISAS, Germany, OECU)

 

X-Ray Waveguiding: Channeling Formalism -- from micro-down to nano-focusing --

Sultan B. Dabagov (INFN - Lab. Naz. di Frascati, Italy)

 

New trends of Silicon Drift Detectors

Andreas PahlkeiKETEK GmbH, Germanyj

20:00-22:00

Banquet

Sep. 16 (Sun)

 

7:30-09:00

Breakfast

9:00-10:30

Key Technologies II

 

Capillary X-Ray Lens and Its Applications in X-Ray Microanalysis

Xunliang Ding (Beijing Normal University, China)

 

The Advantage of a High Performance DSP and Analysis Program in XRF Analysis

Tibor Papp (Institute of Nuclear Research of the Hungarian Academy of@Sciences, Cambridge Scientific, Hungary)

 

Three Dimensional Elemental Mapping with Confocal Micro X-ray Fluorescence

George J. Havrilla (Los Alamos National Laboratory, USA)

10:30-11:00

Coffee break

11:00-13:00

Applications

 

Micro-Analysis of Individual Aerosol Particles in The Context of Global Climate Change and Human Health

Rene Van Grieken (Antwerp University, Belgium)

 

Micro XRF of Light Element Z>6 with Laboratory Sources

Peter Wobrauschek (Atominstitut -TU Vienna, Austria)

 

Laboratory Micro-XRF of Heterogeneous Environmental Samples: a Pre-Analysis Tool to SR Micro-XRF, Micro-XANES and Micro-XRD

Szabina Török (KFKI Atomic Energy Research Institute, Hungary)

 

TXRF in Daily Analytical Routine and Its Future Prospective

S.Pahlke

13:00-

Closing, Lunch, and leave for Kyoto (ICXOM2007)

 

 

 

 

REGISTRATION:

Registration fee is 5,000 YEN including the banquet fee. Students will be financially supported for registration fee and hotel accommodation fee. Researchers at universities and public institutes are also invited with free of charge for registration fee. All attendees are required to contact to Profs. Taniguchi or Tsuji before 15 August, 2007 for registration and arranging the hotel accommodation and the banquet.

Registration form is available from the following homepages:

http://www.osakac.ac.jp

http://www.a-chem.eng.osaka-cu.ac.jp/tsujilab/

http://www.nims.go.jp/xray/xbun/

                                             

CHIRE PERSONS & CONTACT:        

Kazuo Taniguchi (Osaka Electro-Communication University, taniguti@isc.osakac.ac.jp)

Kouichi Tsuji@(Osaka City University, tsuji@a-chem.eng.osaka-cu.ac.jp )

 

COMMITTEE:               

Chiya Numako (Tokushima University)

Kazuhiko Nakano (JST)

Shigeaki Nomura (Osaka Electro-Communication University)

 

SPONSOR:

Discussion Group of X-ray Analysis in the Japanese Society for Analytical Chemistry

Osaka Electro-Communication University

Osaka City University