ICXOM
2007 Satellite Meeting of
Micro Area Analysis by X-ray in Laboratory
September 15-16, 2007, in Osaka
SCOPE
The x-ray microscope and the micro analysis in the micro area are useful in analysis of the small particle in the environment and the metal in biological unit cell. And it is necessary to develop X-ray source, X-ray optics, and X-ray detector for this micro area analysis. This meeting is planed as a satellite meeting of ICXOM 2007 from September 16 to 21, and it will be focused on micro area analysis by X-ray in laboratory.
CONFERENCE Hotel Granvia Osaka, directly accessible from JR Osaka Station
& Accommodation:
ACSESS: Direct JR train from Kansai Airport to Osaka station
(1 hour, by JR train - Kansai Airport Rapid Service - )
PROGRAM:
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Sep. 15 (Sat) |
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13:00-13:15 |
Opening |
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13:15-15:15 |
Recent Topics of X-ray Key Technologies in Japan |
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Development of Micro Focus X-ray Tube with Multi Targets for Small Area Analysis Shuji Maeo (Osaka Electro-Communication University) |
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X-Ray Analytical Microscope Yoshihiro Yokota (HORIBA Ltd,.) |
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Feasibility of InSb Compound Semiconductor as the Substrate of High Energy Resolution, High Counting Rate Detectors Ikuo Kanno (Kyoto University) |
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Superconducting Series-Junction Detectors Masahiko Kurakado (Osaka Electro-Communication University) |
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15:15-15:45 |
Coffee break |
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15:45-16:45 |
Introduction of Related National Research Programs in Japan Quantitative Analysis of Nano Particle by XRF Kazuo Taniguchi (Osaka Electro-Communication University) Research Plan for Development of Highly Spatial Resolution XRF Instrument Kouichi Tsuji (Osaka City University) |
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16:45-17:00 |
Coffee break |
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17:00-19:00 |
Key Technologies I |
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Novel Monochromatic X-ray Generators and Their Applications Eiichi Sato (Iwate Medical University) |
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X-ray Standing Waves and X-ray Reflectivity Measurements: A Powerful Combination Markus Kraemer (ISAS, Germany, OECU) |
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X-Ray Waveguiding: Channeling Formalism -- from micro-down to nano-focusing -- Sultan B. Dabagov (INFN - Lab. Naz. di Frascati, Italy) |
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New trends of Silicon Drift Detectors Andreas Pahlke（KETEK GmbH, Germany） |
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20:00-22:00 |
Banquet |
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Sep. 16 (Sun) |
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7:30-09:00 |
Breakfast |
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9:00-10:30 |
Key Technologies II |
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Capillary X-Ray Lens and Its Applications in X-Ray Microanalysis Xunliang Ding (Beijing Normal University, China) |
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The Advantage of a High Performance DSP and Analysis Program in XRF Analysis Tibor Papp (Institute of Nuclear Research of the Hungarian Academy of Sciences, Cambridge Scientific, Hungary) |
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Three Dimensional Elemental Mapping with Confocal Micro X-ray Fluorescence George J. Havrilla (Los Alamos National Laboratory, USA) |
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10:30-11:00 |
Coffee break |
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11:00-13:00 |
Applications |
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Micro-Analysis of Individual Aerosol Particles in The Context of Global Climate Change and Human Health Rene Van Grieken (Antwerp University, Belgium) |
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Micro XRF of Light Element Z>6 with Laboratory Sources Peter Wobrauschek (Atominstitut -TU Vienna, Austria) |
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Laboratory Micro-XRF of Heterogeneous Environmental Samples: a Pre-Analysis Tool to SR Micro-XRF, Micro-XANES and Micro-XRD Szabina Török (KFKI Atomic Energy Research Institute, Hungary) |
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TXRF in Daily Analytical Routine and Its Future Prospective S.Pahlke |
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13:00- |
Closing, Lunch, and leave for Kyoto (ICXOM2007) |
REGISTRATION:
Registration fee is 5,000 YEN including the banquet fee. Students will be financially supported for registration fee and hotel accommodation fee. Researchers at universities and public institutes are also invited with free of charge for registration fee. All attendees are required to contact to Profs. Taniguchi or Tsuji before 15 August, 2007 for registration and arranging the hotel accommodation and the banquet.
Registration form is available from the following homepages:
http://www.a-chem.eng.osaka-cu.ac.jp/tsujilab/
http://www.nims.go.jp/xray/xbun/
CHIRE PERSONS & CONTACT:
Kazuo Taniguchi (Osaka Electro-Communication University, taniguti@isc.osakac.ac.jp)
Kouichi Tsuji (Osaka City University, tsuji@a-chem.eng.osaka-cu.ac.jp )
COMMITTEE:
Chiya Numako (Tokushima University)
Kazuhiko Nakano (JST)
Shigeaki Nomura (Osaka Electro-Communication University)
SPONSOR:
Discussion Group of X-ray Analysis in the Japanese Society for Analytical Chemistry
Osaka Electro-Communication University
Osaka City University